Oxford Instruments

Oxford Instruments Asylum Research Releases New Application Note: Atomic Force Microscopy Investigation of Tribofilm Formation
Optics & Photonics

Oxford Instruments Asylum Research Releases New Application Note: Atomic Force Microscopy Investigation of Tribofilm Formation

April 2,2020 (Santa Barbara, CA) Friction between the surfaces of mechanical systems is a costly global problem. It is not just that the resulting wear leads to premature equipment failures. Friction is also one of the leading factors that reduce energy efficiency, thought to account for more than 20% of worldwide energy consumption. Scientists and engineers in the field of tribology look for...

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Oxford Instruments Asylum Research Announces Nanoelectrical and Environmental Control Accessories for Jupiter XR Large-Sample AFM
Architectural & Civil Engineering Products

Oxford Instruments Asylum Research Announces Nanoelectrical and Environmental Control Accessories for Jupiter XR Large-Sample AFM

March 19, 2020 (Santa Barbara, CA) Oxford Instruments Asylum Research announces the release of accessories enabling environmental control and nanoelectrical measurements on the Jupiter XR large-sample atomic force microscope (AFM).The accessories include the PolyHeater, for heating samples up to 300°C, the CoolerHeater, with a cooling/heating range of -30 to 120°C, a fluid cell and probe holder...

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Atomic Force Microscope is optimized for polymer research.
Optics & Photonics

Atomic Force Microscope is optimized for polymer research.

Suited for polymer and material science applications, Cypher™ ES Polymer Edition comes with 3 nanomechanical characterization tools. These include 2 atomic force microscope (AFM) techniques –Â- AM-FM and Contact Resonance Viscoelastic Mapping Modes – and Fast Force Mapping Mode. In addition to blueDrive™ photothermal excitation option, microscope supports environmental...

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XRF Analyzer optimizes positive material identification.
Laboratory and Research Supplies and Equipment

XRF Analyzer optimizes positive material identification.

By enabling accurate alloy identification, Model X-MET8000 secures quality assurance and safety compliance throughout industrial plants and manufacturing facilities. With extremely low limits of detection, analyzer can provide accurate grade separation and determine miniscule percentages of trace or tramp elements. Housed in IP54-rated enclosure for harsh environments, handheld analyzer has 4.3...

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Atomic Force Microscopes can measure elastic, viscous properties.
Optics & Photonics

Atomic Force Microscopes can measure elastic, viscous properties.

Leveraging AM-FM Viscoelastic Mapping Mode, Cypher™ and MFP-3D™ atomic force microscopes (AFMs) lets users image viscoelastic properties, including storage modulus and loss tangent, with nanoscale spatial resolution. Nanomechanical imaging technique operates atÂ- 2 cantilever resonances simultaneously. First resonance is used for tapping mode imaging, or amplitude modulation...

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Laboratory and Research Supplies and Equipment

Oxford Instruments Expands Its Comprehensive Product Line of X-Ray Fluorescence (XRF) Coating Thickness Instruments for Quality Control

Concord, MA – Oxford Instruments, a leader in coating thickness analysis, has added several new analyzers to its product line, now offering the most complete range of products available for coating thickness on the U.S. market today.Â-  Oxford Instruments recently significantly extended its XRF product range for coating thickness by adding the COMPACT Eco, MAXXI Eco and MAXXI 5 models to...

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Atomic Force Microscope supports tapping mode imaging.
Optics & Photonics

Atomic Force Microscope supports tapping mode imaging.

Featuring 90 Â-µm stage, MFP-3D Infinity AFM includes Fast Force Curve Mapping mode, which operates at up to 300 Hz pixel rate, capturing every force curve in image without missing curves or performing hidden data manipulation. Real-time and offline analysis models calculate modulus, adhesion, and other properties. To maximize productivity, GetStarted automatically sets tapping mode imaging...

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Company News

Oxford Instruments Asylum Research Releases New Application Note: "Characterizing Ferroelectric Response in Silicon-Doped Hafnium Oxide Thin Films"

April 22, 2020 (Santa Barbara, CA). Material science innovations are critical to the semiconductor industry’s efforts to make more powerful and more energy efficient processors and data storage devices. Hafnium oxide is one such material that has already been adopted in some new devices. It is one of the few binary oxides that are thermodynamically stable with silicon and can be used as a...

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Oxford Instruments Asylum Research Releases New Application Note: Atomic Force Microscopy Investigation of Tribofilm Formation
Optics & Photonics

Oxford Instruments Asylum Research Releases New Application Note: Atomic Force Microscopy Investigation of Tribofilm Formation

April 2,2020 (Santa Barbara, CA) Friction between the surfaces of mechanical systems is a costly global problem. It is not just that the resulting wear leads to premature equipment failures. Friction is also one of the leading factors that reduce energy efficiency, thought to account for more than 20% of worldwide energy consumption. Scientists and engineers in the field of tribology look for...

Read More »
Oxford Instruments Asylum Research Announces Nanoelectrical and Environmental Control Accessories for Jupiter XR Large-Sample AFM
Architectural & Civil Engineering Products

Oxford Instruments Asylum Research Announces Nanoelectrical and Environmental Control Accessories for Jupiter XR Large-Sample AFM

March 19, 2020 (Santa Barbara, CA) Oxford Instruments Asylum Research announces the release of accessories enabling environmental control and nanoelectrical measurements on the Jupiter XR large-sample atomic force microscope (AFM).The accessories include the PolyHeater, for heating samples up to 300°C, the CoolerHeater, with a cooling/heating range of -30 to 120°C, a fluid cell and probe holder...

Read More »
Company News

Asylum Research Opens a Sales and Support Office at Oxford Instruments US Headquarters in Concord, MA

January 24, 2019 -- (Santa Barbara, CA)  Oxford Instruments Asylum Research, the technology leader in atomic force microscopy (AFM), is pleased to announce the opening of a new sales and support office to better serve AFM users in the eastern United States. The new office is co-located within the established Oxford Instruments United States headquarters in Concord, Massachusetts. The site...

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Company News

Oxford Instruments Asylum Research Hosts the Webinar Soft, Squishy, and Sticky: AFM for Mechanobiology, on October 24, 2018

October 5, 2018 (Santa Barbara, CA) Asylum Research, the technology leader in AFM, presents the webinar “Soft, Squishy, and Sticky: AFM for Mechanobiology,” on October 24, 2018 at 8:30am PDT. The webinar gives an insightful overview of atomic force microscopy (AFM) for mechanobiology, discussing the latest instrumentation, techniques and results, for successful elastic deformation...

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Atomic Force Microscope is optimized for polymer research.
Optics & Photonics

Atomic Force Microscope is optimized for polymer research.

Suited for polymer and material science applications, Cypher™ ES Polymer Edition comes with 3 nanomechanical characterization tools. These include 2 atomic force microscope (AFM) techniques –Â- AM-FM and Contact Resonance Viscoelastic Mapping Modes – and Fast Force Mapping Mode. In addition to blueDrive™ photothermal excitation option, microscope supports environmental...

Read More »
XRF Analyzer optimizes positive material identification.
Laboratory and Research Supplies and Equipment

XRF Analyzer optimizes positive material identification.

By enabling accurate alloy identification, Model X-MET8000 secures quality assurance and safety compliance throughout industrial plants and manufacturing facilities. With extremely low limits of detection, analyzer can provide accurate grade separation and determine miniscule percentages of trace or tramp elements. Housed in IP54-rated enclosure for harsh environments, handheld analyzer has 4.3...

Read More »

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