Onto Innovation Inc.
Wilmington, MA 01887
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Metrology System sub 0.1-
To meet metrology needs, IVS 155 IVS 155 features robotics for sub 0.1Ã-
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CD-SEM is suited for critical dimension metrology.
With measurement throughput up to 1,000 sites/hr, Yosemite SP-1000 CD-SEM (Critical Dimension Scanning Electron Microscope) features clear imaging at bottom of 30:1 aspect ratio contact holes. System retains 3D model-based critical shape metrology required at and below 65 nm for accurate representation of physical shape of features. Unit uses landing energies as low as 100 eV. Product is suited...
Read More »Onto Innovation Merger Successfully Completed, Combining Nannometrics and Rudolph Technologies
Wilmington, Mass., October 28, 2019 – Onto Innovation Inc. (NYSE: ONTO) today announced the successful completion on October 25, 2019 of the previously announced merger of equals between Nanometrics Incorporated and Rudolph Technologies, Inc. Headquartered in Wilmington, Massachusetts, Onto Innovation is expected to be the fourth largest semiconductor capital equipment supplier by revenue in...
Read More »Soluris Named Five Star Supplier by VLSI Research Customer Satisfaction Survey
Soluris is one of only three companies to achieve five stars in all categories of a new star rating system derived from VLSI Research's Customer Satisfaction Survey. Concord, MA USA-October 26, 2005-Soluris, a manufacturer of metrology systems for semiconductor manufacturing, announced today that it has received a five star rating from VLSI Research based on VLSI's 2005 Customer Satisfaction...
Read More »Metrology System sub 0.1-
To meet metrology needs, IVS 155 IVS 155 features robotics for sub 0.1Ã-
Read More »
CD-SEM is suited for critical dimension metrology.
With measurement throughput up to 1,000 sites/hr, Yosemite SP-1000 CD-SEM (Critical Dimension Scanning Electron Microscope) features clear imaging at bottom of 30:1 aspect ratio contact holes. System retains 3D model-based critical shape metrology required at and below 65 nm for accurate representation of physical shape of features. Unit uses landing energies as low as 100 eV. Product is suited...
Read More »