Agilent Technologies, Inc.
Santa Clara, CA 95051
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Development Program facilitates test system design.
Agilent Open program offers products and services based on open industry standards that help speed product development. System-ready instruments come with I/O and software that configures, interfaces, and discovers other instruments while verifying instrument connections. Standard PC I/O interfaces such as LAN, USB, and GP-IB accelerate process of connecting test equipment. Agilent VEE Pro and...
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IR Transceiver enables remote control via mobile phone.
Supplied in 2.8 x 7.0 x 1.6 mm package, HSDL-3007 IrDA/remote control transceiver enables mobile phones and PDAs to function as universal IR remote controls for home appliances. Logic I/O interface operates at 1.8 V, and unit is compatible with remote control application software. Active over distances to ~23 ft, programmable unit has min transmission angle of 30Ã-
Read More »Software offers 1xEV-DO default packet application support.
Agilent E6706A, 1xEV-DO lab application simplifies development of access terminals and streamlines device transition from development into manufacturing. It works with E5515C (8960) wireless communications test set to create desk-top network-in-a-box with dynamic network performance and default packet application support for real-world throughput analysis and network emulation. Application...
Read More »Test Solutions manage wireless devices and networks.
Test and measurement portfolio helps streamline device transition from development to manufacturing in 1xEV-DO networks. Products include E6706A 1xEV-DO lab application for simplification and development of access terminals; E7495B Base Station Test Set, which addresses CDMA 3G deployment and maintenance needs; and Wireless Network Optimization Platform. Latter enables 1xEV-DO drive-test scanning...
Read More »Time Correlation Unit speeds debug of embedded systems.
Model E5850A gives designers ability to capture real-time oscilloscope signals with up to 13 GHz bandwidth, correlate them to key digital signals on WindowsÃ-® XP-based logic analyzer, and view them all on one screen. Design engineers can move between logic analyzer and scope as they pinpoint problems through continuous tracking of timing markers between instruments. Seamless integration...
Read More »FPGA Dynamic Probe offers plug-and-run setup.
FPGA dynamic probe application features probe setup automation capability, which reduces set-up time required for logic analyzer measurements when validating designs that incorporate Xilinx FPGA technology. Plug-and-run capability eliminates need to manually track signal path and enter associated probe setup information in logic analyzer. In seconds, users can plug probe into target and press...
Read More »Analyzer offers interoperability verification for RPR.
OmniBER test solution provides device design and interoperability verification for IEEE 802.17 Resilient Packet Ring (RPR) and Generic Framing Procedure (GFP) for Multi-Service Platforms (MSPs). Available up to 2.5 and 10 Gbps, respectively, models J7233A and J7233B test hardware, software, and system level performance of RPR encapsulated in GFP and carried over SONET/SDH. Scalable to 40 Gbps,...
Read More »Analyzer provides 8X fibre channel compliance testing.
Utilizing Model 86105C broad-wavelength multi-rate optical module and Model 83496A multi-rate clock recovery module, Infiniium digital communications analyzer, Model 86100C offers 8X Fibre Channel measurement. Model 86105C tests all Fibre Channel devices or all common data rates from 155 Mb/s to 11.3 Gb/s over 750-1,650 nm wavelengths. Model 83496A functions as Golden PLL by setting loop...
Read More »Dispersion Analyzer tests high-speed optical components.
Optical Dispersion Analyzer, Model 86038B tests and validates optical devices such as 10 Gb/s and 40 Gb/s DWDM components and fibers. It provides dispersion measurements over band of up to 200 nm anywhere from 1,260-1,640 nm. Unit simultaneously tests all optical component parameters, such as spectral and polarization dependent loss, group delay, and differential group delay, including...
Read More »Protocol Tester performs cross-domain measurements.
System protocol tester, E2960A series, provides time-correlated, cross-domain protocol analysis of PCI Express and Fiber Channel (FC) semiconductors and systems. Test platform combines protocol analysis and traffic generation of multiple FC ports and PCI Express high-speed buses, resulting in protocol-level observation of system execution. Features include multi-protocol GUI, multi-state trigger...
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