Zeiss Industrial Metrology

New Xradia 620 Versa RepScan Imaging Solution from ZEISS Comes with RaaD Technology
Vision Systems

New Xradia 620 Versa RepScan Imaging Solution from ZEISS Comes with RaaD Technology

Utilizes 3D X-ray microscopy (XRM) that provides volumetric and linear measurements of advanced packages. Supports design verification, product development, process optimization and quality assurance/control (QA/QC) of complex fine-pitch 3D architectures. Features include inspection and measurement for IC packages, 500 nm spatial resolution with minimum voxel size <40 nm, automatic loading,...

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ZEISS Releases 3D X-Ray Imaging Systems for Use in Semiconductor Industry
Vision Systems

ZEISS Releases 3D X-Ray Imaging Systems for Use in Semiconductor Industry

The 3D X-Ray Imaging Systems consist of Xradia 600-series Versa and Xradia 800 Ultra X-ray microscopes and Xradia Context microCT models. The units are designed to provide submicron and nanoscale 3D images. The Xradia 600-series system is embedded with RaaD capability and delivers 0.5 micron spatial resolution and 40 nm min voxel size. The Xradia 800 Ultra system comes with 150 nm and 50 nm...

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ZEISS SPECTRUM Coordinate Measuring System with CALYPSO Measurement Software
Test & Measurement

ZEISS SPECTRUM Coordinate Measuring System with CALYPSO Measurement Software

The ZEISS SPECTRUM Coordinate Measuring Machine is offered in measuring volumes from 500 x 500 x 600 mm to 700 x 1000 x 600 mm. The machine is equipped with a C99L intelligent scanning controller, wrap-around air bearings. The CALYPSO software eliminates the time required for structured programming, code editing and line-by-line text editing. The CMM with RDS-C5 articulating probe holder and VAST...

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New ZEISS OptiRecon Module Uses Advanced Iterative Reconstruction Technique
Software

New ZEISS OptiRecon Module Uses Advanced Iterative Reconstruction Technique

The ZEISS OptiRecon module is embedded in Xradia Versa 500-series 3D x-ray microscopes and is built on single advanced workstation. The OptiRecon provides a combination of workflow-based user interface with efficient proprietary implementation enables reconstruction of typical dataset in about three minutes. The technology allows 3D X-ray imaging, or computed tomography for geological industry...

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ZEISS Introduces MICURA with VAST XT Gold or VAST XTR Gold Active Scanning Sensor
Test & Measurement

ZEISS Introduces MICURA with VAST XT Gold or VAST XTR Gold Active Scanning Sensor

ZEISS’ launches MICURA for measuring small or intricate parts with active scanning and submicron accuracy. The system is efficient to handle large parts with 40 percent of 500 x 700 x 500 millimeters measuring range with a machine-mounted controller. The product offers user-friendly CALYPSO metrology software which works with all ZEISS systems. The unit comes with VAST XT gold sensor that...

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Computer Tomographs include camera for viewing interior.
Health, Medical, & Dental Supplies and Equipment

Computer Tomographs include camera for viewing interior.

Available with tube voltage of 130 kV or 225 kV and power rating up to 500 W for 225 kV version, ZEISS METROTOM 800 can scan metal components along with mixed materials. ZEISS METROTOM 1500, rated at 225 kV, can scan large components with max height of 700 mm. Workpiece can be raised and lowered by 400 mm and multiple scans can be merged into one volume model. Evaluation software delivers 3D...

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ZEISS Showcases Electron and X-ray Microscopes, Digital Imaging Systems and Stereo Microscopes at PITTCON 2015
Optics & Photonics

ZEISS Showcases Electron and X-ray Microscopes, Digital Imaging Systems and Stereo Microscopes at PITTCON 2015

Carl Zeiss Microscopy, a leading provider of microscopy solutions, announces that it will be showcasing state of the art electron and X-ray microscopes, digital imaging systems for QA/QC and particle analysis, and stereo microscopes suited for heavy workloads at PITTCON 2015, March 8-13, Booth #4317, in New Orleans, LA. On display will be the ZEISS SIGMA HD Field Emission Scanning Electron...

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Company News

ZEISS and Oak Ridge National Laboratory Partner for Advancement of Powder Bed Additive Manufacturing

MAPLE GROVE, Minn., Nov. 18, 2019 /CNW/ -- Carl Zeiss Industrial Metrology, LLC and Oak Ridge National Laboratory (ORNL) have entered into a five-year cooperative research and development agreement (CRADA) to gain a deeper understanding of additive manufacturing (AM) processes and materials using ZEISS' unique 3D ManuFACT solution, a correlative multi-scale multi-modal workflow utilizing...

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New Xradia 620 Versa RepScan Imaging Solution from ZEISS Comes with RaaD Technology
Vision Systems

New Xradia 620 Versa RepScan Imaging Solution from ZEISS Comes with RaaD Technology

Utilizes 3D X-ray microscopy (XRM) that provides volumetric and linear measurements of advanced packages. Supports design verification, product development, process optimization and quality assurance/control (QA/QC) of complex fine-pitch 3D architectures. Features include inspection and measurement for IC packages, 500 nm spatial resolution with minimum voxel size <40 nm, automatic loading,...

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Mergers & Acquisitions

With the Acquisition of GOM, ZEISS Furthers Its Goal of Technological Leadership in Industrial Metrology and Quality Assurance

Customers will benefit from combined Industrial Quality & Research portfolio Oberkochen/Germany, Braunschweig/Germany, 2019-04-11. ZEISS is expanding the industrial metrology and quality assurance portfolio of its Industrial Quality & Research segment by acquiring GOM, a leading provider of hardware and software for automated 3D coordinate measuring technology. Both ZEISS and GOM have enjoyed...

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Company News

ZEISS Earns recognition as a John Deere 'Partner-level Supplier'

Maple Grove, Minn., Feb. 20, 2019 /PRNewswire/ -- ZEISS Industrial Quality Solutions has earned recognition as a Partner-level supplier for 2018 in the John Deere Achieving Excellence Program. The Partner-level status is Deere & Company's highest supplier rating. The Oberkochen, Germany-based company was selected for the honor in recognition of its dedication to providing products and...

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Company News

ZEISS Opens New Quality Excellence Center in Lake Forest, CA

MAPLE GROVE, Minn., Feb. 22, 2019 /PRNewswire/ -- ZEISS Industrial Quality Solutions opens a brand new facility for metrology services in Lake Forest, California near Los Angeles. "These excellence centers offer a solution-based approach for local manufacturers. The new California location offers contract measuring services, support, training and project management," states Al Chiasson,...

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ZEISS Releases 3D X-Ray Imaging Systems for Use in Semiconductor Industry
Vision Systems

ZEISS Releases 3D X-Ray Imaging Systems for Use in Semiconductor Industry

The 3D X-Ray Imaging Systems consist of Xradia 600-series Versa and Xradia 800 Ultra X-ray microscopes and Xradia Context microCT models. The units are designed to provide submicron and nanoscale 3D images. The Xradia 600-series system is embedded with RaaD capability and delivers 0.5 micron spatial resolution and 40 nm min voxel size. The Xradia 800 Ultra system comes with 150 nm and 50 nm...

Read More »
ZEISS SPECTRUM Coordinate Measuring System with CALYPSO Measurement Software
Test & Measurement

ZEISS SPECTRUM Coordinate Measuring System with CALYPSO Measurement Software

The ZEISS SPECTRUM Coordinate Measuring Machine is offered in measuring volumes from 500 x 500 x 600 mm to 700 x 1000 x 600 mm. The machine is equipped with a C99L intelligent scanning controller, wrap-around air bearings. The CALYPSO software eliminates the time required for structured programming, code editing and line-by-line text editing. The CMM with RDS-C5 articulating probe holder and VAST...

Read More »
Company News

ZEISS to Build New State-of-the-Art Facility in the Detroit Metro Area

New site offers system demonstrations for customers as well as metrology services LYON TOWNSHIP, Mich., Dec. 13, 2018 /PRNewswire/ -- With the official groundbreaking, ZEISS has started the construction of a new modern site outside of Detroit. The new facility for the Industrial Quality and Research (IQR) segment of ZEISS, represented in the USA by Carl Zeiss Industrial Metrology, LLC,...

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