Test & Measuring Instruments

Test & Measuring Instruments

Graphing Voltage Data Logger records up to 16 channels.

November 28, 2014

With recording interval as short as 2 ms and minimum voltage resolution of 10 µV, Model MCR-4V offers way to measure and record voltage data for control devices and measurement instruments in electrical circuits. Up to 4 units can be coupled together for simultaneous measurement and recording of up to 16 channels. Users can download data via USB connection or optional SD Flash Memory card. Utilizing trend graphing feature, users can check data in real-time while in field. Read More

Test & Measuring Instruments, Computer Hardware & Peripherals, Sensors, Monitors & Transducers, Automatic ID

Handheld Barcode Readers ensure imaging data remains secure.

November 28, 2014

To accommodate for those with strict security requirements, HS-41X Handheld DPM (direct part marking) Reader and HS-51X Wireless DPM Reader incorporate Image Lock technology. This feature secures captured images within device, where images are automatically deleted once symbol is decoded. Since images are deleted, they are not made available to connected barcode setup or configuration software UIs or directly accessible by users to view or download from device. Read More

Optics & Photonics, Test & Measuring Instruments

Spectrophotometer offers wavelength range of 185-3,300 nm.

November 28, 2014

Equipped with 3 detectors, UV-3600 Plus UV-VIS-NIR Spectrophotometer utilizes photomultiplier tube for UV and visible regions, and InGaAs and cooled PbS detectors for near-infrared regions. Instrument's double monochromator makes it possible to attain ultra-low stray light level of 0.00005% max at 340 nm. Multi-purpose, large-sample compartment and integrating sphere options enable high-sensitivity measurement of solid samples. Absolute specular reflectance accessories are available. Read More

Software, Test & Measuring Instruments

Process Control System supports electronics manufacturing.

November 28, 2014

Combining software with 3D AOI and SPI capabilities, KSMART Integrated Technology Solution enables real-time analysis of defects. With KSMART RMS software, inspection machines' status, production line yield information, and real-time defect information from all SPI and AOI machines in multiple production lines can be directly communicated with and operated efficiently. KSMART Link software will allow customers to analyze all 3D inspection results from 3D SPI and 3D AOI systems. Read More

Test & Measuring Instruments

Impedance Analyzer offers 0.65% basic accuracy.

November 28, 2014

Available in 3 frequency ranges from 1 MHz to 3 GHz, Model E4991B characterizes and evaluates passive electronic components, semiconductor devices, and dielectric/magnetic materials. Analyzer features accurate material measurement options that include temperature characteristics analysis from -55 to 150°C and direct read function of permittivity and permeability up to 1 GHz. Optional DC bias function can be used to supply DC voltage (±40 V) and current bias (±100 mA) across DUT. Read More

Transportation Industry Products, Test & Measuring Instruments, Computer Hardware & Peripherals, Display & Presentation Equipment, Electrical Equipment & Systems, Vision Systems, Green & Clean

Marine Instrument Display delivers critical information. .

November 28, 2014

Designed to automatically display real-time data from NMEA2000® compatible engines and sensors, Simrad IS35 provides boaters with at-a-glance access to critical information about vessel. Preprogrammed pages include engine data display, dedicated cruising instrument, and fuel economy with instantaneous fuel flow, fuel used, and fuel remaining. Built with 3.5 in., color, LED-backlit screen with 240 x 360 resolution, display also lets boaters view motor steer with real-time navigation information. Read More

Test & Measuring Instruments

In-line Inspection System is designed for patterned wafers.

November 28, 2014

Superfast 4G high-volume, in-line 3D topography inspection system leverages coherent gradient sensing (CGS) technology. Resulting flexibility enables use of single wafer inspection tool type for measuring front side of patterned wafers across entire fab line. Offering 125 wph throughput for in-line, patterned wafer system, this open-architecture inspection platform uses direct, front-side, 3D topography measurement for patterned wafers and helps improve lithography performance. Read More

Services, Test & Measuring Instruments, Food Processing & Preparation, Sensors, Monitors & Transducers

X-Ray Systems detect contaminants in bulk food ingredients.

November 28, 2014

With Xpert B400 and B600, food processors, growers, and packers can address potential contaminants in bulk materials such as seeds, nuts, fruits, and vegetables. Users can choose from conveyor belt widths of 400 and 600 mm, which run at max speed of 80 m/min. Typical detection sensitivities are 1–1.5 mm for metals and 3–4 mm for glass and rocks. Three guide types help products stay on conveyor belt, while adjustable metering device facilitates consistent product level for optimum detection. Read More