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Atomic Force Microscope supports multiple imaging modes.

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December 11, 2013 - Used for nanoscale measurement, characterization, and manipulation,á7500 AFM achieves atomic resolution imaging with its 90 Ám AFM closed-loop scanner. Integrated environmental chamber provides accessible, sealed sample compartmentácompletely isolated from rest of system. Humidity and temperature sensors track conditions in situ, and oxygen and reactive gases can be introduced into and purged from sample chamber. Optional sample temperature controller allows control from -30 to +250░C.
Original Press Release

Agilent Technologies, Inc.
5301 Stevens Creek Blvd.
Santa Clara, CA, 95051
USA



Agilent Technologies Introduces Next-Generation Atomic Force Microscope


SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today announced the availability of its 7500 atomic force microscope (AFM), a highly advanced instrument that establishes new performance, functionality and ease-of-use benchmarks for nanoscale measurement, characterization and manipulation. The Agilent 7500 achieves atomic resolution imaging with its 90 Ám AFM closed-loop scanner.

The Agilent 7500 is a next-generation platform designed to extend the frontier of atomic force microscopy for academia and industry by offering high resolution and unrivaled environmental and temperature control. The new 7500 AFM is an ideal solution for forward-looking applications in materials science, life science, polymer science, electrochemistry, electrical characterization and nanolithography.

The 7500 AFM has an integrated environmental chamber that provides an easily accessible, sealed sample compartment totally isolated from the rest of the system. Humidity and temperature sensors in the chamber track conditions in situ; oxygen and reactive gases can be easily introduced into and purged from the sample chamber. An optional sample temperature controller for the 7500 allows precise control from -30░C to 250░C, with suitable resolution to match any experimental requirements.

A half-dozen AFM imaging modes are supported by the system’s standard nose cone, which can easily be interchanged with specialized nose cones as needed, extending capability. The 7500 comes with the ability to do advanced imaging and electrochemistry applications. Single-pass nanoscale electrical characterization is achievable via Agilent’s exclusive MAC Mode III controller.

The Agilent 7500 is available now. More information can be found at www.agilent.com/find/7500 . Product images are at www.agilent.com/find/7500_images.

AFM Instrumentation from Agilent Technologies

Agilent offers high-precision, modular AFM solutions for research, industry and education. Exceptional worldwide support is provided by experienced application scientists and technical service personnel. Agilent’s leading-edge R&D laboratories are dedicated to the timely introduction and optimization of innovative and easy-to-use AFM technologies.

About Agilent Technologies

Agilent Technologies Inc. (NYSE: A) is the world’s premier measurement company and a technology leader in chemical analysis, life sciences, diagnostics, electronics and communications. The company’s 20,600 employees serve customers in more than 100 countries. Agilent had revenues of $6.8 billion in fiscal 2013. Information about Agilent is available at www.agilent.com.

On Sept. 19, 2013, Agilent announced plans to separate into two publicly traded companies through a tax-free spinoff of its electronic measurement company. The separation is expected to be completed in early November 2014.
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