Agilent Technologies, Inc.
Santa Clara, CA 95051
EDA Software helps design chip-to-chip links.
Available as add-on to Advanced Design System 2014, Controlled Impedance Line Designer accurately optimizes stack up and line geometry for multigigabit-per-second chip-to-chip links, using most relevant metric. Program lets engineers see set of post-equalization eye openings that result from sweeping through pre-layout design parameters. To ensure accurate calculation of transmission line...
Read More »TDR/TDT Modules characterize multiport 25/28/100 Gbps designs.
As many as 4 plug-in N1055A 35/50 GHz (8 psec) time-domain reflectometry and transmission (TDR/TDT) modules can be used with 86100D DCA-X oscilloscope mainframe to provide 2- to 16-channel TDR/TDT measurement system. Module provides impedance and S-parameter measurements on high-speed designs, and 2-/4-port TDR/TDT remote heads can be configured with sampler bandwidth of 35 or 50 GHz to provide...
Read More »Agilent Technologies Installs Atomic Force Microscope with Scanning Microwave Microscopy Capabilities at Cambridge Graphene Centre
SANTA CLARA, Calif.Ã- — Agilent Technologies Inc. (NYSE: A) today announced the recent installation of an Agilent 5600LS atomic force microscope at the Cambridge Graphene Centre (CGC) in the United Kingdom. The CGC, one of the key consortium partners in the ambitious Future and Emerging Technologies (FET) Graphene Flagship project, is directed by Andrea Ferrari, professor of nanotechnology...
Read More »Waveguide Power Sensor provides E-band power measurements.
Designed with WR-12 flange connector, E8486A Waveguide Power Sensor makes precise power measurements in E-band spectrum of 60–90 GHz. Unit comes with 80 dB dynamic range option, allowing sensor to measure from -60 to +20 dBm instead of standard -30 to +20 dBm range. To facilitate calibration, sensor incorporates 50 MHz calibration port, eliminating uncertainties due to temperature...
Read More »Agilent Technologies to Exhibit Digital Design and Test Solutions at DesignCon 2014
SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today announced it will exhibit its high-speed digital solutions shown at DesignCon 2014, Jan. 29-30, Booth 201, in Santa Clara. The products offer a wide range of essential tools to help engineers design, simulate, analyze, debug and achieve compliant designs while meeting the challenges of gigabit digital designs. The company will also...
Read More »Agilent Technologies and University of Washington Collaborate to Build High-Tech RF and Microwave Teaching Laboratory
SANTA CLARA, Calif., and SEATTLE, Wash. –Ã- Agilent Technologies Inc. (NYSE: A) and the University of Washington today announced they will work together to create a new RF and microwave teaching laboratory and curriculum using the industry's latest test equipment. Agilent will provide FieldFox RF combination analyzers along with 89600 VSA software and EEsof EDA software in addition to some...
Read More »Host Adapter accelerates RFIC protocol testing.
Providing serial stimulus needed to evaluate and characterize circuits based on DigRF v4 specification, M9252A DigRF Host Adapter offers protocol testing solution for MIPI™ Alliance Gear2 DigRf v4 RFICs. Single module combines stimulus and Rx side capture to generate configurable control and data traffic and allow developers to observe response from DUT. Engineers can work in domain of their...
Read More »Boundary Scan Analyzer aids board design and validation.
Providing 4 test access ports and 22.5 MHz TestClock, Model x1149 can be used throughout product development cycle, from design and validation to high-volume production. Benchtop system offers actionable pin-level failure reporting, STAPL player for CPLD/FPGA tests, and Scan Path Linker which enables multiple chains to be linked into single chain. With Cover-Extend Technology, test coverage can...
Read More »UFS Procotol Decoding Software runs on oscilloscopes.
Running on Infiniium 90000A, 90000 X-Series, and 90000 Q-Series oscilloscopes, N8818A Software decodes protocol packets for JEDEC's Universal Flash Storage v1.1 specification,Ã- enabling engineers to validate and debug UFS interfaces. Software supports MIPI M-PHY speeds of up to 5.8 Gbps.Ã- It providesÃ- symbol, packet, frame, and payload detail of protocols; high-speed/low-speed PWM...
Read More »Compliace Testing Application provides EEE standards assessment.
Agilent N5392BÃ- provides automated script that lets engineers test Energy-Efficient Ethernet (EEE) signals used in networking applications. Specifically, this solution for transmitter tests includes 10/100/1000BASE-T EEE test standards as described in IEEE 802.3az-2010 specification. ApplicationÃ- can be automated to run over extended periods and also allows engineers to add incremental...
Read More »Agilent Technologies Offers Application Note on Millimeter Wave Wireless Backhaul
What: The application note, “Solutions for Millimeter Wave Wireless Backhaul” provides insight into how to design and test E-band backhaul using effective network analysis, signal generation and analysis solutions. It is the newest in the series of Agilent Power of Wireless application notes designed to provide a better understanding into the intricacies of the continuously evolving wireless...
Read More »Agilent Technologies Offers Expert Video on LTE-A Carrier Aggregation Technology and Test Challenges
What: This new video on LTE-A Carrier Aggregation offers insight into LTE-A device test performed under real world conditions, which represents a challengeintegrated functional and RF test solution for Category 4/6 device test with MIMO, fading and noise generation When: Available now Where: www.agilent.com/find/CellularVideos and https://www.youtube.com/user/AgilentCellular Additional...
Read More »EDA Software helps design chip-to-chip links.
Available as add-on to Advanced Design System 2014, Controlled Impedance Line Designer accurately optimizes stack up and line geometry for multigigabit-per-second chip-to-chip links, using most relevant metric. Program lets engineers see set of post-equalization eye openings that result from sweeping through pre-layout design parameters. To ensure accurate calculation of transmission line...
Read More »Agilent Technologies Opens On-Site, State-of-the-Art Semi-Anechoic Electromagnetic Compatibility Chamber for Electronic Test
Santa Rosa Facility Addresses Need for Faster Time-to-Market, Product Conformance to Emerging Test Standards SANTA CLARA, Calif. –Ã- Agilent Technologies Inc. (NYSE: A) today announced the opening of its 5-meter semi-anechoic electromagnetic compatibility chamber facility for electronic test at the company's Santa Rosa, Calif., site. The new facility expands Agilent's in-house EMC test...
Read More »Agilent Technologies Offers Application Note on LTE-Advanced Manufacturing Test
What: The Solutions for LTE-Advanced Manufacturing Test application note provides an understanding of the requirements for LTE-Advanced Carrier Aggregation manufacturing test. It is the newest in the series of Agilent Power of Wireless application notes designed to provide a better understanding into the intricacies of the continuously evolving wireless industry, so you can accelerate your...
Read More »TDR/TDT Modules characterize multiport 25/28/100 Gbps designs.
As many as 4 plug-in N1055A 35/50 GHz (8 psec) time-domain reflectometry and transmission (TDR/TDT) modules can be used with 86100D DCA-X oscilloscope mainframe to provide 2- to 16-channel TDR/TDT measurement system. Module provides impedance and S-parameter measurements on high-speed designs, and 2-/4-port TDR/TDT remote heads can be configured with sampler bandwidth of 35 or 50 GHz to provide...
Read More »Agilent Technologies Installs Atomic Force Microscope with Scanning Microwave Microscopy Capabilities at Cambridge Graphene Centre
SANTA CLARA, Calif.Ã- — Agilent Technologies Inc. (NYSE: A) today announced the recent installation of an Agilent 5600LS atomic force microscope at the Cambridge Graphene Centre (CGC) in the United Kingdom. The CGC, one of the key consortium partners in the ambitious Future and Emerging Technologies (FET) Graphene Flagship project, is directed by Andrea Ferrari, professor of nanotechnology...
Read More »Waveguide Power Sensor provides E-band power measurements.
Designed with WR-12 flange connector, E8486A Waveguide Power Sensor makes precise power measurements in E-band spectrum of 60–90 GHz. Unit comes with 80 dB dynamic range option, allowing sensor to measure from -60 to +20 dBm instead of standard -30 to +20 dBm range. To facilitate calibration, sensor incorporates 50 MHz calibration port, eliminating uncertainties due to temperature...
Read More »Agilent Technologies to Exhibit Digital Design and Test Solutions at DesignCon 2014
SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today announced it will exhibit its high-speed digital solutions shown at DesignCon 2014, Jan. 29-30, Booth 201, in Santa Clara. The products offer a wide range of essential tools to help engineers design, simulate, analyze, debug and achieve compliant designs while meeting the challenges of gigabit digital designs. The company will also...
Read More »Agilent Technologies Announces LTE and LTE-Advanced Solutions Guide
What: The LTE and LTE-Advanced Solutions guide offers insights into today’s LTE or Long Term Evolution standard for cellular communications. Providing the delivery of the next generation of mobile broadband, LTE and now LTE-Advanced continues to provide many challenges to the engineers developing and delivering products that work to the standards. This new document gives the reader a better...
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