Agilent Technologies, Inc.
Santa Clara, CA 95051
TDR/TDT Modules characterize multiport 25/28/100 Gbps designs.
As many as 4 plug-in N1055A 35/50 GHz (8 psec) time-domain reflectometry and transmission (TDR/TDT) modules can be used with 86100D DCA-X oscilloscope mainframe to provide 2- to 16-channel TDR/TDT measurement system. Module provides impedance and S-parameter measurements on high-speed designs, and 2-/4-port TDR/TDT remote heads can be configured with sampler bandwidth of 35 or 50 GHz to provide...
Read More »Agilent Technologies Installs Atomic Force Microscope with Scanning Microwave Microscopy Capabilities at Cambridge Graphene Centre
SANTA CLARA, Calif.Ã- — Agilent Technologies Inc. (NYSE: A) today announced the recent installation of an Agilent 5600LS atomic force microscope at the Cambridge Graphene Centre (CGC) in the United Kingdom. The CGC, one of the key consortium partners in the ambitious Future and Emerging Technologies (FET) Graphene Flagship project, is directed by Andrea Ferrari, professor of nanotechnology...
Read More »Waveguide Power Sensor provides E-band power measurements.
Designed with WR-12 flange connector, E8486A Waveguide Power Sensor makes precise power measurements in E-band spectrum of 60–90 GHz. Unit comes with 80 dB dynamic range option, allowing sensor to measure from -60 to +20 dBm instead of standard -30 to +20 dBm range. To facilitate calibration, sensor incorporates 50 MHz calibration port, eliminating uncertainties due to temperature...
Read More »Agilent Technologies to Exhibit Digital Design and Test Solutions at DesignCon 2014
SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today announced it will exhibit its high-speed digital solutions shown at DesignCon 2014, Jan. 29-30, Booth 201, in Santa Clara. The products offer a wide range of essential tools to help engineers design, simulate, analyze, debug and achieve compliant designs while meeting the challenges of gigabit digital designs. The company will also...
Read More »Protocol Decoding Software debugs SSIC and CSI-3 interfaces.
Designed to run on 90000A, 90000 X-, and 90000 Q-Series oscilloscopes, N8819A USB 3.0 SSIC and N8820A MIPI CSI-3 software decode protocol packets for SSIC v1.0 and MIPI CSI-3 v1.0 specifications, respectively. Programs support correlated protocol decode information with analog waveforms; symbol, packet, frame, and payload detail of protocols; high-speed and low-speed pulse-width modulation...
Read More »Simulation/Verification/Analysis Software aids RFIC design.
GoldenGate 2013.10 offers EVM-/BER-/ACPR-type measurements and accelerates analysis and diagnosis of problem areas. Along with verification test benches for validating/optimizing RFIC designs using standard-compliant waveforms and measurements, solution provides technologies to explore, analyze, and optimize RF circuits early in design cycle. Features also include FCE model export from GoldenGate...
Read More »Agilent Technologies' Model Extraction and Qualification Software Adopted by Microchip Technology for PDK Creation, Modification, Validation
SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today announced that Microchip Technology Inc., a leading provider of microcontroller, mixed-signal, analog and Flash-IP solutions, has adopted Agilent EEsof EDA's Model Builder Program and Model Quality Assurance software. Microchip Technology will use the software to create internal fabrication device model libraries or process design...
Read More »Atomic Force Microscope supports multiple imaging modes.
Used for nanoscale measurement, characterization, and manipulation,Ã- 7500 AFM achieves atomic resolution imaging with its 90 Ã-µm AFM closed-loop scanner. Integrated environmental chamber provides accessible, sealed sample compartmentÃ- completely isolated from rest of system. Humidity and temperature sensors track conditions in situ, and oxygen and reactive gases can be introduced...
Read More »Microwave Analog Signal Generators feature low phase noise.
Featuring 2 RU design, Model N5183B MXG features phase noise of less than -124 dBc/Hz and -75 dBc spurious, enabling module- and system-level testing up to 40 GHz. Unit also accelerates calibration of complex systems with switching speed of less than 600 Ã-µs. Model N5173B EXG, combining output power of +20 dBm at 20 GHz with low harmonics of less than -55 dBc, is suited for characterization...
Read More »Nanomechanical Measurement Device supports accelerated testing.
Using electromagnetic actuation for optimal force and displacement, Nano Indenter G200Ã- supports Express Test optionÃ- thatÃ- accelerates nanoindentation for mechanical-properties mapping. Express Test delivers precision data onÃ- various materials, and allows up to 100 indents to be performed at 100 different surface sites in 100 sec. Furthermore, Express Test...
Read More »Agilent Technologies Offers Expert Video on LTE-A Carrier Aggregation Technology and Test Challenges
What: This new video on LTE-A Carrier Aggregation offers insight into LTE-A device test performed under real world conditions, which represents a challengeintegrated functional and RF test solution for Category 4/6 device test with MIMO, fading and noise generation When: Available now Where: www.agilent.com/find/CellularVideos and https://www.youtube.com/user/AgilentCellular Additional...
Read More »Agilent Technologies Offers Application Note on Millimeter Wave Wireless Backhaul
What: The application note, “Solutions for Millimeter Wave Wireless Backhaul” provides insight into how to design and test E-band backhaul using effective network analysis, signal generation and analysis solutions. It is the newest in the series of Agilent Power of Wireless application notes designed to provide a better understanding into the intricacies of the continuously evolving wireless...
Read More »Agilent Technologies Opens On-Site, State-of-the-Art Semi-Anechoic Electromagnetic Compatibility Chamber for Electronic Test
Santa Rosa Facility Addresses Need for Faster Time-to-Market, Product Conformance to Emerging Test Standards SANTA CLARA, Calif. –Ã- Agilent Technologies Inc. (NYSE: A) today announced the opening of its 5-meter semi-anechoic electromagnetic compatibility chamber facility for electronic test at the company's Santa Rosa, Calif., site. The new facility expands Agilent's in-house EMC test...
Read More »Agilent Technologies Offers Application Note on LTE-Advanced Manufacturing Test
What: The Solutions for LTE-Advanced Manufacturing Test application note provides an understanding of the requirements for LTE-Advanced Carrier Aggregation manufacturing test. It is the newest in the series of Agilent Power of Wireless application notes designed to provide a better understanding into the intricacies of the continuously evolving wireless industry, so you can accelerate your...
Read More »TDR/TDT Modules characterize multiport 25/28/100 Gbps designs.
As many as 4 plug-in N1055A 35/50 GHz (8 psec) time-domain reflectometry and transmission (TDR/TDT) modules can be used with 86100D DCA-X oscilloscope mainframe to provide 2- to 16-channel TDR/TDT measurement system. Module provides impedance and S-parameter measurements on high-speed designs, and 2-/4-port TDR/TDT remote heads can be configured with sampler bandwidth of 35 or 50 GHz to provide...
Read More »Agilent Technologies Installs Atomic Force Microscope with Scanning Microwave Microscopy Capabilities at Cambridge Graphene Centre
SANTA CLARA, Calif.Ã- — Agilent Technologies Inc. (NYSE: A) today announced the recent installation of an Agilent 5600LS atomic force microscope at the Cambridge Graphene Centre (CGC) in the United Kingdom. The CGC, one of the key consortium partners in the ambitious Future and Emerging Technologies (FET) Graphene Flagship project, is directed by Andrea Ferrari, professor of nanotechnology...
Read More »Waveguide Power Sensor provides E-band power measurements.
Designed with WR-12 flange connector, E8486A Waveguide Power Sensor makes precise power measurements in E-band spectrum of 60–90 GHz. Unit comes with 80 dB dynamic range option, allowing sensor to measure from -60 to +20 dBm instead of standard -30 to +20 dBm range. To facilitate calibration, sensor incorporates 50 MHz calibration port, eliminating uncertainties due to temperature...
Read More »Agilent Technologies to Exhibit Digital Design and Test Solutions at DesignCon 2014
SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today announced it will exhibit its high-speed digital solutions shown at DesignCon 2014, Jan. 29-30, Booth 201, in Santa Clara. The products offer a wide range of essential tools to help engineers design, simulate, analyze, debug and achieve compliant designs while meeting the challenges of gigabit digital designs. The company will also...
Read More »Agilent Technologies Announces LTE and LTE-Advanced Solutions Guide
What: The LTE and LTE-Advanced Solutions guide offers insights into today’s LTE or Long Term Evolution standard for cellular communications. Providing the delivery of the next generation of mobile broadband, LTE and now LTE-Advanced continues to provide many challenges to the engineers developing and delivering products that work to the standards. This new document gives the reader a better...
Read More »Protocol Decoding Software debugs SSIC and CSI-3 interfaces.
Designed to run on 90000A, 90000 X-, and 90000 Q-Series oscilloscopes, N8819A USB 3.0 SSIC and N8820A MIPI CSI-3 software decode protocol packets for SSIC v1.0 and MIPI CSI-3 v1.0 specifications, respectively. Programs support correlated protocol decode information with analog waveforms; symbol, packet, frame, and payload detail of protocols; high-speed and low-speed pulse-width modulation...
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