Unilever Takes New Approach to Particle Sizing
Malvern, UK: Waxy semisolids, today the formulation vehicle for many pharmaceutical and personal care products, present a considerable challenge when it comes to particle size analysis, primarily because they are not liquid at ambient temperature. By taking a new approach to particle sizing for these materials using the Mastersizer 2000 system from Malvern Instruments, researchers at Unilever are...
Read More »Malvern Particle Characterization Systems Accelerate Nasal Spray Testing
16 March 2009: Malvern, UK: New work from Malvern Instruments illustrates how the complementary particle characterization techniques of laser diffraction (Spraytec) and automated image analysis (Morphologi G3) can accelerate nasal spray testing. Both methods are time-efficient, providing detailed insight for formulation development and supporting streamlined analysis for QC. A full report on the...
Read More »PANalytical at PITTCON 2008
New products and new applications in New Orleans That's what attendees at this year's PITTCON Conference & Expo can expect from PANalytical, the world's leading X-ray analysis company. Visit the company on booth #2720-21. PANalytical's focus on extending the use of X-ray fluorescence (XRF) spectrometry and X-ray diffraction (XRD) in the pharmaceutical industry will see the announcement of MiniPal...
Read More »Malvern Highlights Particle Analysis for Wet and Dry Process Streams
Booth 2415: International Powder & Bulk Solids 2008 (May 6-8, 2008: Rosemont, IL) 20 February 2008: Malvern, UK: Malvern Instruments will exhibit Insitec and Parsum particle characterization systems for real-time process measurement at this year's International Powder & Bulk Solids show (6-8 May 2008, Rosemont, IL). Alongside will be the industry-leading Mastersizer 2000 laser diffraction...
Read More »Does an IT MSP Really Add Value to a Manufacturing Environment?
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Read More »EDAX Announces Performance Enhancements for the Hikari Electron Backscatter Detector
MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, announced its latest advancements on high-speed EBSD data acquisition. The Hikari once again raises the standard for high-speed EBSD pattern collection and orientation measurement , explains Del Redfern, Product Marketing Manager at EDAX. Combined with our market and technology-leading Orientation...
Read More »Edax Showcases New HIKARI Electron Backscatter Detector at Microscopy and Microanalysis 2006
MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, showcased its newest high-speed EBSD detector, the Hikari, at the Microscopy and Microanalysis 2006 Conference, July 31 through August 3, 2006 at the Navy Pier Convention Center, Chicago, Illinois. The Hikari detector provides a significant increase in EBSD pattern collection speed over current...
Read More »Machinery suit Electron Backscatter Diffraction.
Electron Backscatter Diffraction (EBSD) System models OIM 2000, OIM 4000, and OIM 7000 include EBSD cameras, data collection, and analysis software that provides various tools for characterizing crystalline microstructures. Units also incorporate ChI-Scan, which takes advantage of simultaneously collected EDS and EBSD data to handle multi-phase samples.
Read More »ISO-Certified Precision Machining and Contract Manufacturing Services from DFF
DFF is an industry leading contract manufacturer specializing in medium to high production precision machined components and electromechanical assemblies. Our 100 CNC machining centers and design-assist capabilities ensure our customers' needs are always met. Check out our video to learn more.
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