Edax Showcases New HIKARI Electron Backscatter Detector at Microscopy and Microanalysis 2006
MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, showcased its newest high-speed EBSD detector, the Hikari, at the Microscopy and Microanalysis 2006 Conference, July 31 through August 3, 2006 at the Navy Pier Convention Center, Chicago, Illinois.
"The Hikari detector provides a significant increase in EBSD pattern collection speed over current detector offerings on the market", explains Andy Fisher, Technical Product Manager for Crystallography Products at EDAX. "Combined with our market and technology-leading Orientation Imaging Microscopy (OIM) software, the pattern collection and indexing rate of 200 pps are unparalleled.
"There have been notable increases in camera and collection speeds over the past 10 years, but the Hikari provides a great leap forward in benefits to research and manufacturing laboratories that routinely use EBSD to analyze materials and minerals. The combination of high-speed pattern acquisition and reliable and accurate pattern analysis provided by the Hikari allows users to obtain consistent high-quality data in shorter times. This high level of performance is unequalled by any other EBSD product," notes Fisher.
"Concurrent with the development of the Hikari detector, EDAX has developed a new embedded Camera Console within the OIM Data Collection software. The user friendly graphical interface is an exciting advancement for us, as it is very intuitive with easy to use camera settings that ultimately provide the user greater control over the detector for optimal pattern collection. That flexibility allows users to obtain EBSD patterns and orientation data from a wide range of materials, minerals, and crystals," he adds.
"With the development of the Hikari EBSD detector, EDAX further solidifies its position as the market leader and pre-eminent supplier of microanalysis tools: EDS, EBSD, and WDS systems, providing a seamless integration that allows the material characterization engineer or scientist to generate results with confidence," concludes Fisher.
EDAX is the acknowledged leader in Energy Dispersive Microanalysis, X-ray Fluorescence and Electron Backscatter Diffraction instrumentation. It designs, manufactures, installs and services high-quality products and systems for leading companies in semiconductors, metals, geological, biological, material and ceramics market. Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.
EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices with annualized sales of more than $1.6 billion.
For further information about EDAX-TSL, contact us at:
EDAX
91 McKee Drive, Mahwah, NJ 07430
Tel: (201) 529-4880 Fax: (201) 529-3156
E-mail: info.edax@ametek.com
Website: www.edax.com
