Carl Zeiss Microscopy, a leading provider of microscopy solutions, announces that it will be showcasing state of the art electron and X-ray microscopes, digital imaging systems for QA/QC and particle analysis, and stereo microscopes suited for heavy workloads at PITTCON 2015, March 8-13, Booth #4317, in New Orleans, LA. On display will be the ZEISS SIGMA HD Field Emission Scanning Electron Microscope (FE-SEM), the ZEISS Smartzoom 5 smart digital microscope, as well as the brand new ZEISS Stemi 508 stereo microscope.
With a market-leading Gemini column, the ZEISS SIGMA HD FE-SEM provides unparalleled resolution, contrast, and brightness for imaging highly topographical samples. Featuring high vacuum and variable pressure modes of operation, users profit from high definition imaging of conducting and non-conducting samples. Use SIGMA to capture images with resolutions up to 1.0 nanometer. Drop by the booth for an imaging demonstration.
Visitors to the booth can test out the Smartzoom 5 smart digital microscope in a demonstration game and see why it is ideal for QA/QC and failure analysis applications. Experience the Smartzoom 5's quick and simple setup and fully automated controls. Test out its simple operation, which enables even untrained users to produce reliable results. Demonstration game participants can enter a raffle to win a pair of ZEISS binoculars.
Also on display is the brand new Stemi 508, a high quality stereo microscope with mechanics and optics designed for the heavy workloads of everyday lab work and industrial inspections. With the Stemi 508, users can view samples in sharp focus, free of distortions and color fringes with apochromatic optics. The top-performing Stemi 508 brings out the details in samples up to 50x magnification.
Dr. Jochen Tham
Phone +49 3641 64-3949