X-Ray Fluorescence Analyzer includes control software.
Press Release Summary:
SPECTRO iQ II features Silicon Drift Detector unit derived from SPECTRO XEPOS XRF, as well as software control interface allowing addition of optional touch-screen computer and structure menus enabling non-technical personnel to start, monitor, evaluate, and document analytical processes. It uses polarized excitation to perform multi-elemental analysis of solid, powder, and liquid samples for process control.
Original Press Release:
SPECTRO IQ II Offers Simpler Operation with Improved Analytical Performance
New X-Ray Fluorescence Analyzer Features Optional Touch Screen
Operation and Higher Spectral Resolution Detector Unit
MARLBOROUGH, MA, February 25, 2007- SPECTRO Analytical Instruments introduces the next generation of XRF spectrometry instruments-the SPECTRO iQ II--at the Pittcon Conference (February 25 to March 1, 2007) in Chicago.
Introduced in 2005, the SPECTRO iQ was specifically developed for demanding process control applications. It uses polarized excitation to perform multi-elemental analysis of solid, powder and liquid samples primarily for process control, where rapid analysis, reliable analytical results and simplified operation are especially important.
The latest version of the SPECTRO iQ surpasses its predecessor by being easier to operate and incorporating a new detection system derived from the larger and more powerful SPECTRO XEPOS XRF instrument.
Among the improvements is a new software control interface that allows the addition of an optional touch-screen computer. With the touch screen and the clearly structured menus, it is no problem for non-technical personnel to start, monitor, evaluate and document the analytical processes with only a few commands.
In addition to its innovative control software, the SPECTRO iQ II is equipped with a new Silicon Drift Detector unit that is technically derived from the detector in the larger and more powerful SPECTRO XEPOS XRF spectrometer.
"The SPECTRO iQ was already at the head of the class with regards to measurement accuracy for the analysis of sodium, magnesium, aluminum, silicon, phosphorous, sulfur and chlorine," comments Product Manager Dirk Wissman.
"With the addition of the new detector, the SPECTRO iQ II offers higher spectral resolution and lower detection limits for numerous elements. Altogether, this leads to measurement results with higher accuracy and reproducibility - especially for difficult matrices," notes Wissman.
"For example, the strong sulfur signal present when examining lubricating oils can obscure the lines of several trace elements. The new detector performs more precisely here, and the user receives more accurate results. This applies to other applications, and a number of application packages already are available for the SPECTRO iQ II, including analysis of additives in oil, cement, slag and ceramics," he adds.
About SPECTRO:
SPECTRO is one of the worldwide leading suppliers of analytical instruments for optical emission and X-ray fluorescence spectrometry. As a unit of AMETEK Materials Analysis Division, SPECTRO manufactures advanced instruments, develops the best solutions for strongly varying applications and provides exemplary customer service. Innovation, instrument concerns and customer relations are its main activities. >From its foundation in 1979 until today, more than 25,000 analytical instruments have been delivered to customers around the world.
SPECTRO Analytical Instruments is a unit of AMETEK, Inc. a leading global manufacturer of electronic instruments and electromechanical devices with annual revenues of $1.8 billion.
AMETEK Materials Analysis Division
450 Donald Lynch Blvd. Marlborough, MA 01752 USA
Tel: 800-848-5809 Fax: 508-683-1591
www.spectro.com
Contact: Mark Grey (508) 683-1525
