Spectro Analytical Instruments, Inc.
Mahwah, NJ 07430
New ICP-OES Analyzer Comes with ORCA Optical Technology
Features twin interface that automatically combines both axial and radial plasma views. Delivers ultra-reliable, accurate analyses of elements in challenging matrices. Ideal for routine elemental analyses in environmental and agronomy, consumer product safety, pharmaceutical, chemical/petrochemical, and food applications.
Read More »New ICP-OES Analyzer Comes with ORCA Optical Technology
Features twin interface that automatically combines both axial and radial plasma views. Delivers ultra-reliable, accurate analyses of elements in challenging matrices. Ideal for routine elemental analyses in environmental and agronomy, consumer product safety, pharmaceutical, chemical/petrochemical, and food applications.
Read More »New SPECTROLAB S OES Analyzer Features CMOS+T Technology
Delivers the fast measurements, low limits of detection, long uptime and most future-proof flexibility. Includes CMOS-based detector system that’s ideal for high-end metal analysis. Provides both short-term and long-term stability.
Read More »New SPECTROLAB S OES Analyzer Features CMOS+T Technology
Delivers the fast measurements, low limits of detection, long uptime and most future-proof flexibility. Includes CMOS-based detector system that’s ideal for high-end metal analysis. Provides both short-term and long-term stability.
Read More »New SPECTROCUBE ED-XRF Analyzer Features Nondestructive ED-XRF Detector Technology
Deliver short measurement intervals, effortless workflow via intuitive software and low downtime. Analyzes an area down to a spot size of 0.2 mm. Provides reliable, accurate and high throughput analysis for elemental compliance screening.
Read More »New SPECTROCUBE ED-XRF Analyzer Features Nondestructive ED-XRF Detector Technology
Deliver short measurement intervals, effortless workflow via intuitive software and low downtime. Analyzes an area down to a spot size of 0.2 mm. Provides reliable, accurate and high throughput analysis for elemental compliance screening.
Read More »New SPECTROCUBE ED-XRF Analyzer Features Nondestructive ED-XRF Detector and High-resolution Silicon Drift Detector Technologies
Enables fast, smooth workflow, even for minimally trained users, for unparalleled ease of use. Provides high precision for a range of concentration levels, plus testing times as low as 15 seconds. Delivers easy, reliable, accurate, high-throughput analysis for testing centers, hallmarking and assay offices and jewelry makers.
Read More »New SPECTROCUBE ED-XRF Analyzer Features Nondestructive ED-XRF Detector and High-resolution Silicon Drift Detector Technologies
Enables fast, smooth workflow, even for minimally trained users, for unparalleled ease of use. Provides high precision for a range of concentration levels, plus testing times as low as 15 seconds. Delivers easy, reliable, accurate, high-throughput analysis for testing centers, hallmarking and assay offices and jewelry makers.
Read More »SPECTRO Launches SPECTROGREEN ICP-OES Analyzer with Dual Side-On Interface (DSOI)
DSOI provides twice the sensitivity of conventional radial systems and avoids the complexity, drawbacks and cost of vertical dual view models. SPECTRO’s ORCA optical technology maximizes light throughput, stability and sensitivity. Ideal for routine analyses in environmental and agronomy applications as well as consumer product safety, pharmaceuticals, petrochemicals, chemicals and foods.
Read More »SPECTRO Launches SPECTROGREEN ICP-OES Analyzer with Dual Side-On Interface (DSOI)
DSOI provides twice the sensitivity of conventional radial systems and avoids the complexity, drawbacks and cost of vertical dual view models. SPECTRO’s ORCA optical technology maximizes light throughput, stability and sensitivity. Ideal for routine analyses in environmental and agronomy applications as well as consumer product safety, pharmaceuticals, petrochemicals, chemicals and foods.
Read More »New ICP-OES Analyzer Comes with ORCA Optical Technology
Features twin interface that automatically combines both axial and radial plasma views. Delivers ultra-reliable, accurate analyses of elements in challenging matrices. Ideal for routine elemental analyses in environmental and agronomy, consumer product safety, pharmaceutical, chemical/petrochemical, and food applications.
Read More »New ICP-OES Analyzer Comes with ORCA Optical Technology
Features twin interface that automatically combines both axial and radial plasma views. Delivers ultra-reliable, accurate analyses of elements in challenging matrices. Ideal for routine elemental analyses in environmental and agronomy, consumer product safety, pharmaceutical, chemical/petrochemical, and food applications.
Read More »New SPECTROLAB S OES Analyzer Features CMOS+T Technology
Delivers the fast measurements, low limits of detection, long uptime and most future-proof flexibility. Includes CMOS-based detector system that’s ideal for high-end metal analysis. Provides both short-term and long-term stability.
Read More »New SPECTROLAB S OES Analyzer Features CMOS+T Technology
Delivers the fast measurements, low limits of detection, long uptime and most future-proof flexibility. Includes CMOS-based detector system that’s ideal for high-end metal analysis. Provides both short-term and long-term stability.
Read More »New SPECTROCUBE ED-XRF Analyzer Features Nondestructive ED-XRF Detector Technology
Deliver short measurement intervals, effortless workflow via intuitive software and low downtime. Analyzes an area down to a spot size of 0.2 mm. Provides reliable, accurate and high throughput analysis for elemental compliance screening.
Read More »New SPECTROCUBE ED-XRF Analyzer Features Nondestructive ED-XRF Detector Technology
Deliver short measurement intervals, effortless workflow via intuitive software and low downtime. Analyzes an area down to a spot size of 0.2 mm. Provides reliable, accurate and high throughput analysis for elemental compliance screening.
Read More »New SPECTROCUBE ED-XRF Analyzer Features Nondestructive ED-XRF Detector and High-resolution Silicon Drift Detector Technologies
Enables fast, smooth workflow, even for minimally trained users, for unparalleled ease of use. Provides high precision for a range of concentration levels, plus testing times as low as 15 seconds. Delivers easy, reliable, accurate, high-throughput analysis for testing centers, hallmarking and assay offices and jewelry makers.
Read More »New SPECTROCUBE ED-XRF Analyzer Features Nondestructive ED-XRF Detector and High-resolution Silicon Drift Detector Technologies
Enables fast, smooth workflow, even for minimally trained users, for unparalleled ease of use. Provides high precision for a range of concentration levels, plus testing times as low as 15 seconds. Delivers easy, reliable, accurate, high-throughput analysis for testing centers, hallmarking and assay offices and jewelry makers.
Read More »SPECTRO Launches SPECTROGREEN ICP-OES Analyzer with Dual Side-On Interface (DSOI)
DSOI provides twice the sensitivity of conventional radial systems and avoids the complexity, drawbacks and cost of vertical dual view models. SPECTRO’s ORCA optical technology maximizes light throughput, stability and sensitivity. Ideal for routine analyses in environmental and agronomy applications as well as consumer product safety, pharmaceuticals, petrochemicals, chemicals and foods.
Read More »SPECTRO Launches SPECTROGREEN ICP-OES Analyzer with Dual Side-On Interface (DSOI)
DSOI provides twice the sensitivity of conventional radial systems and avoids the complexity, drawbacks and cost of vertical dual view models. SPECTRO’s ORCA optical technology maximizes light throughput, stability and sensitivity. Ideal for routine analyses in environmental and agronomy applications as well as consumer product safety, pharmaceuticals, petrochemicals, chemicals and foods.
Read More »