Spectrometer provides parts-per-million elemental analysis.

Press Release Summary:

Fully integrated, laser-induced-breakdown LIBS-Elite provides real-time spectral analysis of elements in variety of materials down to 1 ppm. System incorporates Tempest Nd:YAG laser, multiple spectrometers, and 7 linear CCD-array detectors that provide broadband analysis. Sample chamber accommodates samples up to 2 in. dia, while integrated rotometer provides chamber purging when working with inert gases. Software controls all laser parameters including power attenuation and ablation spot size.

Original Press Release:

New Wave Research Announces High-Speed, Laser-Induced-Breakdown Spectrometer

LIBS-Elite provides real-time, high-resolution spectral analysis of elements in a wide variety of materials

Fremont, Calif., July 18, 2006 - New Wave Research, a leading manufacturer of laser-based systems for flat-panel display repair, semiconductor failure analysis and micromachining today announced the LIBS-Elite, a fully integrated, laser-induced-breakdown spectrometer platform that provides real-time, high-resolution spectral analysis of elements in a variety of materials - down to one part per million. The LIBS-ELITE requires no sample preparation whatsoever; the user simply places a sample in the chamber, programs the system for about thirty seconds and receives a spectra within moments - based on an internal library of elemental standards. The LIBS-ELITE is ideal for fast, parts-per-million elemental analysis of metals, gems, biological tissues, pigments, glass, paints, plastics, semiconductors, soil samples, sediments, slag and optics.

The LIBS-ELITE incorporates New Wave Research's high-energy Tempest Nd:YAG laser.
Energy densities are optimized for ablation of many materials including glass, steel, noble metals, plastics, ceramics and biological matrices. Further, system software controls all laser parameters including power attenuation and ablation spot size. The LIBS-ELITE also incorporates multiple Ocean Optics high-resolution spectrometers. Seven linear CCD-array detectors provide broadband analysis and all spectrometers are triggered to acquire and read out data simultaneously.

For fast and easy materials handling, the system features a quick-loading sample chamber that accommodates samples up to two inches in diameter. Moreover, an integrated rotometer provides rapid sample-chamber purging when working with inert gasses.

Intuitive software further facilitates ease of use. In addition to sample viewing and stage-position control, the software includes many unique features to control target location, create reproducible maps and automate sample mapping, patterning and rastering.

The system also includes a high-magnification video system, micron-precision X-Y stages, manual Z focus, ring-light illumination and an integrated spectral library of elemental emission lines that facilitates automatic identification of elements present in samples.

Established in 1990, New Wave Research is a global leader in the development of high-quality lasers and laser-based systems for the microelectronics and analytical instrumentation industries. The company manufactures lasers for wafer scribing, flat-panel display repair, semiconductor failure analysis, micromachining, particle image velocimetry, laser ablation/solid sampling for ICP/ICP-MS, laser-induced-breakdown spectroscopy (LIBS) and general-purpose lasers for OEM and scientific applications.
For more information, contact New Wave Research, Inc., 48660 Kato Rd., Fremont, CA 94538, lasers@new-wave.com, (510) 249-1550. Web: www.new-wave.com

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