SoC Test System offers 3 module options.
Press Release Summary:
With T6577 SoC Test System, users can conduct tests on complex, multi-functional SoC devices. DDR2 Interface Test Option supports source synchronization techniques and enables at-speed test of memory interface functions and ac test. Featuring 16 channels, BBWGD Option adds baseband and analog test capability within 100 MHz range of signals. With 4 channels per module, SG/JMM module tests high-speed AD converters with capacity to generate sine waves at speeds up to 500 MHz.
Original Press Release:
Advantest Introduces 3 New Cost-Efficient Options for T6577 SoC Test System
Low-Cost Test Solution Targets High-Functionality Consumer Electronics Devices
TOKYO, Dec. 1 /-- Advantest Corporation , today announced the availability of three new modules for its T6577 SoC test platform that provide low-cost solutions to the diversifying test requirements of high-functionality SoC device manufacturers. These include a DDR2 Interface Test Option, a Base Band Waveform Generator / Digitizer (BBWGD) Option, and a Sine Wave Generator (SG) / Jitter Measurement Module (JMM) Option. Easily installed within the test head of the T6577, these new options help to cut costs otherwise incurred with complex test board manufacturing and maintenance, and contribute to significant yield improvements, as well. The T6577 will be exhibited at Semicon Japan, December 6 - 8, at Chiba's Makuhari Messe.
Competition is intensifying in the consumer electronics market, where worldwide growth in demand for popular products such as DVD players, portable televisions, and cellular phones is predicted to continue. With manufacturers striving to differentiate their offerings, makers of the devices that drive these products have increasingly pushed the technological envelope, competing not merely on price but on functionality and versatility. Advances in integration techniques now enable one chip to perform several different functions -- a trend that is set to continue. During manufacturing, however, each function performed by the SoC device must be tested separately and to a high level of accuracy. This capability was formerly available only on costly, high-performance test systems, whose price tags presented a severe obstacle to manufacturers seeking to cut test costs.
Advantest's new low-cost test solution consists of options designed for use with the T6577 SoC test system, launched by the company in June 2004. Now, customers can utilize their existing assets to conduct tests on highly complex, multi-functional consumer electronics SoC devices, eliminating the need for expensive new tester purchases.
o DDR2 Interface Test Option
Supporting source synchronization techniques, this option enables low- cost, at-speed test of memory interface functions and AC test. Maximum write test speed: 667Mbps.
o BBWGD (Base Band Waveform Generator / Digitizer) Option
This option adds baseband and analog test capability within the 100MHz range of signals utilized by SoC devices employed in cellular phones. A single module provides 16 channels of waveform generators and digitizers, increasing parallelism and achieving an approximately 50% reduction in cost of test over the previous model.
o SG (Sine Wave Generator) / JMM (Jitter Measurement Module) Option
This option tests the high-speed AD converters used in consumer electronics and other products with the capacity to generate sine waves at speeds up to 500MHz. It also supports jitter measurement of PLL (Phase Locked Loop) circuits and high-speed devices, up to 500MHz. With 4 channels per module, the sine wave generator and jitter measurement module help to cut test cost by approximately 50% over previous Advantest models.
All three modules will be available for shipment from the start of December. Prices begin at 3 million yen.
About Advantest
Advantest Corporation is the global leader in automatic test equipment to the semiconductor industry. Advantest's SoC, logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor fabrication lines in the world. Founded in Tokyo in 1954, Advantest established its North American subsidiary in 1982 and its European subsidiary in 1984. More information is available at http://www.advantest.com/.
Note: All information supplied in this release is correct at the time of publication.
CONTACT: Amy Gold of Advantest America, Inc., +1-212-850-6670, a.gold@advantest.com
