PDP Driver Test System features 125 MHz test speed.
Press Release Summary:
Model T6271 enables simultaneous testing of 4 high-pin count plasma display panel (PDP) driver ICs. Integration of digital test module with maximum of 256 channels for digital input and PDP test module with maximum of 768 channels for digital output enables system to parallel test up to 4 mainstream 192-pin PDP driver ICs and three 256-pin driver ICs. Product connects test module directly with target device without involving conversion board.
Original Press Release:
Advantest Enters Plasma Driver IC Market With New T6271 Test System
TOKYO, Nov. 30 -- Advantest Corporation , the global leader in semiconductor test systems, today announced the availability of its new T6271 PDP driver test system. Developed specifically to address the key demands associated with plasma display panel (PDP) driver IC technology -- high-speed digital data processing, high pin counts and high throughput, the T6271 is the industry's only system to enable simultaneous testing of 4 high-pin count PDP driver ICs, allowing it to help improve throughput and drastically lower test costs.
The T6271 will be exhibited at SEMICON Japan 2004, held December 1-3, 2004, at Makuhari Messe.
PDPs for high-definition television (HDTV) offer exceptional picture quality and are gaining in popularity both in commercial and residential applications. These PDPs are capable of supporting the large data volume requirements of HDTV, and demand for this technology is expected to accelerate particularly fast in Japan, where analog broadcasts will be entirely phased out in favor of digital broadcasts by 2011. However, the widespread adoption of this technology by the public has brought about severe market competition, and hence a rapid decline in prices. PDP driver ICs are key components of plasma TVs, and therefore, reducing the cost of production test for these ICs is crucial.
The T6271 PDP driver test system features a high-speed digital test module with a maximum of 256 channels for digital input, as well as a high-accuracy PDP test module with a maximum of 768 channels for digital output. This enables it to parallel test up to 4 mainstream 192-pin PDP driver ICs and up to 3 of the 256-pin driver ICs that support enhanced resolution. This high production throughput will dramatically contribute to reductions in cost of test.
The digital test modules can handle up to 125MHz (250 MHz in multi-pin mode), so the T6271 is capable of testing next-generation high-speed, high-throughput PDP driver ICs, as required to process the increased volume of picture data generated by digital broadcasts such as HDTV. It can also support reduced differential swing interfaces used for high-speed data transfer, as typified by Reduced Swing Differential Signaling(R) (RSDS). Moreover, the high-accuracy PDP test module reduces the load per channel by 40-50 percent over existing systems, permitting highly precise evaluation of the waveform quality of PDP output signals.
The T6271 connects the test module directly with the target device, without going through a conversion board as had been previously required. This prevents the degradation of signal quality associated with preservation of the shortest possible route for transfers of data from the device to the tester. Offering highly reliable tests, the T6271 contributes greatly to improved yield.
RSDS(R) is a registered trademark of National Semiconductor Corporation.
Specifications
Target Device: PDP Driver ICs
Parallel Test: Maximum 4 devices
PDP Measurement:
Channel Count: 768 (maximum)
Comparator: Per Pin Comparator
Digital Measurement:
Test Speed: 125 MHz (Pin Mux 250MHz)
Channel Count: 256 (maximum)
Software: Viewpoint
About Advantest
Advantest Corporation is the world's leading automatic test equipment supplier to the semiconductor industry, and also produces electronic and optoelectronic instruments and systems. A global company, Advantest has long offered total ATE solutions, and serves the industry in every component of semiconductor test: tester, handler, mechanical and electrical interfaces, and software. Its SoC, logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor fabrication lines in the world. Founded in Tokyo in 1954, Advantest established its North American subsidiary in 1982. Advantest America, Inc. and Advantest America R&D Center, Inc. are based in Santa Clara, Calif. More information is available at www.advantest.com.
CONTACT: Amy Gold of Advantest America, Inc., +1-212-753-0007, a.gold@advantest.com; or Lisa Gillette-Martin of MCA, +1-650-968-8900, lgmartin@mcapr.com, for Advantest Corporation
