New Reflectance and Color Monitoring Integrates QC Systems and PLCs

Press Release Summary:

  • Available with optics head attached to a dual linear-stage system to scan the panel
  • Provides real-time feedback for process control of color and reflectance
  • Measures spectral reflectance and color for consistency across reflective surfaces for glass lites


Original Press Release:

New Reflectance and Color Metrology System Introduced by k-Space Associates, Inc.

[Dexter, MI, May 4, 2021] – k-Space Associates, Inc. is excited to announce the release of kSA RCM (reflectance and color monitoring) to its industrial metrology product line. k-Space engineered the kSA RCM tool to measure absolute, real-time spectral reflectance and color to ensure consistency across reflective surfaces such as glass lites and solar panels.

The tool measures and provides real-time feedback for process control of color and reflectance, which is essential to yield and quality. The kSA RCM consists of an optics head attached to a dual linear-stage system to scan the panel or lite. It sends a beam of light incident to the panel, and the spectrometer collects the reflected light. The k-Space software analyzes and stores the acquired data, measuring absolute spectral reflectance and Lab* color parameters. k-Space can integrate this technology into an existing QC system, PLCs, or factory database.

“What makes our industrial metrology product line unique is our ability to customize the technology and integrate it into our customers’ existing systems. k-Space is known for working closely with our customers to learn their needs and then designing systems that fulfill their specific requirements. Each piece of equipment that we install at an industrial customer site is unique to their facility and their specific applications. We have received a lot of positive feedback from our customers, and they have told us they value our ability to incorporate our tools into their existing equipment and QC systems, PLCs, etc.,” stated Darryl Barlett, CEO of k-Space.

For more information about the kSA RCM, visit our website at

About k-Space Associates, Inc.

k-Space Associates, Inc. ( is a leading supplier of advanced metrology instrumentation and software used in research and production facilities around the world. Founded in 1992, its metrology systems use innovative non-contact optical methods to monitor reflectance, color, layer thickness, resistance, surface defects, and more in manufacturing settings to provide inspection and process control capabilities. k-Space integrates its tools into existing QC systems and PLCs, based on customer needs. Through extensive customer input, close collaboration with its worldwide customer base, and a strong commitment to unparalleled technical support, k-Space has developed today’s most powerful industrial metrology tools.

Kathy Wheeler
k-Space Associates,Inc.

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