Microscopes enable in-plane anisotropic materials analysis.
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Press Release Summary:
MultiMode® and Dimension(TM) scanning probe microscopes use Torsional Resonance Mode(TM) (TRmode(TM)), which measures tip-sample interactions through torsional resonance of microscope cantilever to provide lateral characterization of sample surfaces. TRmode can be used in conjunction with TappingMode(TM), offering researchers complementary lateral and vertical data for virtually every SPM application. TRmode suits nanotechnology applications such as nanotribology, magnetic properties, and polymers studies.
Original Press Release:
Veeco Introduces New Scanning Technique for SPMs; New Imaging Mode Enables Better Materials Analysis
Santa Barbara, CA, June 2, 2003 - Veeco Instruments has announced the release of a new scanning technique, Torsional Resonance Mode (TRmode(TM)), for their Digital Instruments MultiMode® and Dimension(TM) scanning probe microscopes (SPMs). TRmode measures tip-sample interactions through torsional resonance of the SPM cantilever to provide superior lateral characterization of sample surfaces. Enabling in-plane anisotropic materials investigation, TRmode is ideal for nanotechnology applications such as nanotribology, magnetic properties, and polymers studies. In addition, its ability to be used in conjunction with TappingMode(TM) offers researchers complementary lateral and vertical data for virtually every SPM application.
"TRmode has the potential to significantly expand the applications of atomic force microscopy," explains Ken Babcock, VP and General Manager at Veeco Instruments. "This mode reveals dynamic lateral characteristics of surface structures, which enables more detailed examination of material properties and provides unique information about nanoscale surface interactions. TRmode also permits faster scanning and provides enhanced sensitivity for PhaseImaging(TM) applications. But perhaps the most exciting aspect of this technique is its ability to be used side-by-side with TappingMode imaging. Researchers can now achieve nondestructive characterization of in-plane and morphological properties at the nanoscale."
Veeco engineers were the first to design and produce commercial SPM systems, and were responsible for creating and implementing such revolutionary advances as TappingMode and PhaseImaging(TM). Veeco's commitment to research and development is a primary reason that they have been able to consistently bring innovative metrology technology to the research community. TRmode, which is only available from Veeco, is another testament to their dedication to the future of nanoscience.
Veeco Instruments Inc. provides solutions for nanoscale applications in the worldwide semiconductor, data storage, telecommunications/wireless, and scientific research markets. Our metrology products are used to measure at the nanoscale, and our Process Equipment tools help create nanoscale devices. Veeco's manufacturing and engineering facilities are located in New York, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific. Additional information on Veeco can be found at http://www.veeco.com/.
TRmode patent pending
