Edax Inc.
Mahwah, NJ 07430
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New OIM Matrix Software Package from EDAX is Used to Analyze EBSD Data
Allows users to simulate EBSD patterns based on the physics of dynamical diffraction of electrons. Can be used to create a library of EBSD patterns for all crystallographic orientations for a given material. Capabilities include dynamic diffraction-based Electron Backscatter Diffraction (EBSD) pattern simulations and dictionary indexing.
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New OIM Matrix Software Package from EDAX is Used to Analyze EBSD Data
Allows users to simulate EBSD patterns based on the physics of dynamical diffraction of electrons. Can be used to create a library of EBSD patterns for all crystallographic orientations for a given material. Capabilities include dynamic diffraction-based Electron Backscatter Diffraction (EBSD) pattern simulations and dictionary indexing.
Read More »
Edax Introduces Detector Providing Analysis Solution for all TEM Applications
Fast Silicon Drift Detectors with 70 mm2 and 160 mm2 options. Windowless detectors designed specifically not to require the typical protective window in front of the module. Design improves the light element sensitivity of the detector.
Read More »
Edax Introduces Detector Providing Analysis Solution for all TEM Applications
Fast Silicon Drift Detectors with 70 mm2 and 160 mm2 options. Windowless detectors designed specifically not to require the typical protective window in front of the module. Design improves the light element sensitivity of the detector.
Read More »
EDAX Offers Range of Technologies and Tools for Photovoltaic Applications
MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, offers a range of tools and technologies used in chemical characterization of photovoltaic materials. Measuring the composition of elements helps determine device performance. In addition, the distribution of specific elements can provide valuable information into grain boundary performance and...
Read More »
EDAX Offers Range of Technologies and Tools for Photovoltaic Applications
MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, offers a range of tools and technologies used in chemical characterization of photovoltaic materials. Measuring the composition of elements helps determine device performance. In addition, the distribution of specific elements can provide valuable information into grain boundary performance and...
Read More »
Sorensen SG Series Now Expanded to Include 800VDC Model
SAN DIEGO, CA, U.S.A. -The Sorensen SG Series of programmable power supplies has been expanded to include a 0-800Vdc offering. This product is targeted to meet the emerging higher voltage requirements of the hybrid vehicle component and PV inverter test markets. The SG is available with 5kW, 10kW or 15kW in a 3Uchassis. Higher power systems can be easily configured via the SG series user friendly...
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Sorensen SG Series Now Expanded to Include 800VDC Model
SAN DIEGO, CA, U.S.A. -The Sorensen SG Series of programmable power supplies has been expanded to include a 0-800Vdc offering. This product is targeted to meet the emerging higher voltage requirements of the hybrid vehicle component and PV inverter test markets. The SG is available with 5kW, 10kW or 15kW in a 3Uchassis. Higher power systems can be easily configured via the SG series user friendly...
Read More »XRF Spectrometer features motorized turret.
Available with mono-capillary optics or as a PC with high-intensity poly-capillary optic, Orbis micro-XRF elemental analyzer incorporates motorized turret that integrates video and x-ray optics for coaxial sample view and x-ray analysis over rough sample topography without sacrificing signal intensity. Users can make elemental analyses on small samples such as particles, fragments, and...
Read More »XRF Spectrometer features motorized turret.
Available with mono-capillary optics or as a PC with high-intensity poly-capillary optic, Orbis micro-XRF elemental analyzer incorporates motorized turret that integrates video and x-ray optics for coaxial sample view and x-ray analysis over rough sample topography without sacrificing signal intensity. Users can make elemental analyses on small samples such as particles, fragments, and...
Read More »EDAX Announces Sales Agreement with Angstrom Scientific
Mahwah, NJ, April 8, 2020 – EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has signed a distributor agreement with Angstrom Scientific. The agreement allows Angstrom Scientific to sell all EDAX products in the United States. “We are excited to welcome Angstrom Scientific to the EDAX sales team,” said EDAX U.S. Sales Manager, Roger Kerstin. “With over...
Read More »EDAX Announces Sales Agreement with Angstrom Scientific
Mahwah, NJ, April 8, 2020 – EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has signed a distributor agreement with Angstrom Scientific. The agreement allows Angstrom Scientific to sell all EDAX products in the United States. “We are excited to welcome Angstrom Scientific to the EDAX sales team,” said EDAX U.S. Sales Manager, Roger Kerstin. “With over...
Read More »
New OIM Matrix Software Package from EDAX is Used to Analyze EBSD Data
Allows users to simulate EBSD patterns based on the physics of dynamical diffraction of electrons. Can be used to create a library of EBSD patterns for all crystallographic orientations for a given material. Capabilities include dynamic diffraction-based Electron Backscatter Diffraction (EBSD) pattern simulations and dictionary indexing.
Read More »
New OIM Matrix Software Package from EDAX is Used to Analyze EBSD Data
Allows users to simulate EBSD patterns based on the physics of dynamical diffraction of electrons. Can be used to create a library of EBSD patterns for all crystallographic orientations for a given material. Capabilities include dynamic diffraction-based Electron Backscatter Diffraction (EBSD) pattern simulations and dictionary indexing.
Read More »
Edax Introduces Detector Providing Analysis Solution for all TEM Applications
Fast Silicon Drift Detectors with 70 mm2 and 160 mm2 options. Windowless detectors designed specifically not to require the typical protective window in front of the module. Design improves the light element sensitivity of the detector.
Read More »
Edax Introduces Detector Providing Analysis Solution for all TEM Applications
Fast Silicon Drift Detectors with 70 mm2 and 160 mm2 options. Windowless detectors designed specifically not to require the typical protective window in front of the module. Design improves the light element sensitivity of the detector.
Read More »Covalent Metrology Announces Collaboration with EDAX, Inc.
Mahwah, NJ, and Sunnyvale, CA, September 18, 2018 – Covalent Metrology, an innovative, new analytical service lab based in Silicon Valley, announced today that it will collaborate with EDAX, Inc., a business unit of AMETEK, Inc., on the application of energy dispersive spectroscopy (EDS) for the quantified characterization of a wide variety of materials. Covalent undertook an extensive...
Read More »Covalent Metrology Announces Collaboration with EDAX, Inc.
Mahwah, NJ, and Sunnyvale, CA, September 18, 2018 – Covalent Metrology, an innovative, new analytical service lab based in Silicon Valley, announced today that it will collaborate with EDAX, Inc., a business unit of AMETEK, Inc., on the application of energy dispersive spectroscopy (EDS) for the quantified characterization of a wide variety of materials. Covalent undertook an extensive...
Read More »
EDAX Offers Range of Technologies and Tools for Photovoltaic Applications
MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, offers a range of tools and technologies used in chemical characterization of photovoltaic materials. Measuring the composition of elements helps determine device performance. In addition, the distribution of specific elements can provide valuable information into grain boundary performance and...
Read More »
EDAX Offers Range of Technologies and Tools for Photovoltaic Applications
MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, offers a range of tools and technologies used in chemical characterization of photovoltaic materials. Measuring the composition of elements helps determine device performance. In addition, the distribution of specific elements can provide valuable information into grain boundary performance and...
Read More »