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Charles W. Briggs Award presented to ASTM Committee member.
Press Release Summary:
Feb 22, 2011 - Dr. Clifford Bueno, senior scientist at GE Global Research Center in Niskayuna, NY, received Charles W. Briggs Award from ASTM Committee E07 on Nondestructive Testing. As member of ASTM International and Committee E07 since 2001, Bueno has served as section chairman for non-film radiology within Subcommittee E07.01 on Radiology Method as well as contributed to development of new and revised E07 standards. Committee has recognized Bueno's work with 4 certificates of appreciation.
Original Press Release
ASTM International Nondestructive Testing Committee Presents Charles W. Briggs Award to Dr. Clifford Bueno
Press release date: Feb 18, 2011
Bueno has been a member of ASTM International and Committee E07 since 2001. He has served as a section chairman for non-film radiology within Subcommittee E07.01 on Radiology (X and Gamma) Method, and has contributed to the development of several new and revised E07 standards. The committee has recognized his work with four certificates of appreciation.
A graduate of York College, a senior college of the City University of New York, Jamaica, N.Y., where he earned a bachelor's degree in chemistry, Bueno received his Ph.D. in chemistry from the State University of New York, Buffalo, N.Y., in 1982. After completing his Ph.D., he worked as a postdoctoral fellow at the Pittsburgh Energy Technology Center in Pittsburgh, Pa, from 1982 to 1984. He then held scientist positions at GTE Sylvania in Towanda, Pa., and Lockheed Martin Research Labs in Palo Alto, Calif., before assuming his role at GE in 1997.
Bueno's work focuses on the design of digital x-ray imaging systems to perform radiography and computed tomography for industrial inspection and homeland security applications. In addition to ASTM International, he is a member of the American Society for Nondestructive Testing.
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