Association News

ASTM Committee presents Award of Merit to Joseph Geller.

Press Release Summary:

Nov 13, 2015 - ASTM International Committee E42 on Surface Analysis has presented the Award of Merit to Joseph Geller, president of Geller MicroAnalytical Laboratory Inc. in Topsfield, MA. An ASTM member since 1981, Geller is a member at large on the E42 Executive Subcommittee and has served in various leadership roles. He was manager of the Surface Analysis, Electron Microprobe Laboratory Systems Group at JEOL USA Inc. in Peabody, MA, before founding Geller MicroAnalytical Laboratory in 1985.

ASTM International - West Conshohocken, PA

Original Press Release

ASTM International Committee on Surface Analysis Presents Award of Merit to Joseph Geller

Press release date: Oct 28, 2015

ASTM International Committee E42 on Surface Analysis has presented the Award of Merit to Joseph Geller, president of Geller MicroAnalytical Laboratory Inc. in Topsfield, Massachusetts.

The prestigious Award of Merit includes the accompanying title of fellow and is ASTM’s highest organizational recognition for individual contributions to standards activities. Committee E42 noted Geller’s exceptional service to ASTM and to the international surface analysis community.

An ASTM member since 1981, Geller is a member at large on the E42 Executive Subcommittee. He has served in various leadership roles on the committee, including vice chairman, and has been a pioneer in the development of calibration standards for surface analysis. He was chairman of Subcommittee E42.93 from 2001 to 2013, and served as the U.S. delegate leader to the International Organization for Standardization TC201 on Surface Chemical Analysis for 15 years. Geller received a 30-Year Service Award from E42 in 2013. He also works on Committees E04 on Metallography and F01 on Electronics.

Geller was manager of the Surface Analysis, Electron Microprobe Laboratory Systems Group at JEOL USA Inc. in Peabody, Massachusetts, before founding Geller MicroAnalytical Laboratory in 1985. The company provides analytical services using scanning electron microscopy, electron microprobe and surface analysis. He holds a bachelor’s degree in photographic science and engineering from the Rochester Institute of Technology and an MBA from Salem State University.

A fellow of the American Vacuum Society, Geller is also associate editor of the AVS journal Surface Science Spectra. He is a member of the American Ceramics Society, the International Organization for Standardization, the Microbeam Analysis Society, the Microscopy Society of America, the Mining and Metallurgical Society of America, and the Society of Photographic Instrumentation Engineers in addition to ASTM.

ASTM PR Contact: Erin K. Brennan, tel: +1.610.832.9602; ebrennan@astm.org