Hyphenated-Systems, LLC
Burlingame, CA 94010
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Automated Optical Profiler enables non-destructive analysis.
NanoScale(TM) HS200A(TM) acquires images that slice through sample at varying heights, then combines images into 3D model. Advanced confocal microscopy enables it to collect data simultaneously via multiple confocal apertures, accelerating data acquisition process and allowing it to construct and display 3D images in seconds. System is suited for 3D imaging and metrology of rough or sloped...
Read More »Hyphenated Systems and Stanford Microfluidics Laboratory Announce Joint Development Project
Hyphenated Systems' 3Dmap to Provide Sub-Surface 3D Structure Characterization and Flow Analysis of Advanced Microfluidic Devices Burlingame, CA, August 14, 2006-Hyphenated Systems, a world-wide provider of hybrid microscopy solutions for three-dimensional (3D) imaging and metrology in micro- and nanotechnology, announced today a joint development project (JDP) with the Stanford Microfluidics...
Read More »Automated Optical Profiler enables non-destructive analysis.
NanoScale(TM) HS200A(TM) acquires images that slice through sample at varying heights, then combines images into 3D model. Advanced confocal microscopy enables it to collect data simultaneously via multiple confocal apertures, accelerating data acquisition process and allowing it to construct and display 3D images in seconds. System is suited for 3D imaging and metrology of rough or sloped...
Read More »Hyphenated Systems and Stanford Microfluidics Laboratory Announce Joint Development Project
Hyphenated Systems' 3Dmap to Provide Sub-Surface 3D Structure Characterization and Flow Analysis of Advanced Microfluidic Devices Burlingame, CA, August 14, 2006-Hyphenated Systems, a world-wide provider of hybrid microscopy solutions for three-dimensional (3D) imaging and metrology in micro- and nanotechnology, announced today a joint development project (JDP) with the Stanford Microfluidics...
Read More »