Nextest Systems Corp.
San Jose, CA 95138
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Nextest Showcases a Range of Test Solutions at SEMICON/West 2007
Nextest Showcases a Range of Test Solutions at SEMICON/West 2007 SAN FRANCISCO, July 16 // -- Nextest Systems Corporation (NASDAQ:NEXT), a leading manufacturer of automatic test equipment (ATE) for cost-sensitive semiconductors, announced that it will exhibit a wide range of test solutions at SEMICON/West this year. The conference is being held at the Moscone West Convention Center in San...
Read More »Nextest Showcases a Wide Range of Cost-Effective Test Solutions at SEMICON/Japan
Recently introduced, the Magnum Grande and Magnum iCP provide semiconductor manufacturers with massively parallel test solutions for the high-volume consumer digital appliance market. TOKYO, Dec. 4 // -- Nextest Systems Corporation (NASDAQ:NEXT), a leading manufacturer of automatic test equipment (ATE) for cost-sensitive semiconductors, announced that it will exhibit a wide range of test...
Read More »Test Equipment targets CMOS image sensor device market.
Featuring AITOS ATS1240 illuminator and Semics Opus II wafer probing system, Magnum iCP(TM) enables users to test up to forty 256 megapixel CMOS image sensor devices in parallel, with each device having its own image processor. Integrating logic test capability with optimized image capture and analysis hardware, system captures pixel data at 100 MHz with 14 bits per pixel and store up to 64 image...
Read More »Semiconductor Test Equipment is suited for parallel testing.
Magnum Grande, integrated with TechWing TW-380 handler, is capable of testing 720 NAND Flash devices at one time. Providing IC manufacturers with up to 7,680 I/O pins and 960 sites in single test head, 12-chassis system is built from set of Site Assemblies, that contain data generation, error processing, timing, and dc resources needed to test devices including NAND and NOR Flash memories. Each...
Read More »Nextest Announces Live Webcast of Upcoming Investor Conference
SAN JOSE, Calif., Sept. 5 -- Nextest Systems Corporation (NASDAQ:NEXT) today announced that it will present at the 4th annual Merriman Curhan Ford & Co. Investor Summit on Monday, September 17 at 10:15 a.m. PT. This event will be held at the Mark Hopkins InterContinental Hotel in San Francisco. o The 4th annual Merriman Curhan Ford & Co. Investor Summit Mark Hopkins InterContinental Hotel in San...
Read More »Nextest Showcases a Range of Test Solutions at SEMICON/West 2007
Nextest Showcases a Range of Test Solutions at SEMICON/West 2007 SAN FRANCISCO, July 16 // -- Nextest Systems Corporation (NASDAQ:NEXT), a leading manufacturer of automatic test equipment (ATE) for cost-sensitive semiconductors, announced that it will exhibit a wide range of test solutions at SEMICON/West this year. The conference is being held at the Moscone West Convention Center in San...
Read More »Nextest Showcases a Wide Range of Cost-Effective Test Solutions at SEMICON/Japan
Recently introduced, the Magnum Grande and Magnum iCP provide semiconductor manufacturers with massively parallel test solutions for the high-volume consumer digital appliance market. TOKYO, Dec. 4 // -- Nextest Systems Corporation (NASDAQ:NEXT), a leading manufacturer of automatic test equipment (ATE) for cost-sensitive semiconductors, announced that it will exhibit a wide range of test...
Read More »Test Equipment targets CMOS image sensor device market.
Featuring AITOS ATS1240 illuminator and Semics Opus II wafer probing system, Magnum iCP(TM) enables users to test up to forty 256 megapixel CMOS image sensor devices in parallel, with each device having its own image processor. Integrating logic test capability with optimized image capture and analysis hardware, system captures pixel data at 100 MHz with 14 bits per pixel and store up to 64 image...
Read More »Semiconductor Test Equipment is suited for parallel testing.
Magnum Grande, integrated with TechWing TW-380 handler, is capable of testing 720 NAND Flash devices at one time. Providing IC manufacturers with up to 7,680 I/O pins and 960 sites in single test head, 12-chassis system is built from set of Site Assemblies, that contain data generation, error processing, timing, and dc resources needed to test devices including NAND and NOR Flash memories. Each...
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