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Test & Measuring Instruments ->
Test & Measurement Accessories ->
Test Fixtures
Test Fixtures
(Showing headlines 21 - 31) 1 2
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 Center Probe Test Socket has floating guide plate.Aries Electronics, Inc.
Bristol, PA 19007-6810
Aug 18, 2003
Machined from Torlon 4203 or 5530, RF center probe socket features floating guide plate with built-in hard stop. Product can be used for packages with 0.50 mm pitch or higher for devices up to 55 mm wide in applications with speeds from 1-10+ GHz. Decoupling pockets can be placed within 1.0 mm of product's solderless, pressure-mount, compression spring probes. Contacts have cycle life of over 500,000 and can handle up to 2 A continuous current.
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 Test/Burn-In Socket accommodates devices up to 13 mm².Aries Electronics, Inc.
Bristol, PA 19007-6810
Jul 14, 2003
Type BGA/CSP test and burn-in socket handles devices with pitch from 0.50 mm or larger in applications up to 1 GHz. Solderless, pressure-mount, compression spring probes are located by 2 molded plastic alignment pins and secured with 4 stainless steel screws. Socket accommodates up to 500,000 cycles. Spring probe contacts are 9-12 g per contact for 0.50-0.75 mm pitches, and 17-20 g per contact for 0.80 mm pitches and larger. Socket operating temperature is -67 to 302°F.
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 RF Test Sockets feature conduction-cooled system.Aries Electronics, Inc.
Bristol, PA 19007-6810
Jan 10, 2003
Interposer, Spring Probe, and Microstrip Contact(TM) test sockets are 63.5 x 63.5 x 88.9 mm and can be used in packages up to 27 x 27 mm. They include built-in thermistor and copper heat sink with integrated fan assembly. Conduction-cooling system makes sockets suitable for BGA, LGA, and CSP package designs used in high-powered devices. Temperature range with thermoelectric cooling is 5-194°F, with max differential temperature of 158°F.
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 Test Socket handles device types up to 27 mm.Aries Electronics, Inc.
Bristol, PA 19007-6810
Aug 14, 2002
Integra 27 has molded PPS plastic components designed to minimize space without sacrificing repeatability and durability. Device-specific spring probe insert can be machined to match testing needs. Socket's contacts are IDI spring probes, some which are electrically characterized to 10 GHz. Contacts are durable enough to handle burn-in and HAST testing. User replaceable contacts have current capacity of 3-6 A per and durability of 500,000 actuations.
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 Test Socket withstands rigors of burn-in and HAST testing.Synergetix
Kansas City, KS 66106
Jun 26, 2002 Integra 27 has molded frame with custom-designed interposer insert and integral clamshell lid. Insert is loaded with spring-contact probes that offer insertion life of 500,000 cycles, inductance as low as 0.33 nH, and bandwidths well over 10 GHz. Socket is made of PPS with beryllium copper or nickel silver contacts. Temperature rating is -55 to +150°C. |
 Test Socket has probe self-inductance as low as 0.5 nH.Aries Electronics, Inc.
Bristol, PA 19007-6810
May 28, 2002
High frequency test socket has replaceable spring probe interposer, which enables users to accommodate two separate interposers with same base socket. Features include solderless, single-ended spring probes; four locating posts; and hinged lid, double-latched lid, or CAM-style lid options. Pitches are available from 0.5 to 0.8 mm, signal path lengths are 0.095 in., and contact resistance is less than 60 milliohms after 500,000 life cycles.
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 Test Socket eliminates co-planarity problems.Andon Electronics Corp
Lincoln, RI 02865
May 20, 2002 BGA test socket has guided contact plunger that makes contact on periphery of solder ball, and maintains perpendicularity. Tapered cup design makes contact on angle and does not touch spherical radius of solder ball on bottom. Device features Rollerball(R) SMT technology and is available with solder tails for through-hole mounting. It is also available in 1.27, 1, 0.8, and 0.75 mm pitches. |
 Socket suits BGA/CSP testing.Aries Electronics, Inc.
Bristol, PA 19007-6810
May 08, 2002
Interposer socket provides signal paths from 0.008 to 0.015 in. Able to work above 10 GHz, Interposer's contact system has dielectric material with etched pads on top and bottom. Socket offers pressure mount plunge-to-board interposer and pitches down to 0.3 mm. Contacts have self-inductance of 0.1 nH and resistance of less than 20 milliohms. Required contact force is 15 and 28 g (minimum) per contact for manual and automated applications, respectively.
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 Test Sockets are designed for high temperatures.Aries Electronics, Inc.
Bristol, PA 19007-6810
Jan 17, 2002
DIP Test Sockets, for 350°C and 500°C applications, have high temperature ceramic body and high conductivity stainless steel contacts. Normally closed contacts provide twin beam wiping action. They are plated with 50µ in. gold over 50µ in. nickel. Sockets accept .300 in. center to .600 in. center row-row devices, up to 28 positions with leads on .100 in. pitch. They are offered in through-hole or surface mount versions.
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 RF Test Sockets keep the pressure on.Aries Electronics, Inc.
Bristol, PA 19007-6810
Dec 05, 2001
Spring-loaded lids on radio frequency (RF) test sockets provide consistent lead pressure. Precise pressure requirements can be met with mix-and-match springs from 1/2 to 25 lbs. Each socket comes with floating leadbacker built into every lid, and lids can be used throughout RF/microwave, automated handling and burn-in/life testing applications. Each socket has Microstrip Contacts, which can be used for any pitch device up to 208 leads.
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 Test Sockets have contact force of 30 g.Aries Electronics, Inc.
Bristol, PA 19007-6810
Nov 28, 2001
RF high-frequency CSP/BGA test sockets have spring probe contacts that provide 500,000+ insertion/withdrawal cycles with no loss of contact force or increase in contact resistance. Sockets offer short signal paths of 0.098 in. for 1.00 mm and 1.27 mm pitch packages. Self-inductance of sockets is 0.62 nH and contact resistance is 30m Ohms after 500,000 cycles. Propagation delay is 45 psec and capacitance is 0.45 pF.
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