Production Contacts come in non-plated homogenous material.

Press Release Summary:




Supplied in .4 mm and .5 mm sizes, ZIP® Z0 and Z1 contacts are available with HyperCore™ non-plated homogenous base material specifically designed for use in semiconductor testing. Conductive material possesses properties that prevent oxidation, ensuring optimum performance throughout high-volume production cycles. With 600+ Knoop hardness, material is inert to common wear related to contacting tough device surfaces and cleaning processes.



Original Press Release:



ECT Offers ZIP® Z0 and Z1 Contacts in HyperCoreTM Base Material



Pomona, Calif. — Everett Charles Technologies (ECT) announced today that the .4mm and .5mm ZIP® Z0 and Z1 performance production contacts are now available in the high-performance HyperCore™ base material.



HyperCore™ is a non-plated homogenous material specifically designed for use in semiconductor test. The proprietary material possesses properties that prevent oxidation, ensuring premium performance throughout high-volume production cycles. With its 600+ Knoop hardness, it is inert to common wear related to contacting tough device surfaces and cleaning processes.



Additionally, HyperCore™ is very conductive. Its electrical specifications are virtually unchanged when compared to gold-plated BeCu yielding premium performance even in the most severe environments.



HyperCore™ plungers are exclusively available on ECT’s high performance ZIP® Z0 and Z1 family of contacts.



Everett Charles Technologies is a leading manufacturer of electrical test products and services, including Pogo test contacts, semiconductor test products, bare-board automatic test systems, and bare and loaded PCB test fixtures.  Additional information about ECT is available via the Internet at www.ectinfo.com.

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