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HD Imaging Microscope achieves resolutions down to 1 nm.

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HD Imaging Microscope achieves resolutions down to 1 nm.
HD Imaging Microscope achieves resolutions down to 1 nm.
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August 14, 2012 - With its electronics, detectors, and chamber design, SIGMA HD Field Emission Scanning Electron Microscope (FE-SEM) accelerates imaging and facilitates sample navigation for nanoscale analytics. High vacuum and variable pressure modes of operation are available, and 5-axis eucentric stage aids sample navigation using translational and tilted movement. Also included, diametrically opposite chamber ports facilitate mounting of 2 energy dispersive X-ray spectroscopy detectors.

Carl Zeiss Reveals High Definition FE-SEM SIGMA HD


(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)

Carl Zeiss Jena GmbH Zeiss Gruppe Mikroskopie
.
Germany



Press release date: July 30, 2012

Phoenix, Arizona, USA / Jena, Germany The High Definition Field Emission Scanning Electron Microscope (FE-SEM) SIGMA HD has been revealed at the Microscopy & Microanalysis conference 2012 in Phoenix, Arizona by Carl Zeiss Microscopy. SIGMA HD offers customers high resolution, fast imaging and easy sample navigation for nanoscale analytics in addition to the performance of the established SIGMA series.

SIGMA HD has been introduced to the SIGMA series as part of an expansion of the company's FE-SEM portfolio. It incorporates advances in electronics, detectors and chamber design for imaging resolution as small as one nanometer. It is available in both high vacuum and variable pressure modes of operation. Finally, a 5-axis eucentric stage makes navigation around even large samples easy using both translational and tilted movement.

SIGMA HD offers unlimited analytical options through diametrically opposite chamber ports that facilitate the mounting of two energy dispersive X-ray spectroscopy (EDS) detectors for maximum solid angle detection. In the instance of beam sensitive samples, this permits low probe currents to be used whilst maintaining high X-ray count rates. The favorable geometry afforded by the chamber design eliminates X-ray shadowing effects.

Product Manager for the SIGMA series at Carl Zeiss, Dr. Ben Tordoff, commented: "Many customers have told us that there's a need for combining analytical flexibility and advanced imaging performance. SIGMA HD is an important addition to the portfolio providing exactly these benefits for many customers."

For more information, please visit www.zeiss.com/sigma

About Carl Zeiss Carl Zeiss Microscopy, LLC, offers microscopy solutions and systems for research, routine, and industrial applications. In addition, Carl Zeiss Microscopy markets microscopy systems for the clinical market, as well as optical sensor systems for industrial and pharmaceutical applications. Since 1846, Carl Zeiss has remained committed to enabling science and technology to go beyond what man can see. Today, Carl Zeiss is a global leader in the optical and opto-electronic industries. With 12,872 current employees and offices in over 30 countries, Carl Zeiss is represented in more than 100 countries with production centers in Europe, North America, Central America and Asia. For more information on the breadth of solutions offered by Carl Zeiss Microscopy, please visit www.zeiss.com/micro.

Please forward all Sales Inquiries to: Maya Everett, Carl Zeiss Microscopy, (914) 681-7782, meverett@zeiss.com
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