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Teledyne LeCroy Demonstrates Latest Test Technology for Embedded Systems Development at EE Live 2014

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Teledyne LeCroy Corporation
700 Chestnut Ridge Road
Chestnut Ridge, NY, 10977
USA



Press release date: April 1, 2014

CHESTNUT RIDGE, N.Y. and SAN JOSE, Calif.— Increasingly complex embedded systems, using higher-speed serial data busses, make signal integrity issues and higher-bandwidth oscilloscopes newly relevant to the embedded market. The Teledyne LeCroy oscilloscopes, protocol analyzers, logic analyzers, waveform generators, and test solutions showcased at the EE Live 2014 exhibition in San Jose provide the performance and feature sets necessary for complex embedded system development. EE Live attendees can visit booth 722 today through April 3 for demonstrations of 20+ serial decoders and triggers; advanced debug tools; protocol analysis and test for USB, DDR, and PCI Express.

Attendees will experience the revolutionary 12-bit HDO-MS high-definition mixed-signal oscilloscopes, which sport powerful mixed-signal debug capabilities for embedded systems development. HDO-MS oscilloscopes combine 16 channels of flexible mixed-signal capabilities with HD4096 high definition technology, long memory, and a compact form factor, in bandwidths from 200 MHz to 1 GHz. Spectrum-analysis and power-measurement software packages extend the oscilloscopes' capabilities while leveraging the 12-bit architecture with its wider dynamic range and improved measurement precision.

Featured demonstrations include higher bandwidth oscilloscopes with a targeted set of digital debug tools. Analog and digital cross pattern triggering, digital timing measurements, parallel pattern search, logic gate emulation and activity indicators are the ideal tools for precise circuit validation and fast debugging of complex embedded designs. These features complement a comprehensive toolset, which includes WaveScan search and find, history-mode waveform playback, sequence acquisition mode, and LabNotebook report generation.

The newly introduced portable Eclipse X34 MIPI M-PHY Protocol Analyzer for testing mobile computing products is part of the exhibition. Attendees can also learn more about Teledyne LeCroy InSight technology, an innovative approach to the validation and debug of SoC designs in a post-silicon environment where visibility has diminished and complexity has increased.

About Teledyne LeCroy
Teledyne LeCroy is a leading manufacturer of advanced test instruments that measure, analyze, and verify complex electronic signals. The Company offers high-performance oscilloscopes and protocol test solutions used by electronic design engineers in a wide range of application and end markets. Teledyne LeCroy is based in Chestnut Ridge, NY. For more information, visit Teledyne LeCroy's website at teledynelecroy.com.

2014 by Teledyne LeCroy. All rights reserved. Specifications are subject to change without notice.

Media contact:
Kathy Woods
Communication Manager
(845) 578-4455

Customer contact:
Teledyne LeCroy Customer Care Center
(800) 553-2769

Website:teledynelecroy.com

Source
Teledyne LeCroy

Web Site: http://teledynelecroy.com


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