Creep-Fatigue Symposium explores test methods, models.August 9, 2010 -
November 17-19, 2010 in San Antonio, TX, Creep-Fatigue Interactions: Test Methods and Models symposium will address research concerning creep-fatigue crack formation and crack growth in high-temperature materials and structures. Papers on recent developments in experimental techniques, models for representing data, and applications of data will be presented in single session format. Presentations will include 6 plenary lectures, 4 invited keynote lectures, and contributed papers.
ASTM International Symposium on Creep-Fatigue Interactions: Test Methods and Models
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100 Barr Harbor Dr., Box C700
West Conshohocken, PA, 19428-2959
Press release date: August 5, 2010
W. CONSHOHOCKEN, Pa.-ASTM International is sponsoring a symposium on Creep-Fatigue Interactions: Test Methods and Models, to be held Nov. 17-19, 2010, at the Grand Hyatt San Antonio in San Antonio, Texas. Sponsored by ASTM Committee E08 on Fatigue and Fracture in cooperation with ICF and EPRI, the symposium is being held in conjunction with the Nov. 15-18 standards development meetings of the committee.
The symposium will address the latest research in the area of creep-fatigue crack formation and crack growth in high temperature materials and structures. Presentations on all aspects of research in the area of creep-fatigue interactions are planned. Thirty-four papers on recent developments in experimental techniques, models for representing the data, and applications of the data will be presented in a single session format over the two-and-half days. The presentations will include six plenary lectures, four invited keynote lectures and contributed papers.
Online registration opens approximately eight weeks before the symposium and will close Nov. 10. The fee for ASTM members, presenters and session chairs is $240 USD for online registration and $265 USD for on-site registration. The fee for non-ASTM members is $315 USD online and $340 USD on site. The fee is waived for students with a valid I.D. For more information, visit http://www.astm.org/E08symp1110_1.htm.
Additional technical information is available from symposium co-chairs Ashok Saxena, Ph.D., University of Arkansas, Fayetteville, Ark. (phone: 479-575-3054; firstname.lastname@example.org); or Bilal Dogan, Ph.D., EPRI, Charlotte, N.C. (phone: 704-595-2650; email@example.com).
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