Thermo Fisher Scientific
Madison, WI 53711
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X-Ray Fluorescence System measures metal film thickness.
MicroXR(TM) uses combination of microbeam X-ray collimation technology and energy dispersive spectroscopy to measure thickness and composition of up to 5 layers of deposited metals simultaneously. It can also determine bulk alloy composition for up to 20 elements. Available in benchtop, console, and automated configurations, system is suited for on-line and near-line measurements on semiconductor...
Read More »Thermo Wins Omega Award for Service Excellence for Second Consecutive Year
MADISON, WI (September 20, 2006) -Thermo Electron Corporation, world leader in analytical instrumentation was recently awarded the NorthFace ScoreBoard Award, for a second consecutive year, in recognition for providing Excellence in Customer Service to its customers. The award presented to Thermo included two categories: Installation Service Representative and Field Service Engineer. The award...
Read More »Thermo Announces Major Laboratory Informatics Conference
Philadelphia, PA, (August 25, 2006): Thermo Electron Corporation, world leader in analytical instrumentation and informatics, has scheduled its annual software user group meeting and laboratory informatics conference. Thermo Informatics World (TIW) 2006 North America, will take place October 23-27, 2006, at the San Diego Sheraton in San Diego, California. TIW Europe will be held November 6-10,...
Read More »
X-Ray Fluorescence System measures metal film thickness.
MicroXR(TM) uses combination of microbeam X-ray collimation technology and energy dispersive spectroscopy to measure thickness and composition of up to 5 layers of deposited metals simultaneously. It can also determine bulk alloy composition for up to 20 elements. Available in benchtop, console, and automated configurations, system is suited for on-line and near-line measurements on semiconductor...
Read More »