XRF Analyzer has 600 x 1,200 mm lateral xy measurement range.
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Press Release Summary:
Designed for in-line film composition and thickness control of CIGS and CdTe film stacks, SMX-ILH can measure rigid glass substrates as well as flexible stainless steel and polyimide roll-to-roll substrates. It provides process control of active, contact, and TCO layers and is capable of insertion into printed, electrochemical, and thermal deposited film processes. Optional proprietary Thermal shield allows for film control at panel temperatures of up to 300°C.
Original Press Release:
In-Line CIGS and CdTe PV Panel Film Composition and Thickness Measurement
HOLBROOK, NY, - November 2008- Solar Metrology, a global provider of X-Ray Fluorescence (XRF) analysis tools, Expands its SMX XRF tool portfolio for film composition and thickness measurement of CIGS and CdTe photovoltaic depositions with the addition of the ILH, in-line head SMX model.
The SMX-ILH is designed for in-line film composition and thickness control of CIGS and CdTe film stacks. The tool has a full 600 by 1200 mm lateral xy range of measurement and is designed for measurement of rigid glass substrates as well as flexible stainless steel and polyimide roll-to roll substrates. The ILH provides process control of active, contact and TCO layers and is capable of insertion into printed, electrochemical and thermal deposited film processes. The ILH tool has an optional proprietary Thermal shield that allows for film control at panel temperatures of up to 300 degrees Celsius.
Fast and repeatable Copper and Gallium ratio determination as well as cross web or cross panel gradient analysis allows for yield improvement and management and conversion efficiency gains in production.
Solar Metrology's SMX Measurement System provides a production-ready suite of film thickness and composition measurement tools for research and process development, in-process monitoring and post-process quality control.
Solar Metrology is the global leader in the development and manufacture of high-performance X-Ray Fluorescence (XRF) analysis tools, specifically engineered to meet the demanding thin film measurement requirements of the solar electric and renewable power industries.
Additional information on Solar Metrology can be found at www.solarmetrology.com
or info@solarmetrology.com
