Press Release Summary:
When used in phased array mode, portable Phasor XS offers up to 64 channels, and operator can electronically multiplex multi-element probe to achieve control over angle of inspection, amplitude, and depth-of-focus of each ultrasonic beam. Inspection image is presented as full color, sector B-scan on TFT screen, providing comprehensive data in real-time. In conventional mode, Phasor XS uses standard ultrasonic probes for traditional inspection, such as corrosion and thickness measurement.
Original Press Release:
Ultrasonic Phased Array Is Now Easy, Portable and Affordable With The New Phasor XS From GE
Huerth, Germany -December 6, 2006. The new Phasor XS from GE Inspection Technologies brings phased array flaw-imaging capability to everyday inspection in an easy-to-use, portable and affordable ultrasonic flaw detector, which will drastically reduce inspection times and improve probability of detection. It will find application throughout the industrial and process spectra, in aerospace, oil & gas, power generation, the automotive sector and general engineering, wherever there is a need for fast, accurate and reliable inspection of welds, pipework, pressure vessels or structural fabrications.
With its familiar operating platform and easy-to-understand, menu-driven inspection instructions, the new battery-powered instrument requires little operator training and is available at less than half the price of conventional phased array systems, bringing phased array technology to routine manual inspection.
When used in phased array mode, the instrument offers up to 64 individual channels and the operator can electronically multiplex a multi-element probe to achieve precise control over the angle of inspection, the amplitude and the depth of focus of each individual ultrasonic beam. The inspection image is presented as a full colour, sector B-scan on the unit's high resolution TFT screen, providing comprehensive data in real time. Any of the A-scans which make up the sector scan can be selected for separate display or for simultaneous display with the sector image to allow instant and reliable sizing. Sector images and A-scans can be stored on a removable SD card for off-line data analysis and management.
A wide range of array probes are compatible with the new flaw detector, including dialog probes, containing probe identification data which can be transmitted back to the instrument to ensure increased inspection reliability, minimise set-up errors and assist in probe operation calculations. In conventional mode, the Phasor XS can use standard ultrasonic probes to carry out conventional inspection, including corrosion and thickness measurement.
Ruggedly packaged and weighing less than 4 kg, the Phasor XS offers an ideal entry-level phased array solution to manual volumetric inspections in a wide range of applications. It is a logical progression of GE's field-proven, flaw detection product range, complementing GE products such as the conventional USM 35 portable flaw detector and the sophisticated IAS 50 field-deployable ultrasonic integrity assessment system, as well as existing phased array systems, which are widely used in the aerospace industry.
About GE Inspection Technologies
GE Inspection Technologies is a global leader in technology-driven inspection solutions that deliver productivity, quality and safety to our customers. The company designs, manufactures and services radiographic, ultrasonic, remote visual inspection and eddy current equipment to inspect, monitor and test materials and equipment without disassembly, deforming or damaging them. Its products are used in a wide range of industries, including Aerospace, Power Generation, Oil & Gas, Casting & Metals and Automotive. The company has 11 application centers around the globe and offers a range of services including repair, on-site RVI inspection services, calibration, training and upgrades. GE Inspection Technologies has 1,300 employees at more than 25 facilities in 25 countries worldwide. To learn more about GE Inspection Technologies visit http://www.ge.com/inspectiontechnologies.
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