Test System suits MEMS gyro production.

Press Release Summary:



High-volume, VXI-based M/STeP(TM) test system is based on company's MEMS/Sensor Test Platform. M/STeP(TM) provides both calibration and test of multi-axis MEMS gyros. Test system is suitable for automotive and commercial applications.



Original Press Release:



Etec Announces VXI based MEMS Gyro Production Test System



Peabody, MA: Etec, Inc. announced today the release of a high volume VXI based MEMS gyro calibration and test system. Based on Etec's powerful MEMS/Sensor Test Platform, M/STeP(TM), the system provides both calibration and test of multi-axis MEMS gyro's. "Commercialization of MEMS technology is starting to find more and more volume applications. With the increased use of MEMS rate and acceleration sensors in automotive and commercial applications, the cost of test will continue to be a critical component of the overall success of a product. We believe that this system, as well as our entire suite of MEMS test systems, provide the lowest cost test solution available on the market today" according to Mark Ford, Etec President and CEO. "For the last 8 years our dedication to developing MEMS calibration and test systems is helping our existing and future customers not only test with confidence, but has provided them a flexible and cost-effective approach to MEMS test", commented Henry J. Klim, Vice President.

ETEC has been providing instrumentation and equipment for volume production of MEMS devices since 1994. ETEC's unique scalable system architecture supports MEMS testing from development through production. The company is a leading innovator in test technology for inertial, pressure, and optical MEMS.

For further information contact: Henry J. Klim, VP Sales and Marketing 978-535-7683.

All Topics