Test Instruments suit multi-channel applications.
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Press Release Summary:
Consisting of single-channel Model 2601 and dual-channel Model 2602, Series 2600 System SourceMeter® Instruments help build ATE systems to perform dc, pulse, and low-frequency ac source-measure tests. Test Script Processor lets users execute high-speed automated test sequences independently of PC OS. TSP-Link(TM) functions as trigger synchronization and inter-unit communication bus to allow single TSP program to control 16 or more SMU channels without hubs or cables.
Original Press Release:
Keithley Introduces Industry's Fastest, Smallest, and Most Cost-Effective Source-Measure Units for Multi-Channel Applications
Cleveland, Ohio - March 1, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the Series 2600 System SourceMeter® Instruments, a new platform that significantly lowers the cost of test for a wide range of electronic component producers, including silicon and compound semiconductor manufacturers. Built on Keithley's third-generation source-measure technology (patent pending), the Series 2600 System SourceMeter instruments combine the highest throughput source-measure unit (SMU) in the industry with a scalable instrument form factor to allow seamless integration into systems from 1 to 16 SMU channels. The Series 2600 System SourceMeter instruments, which consist of the single-channel Model 2601 and the dual-channel Model 2602, are the ideal modular, scalable instruments for building ATE systems to perform precision DC, pulse, and low-frequency AC source-measure tests.
Test Components Faster, Increase Throughput. The Series 2600 System SourceMeter instruments provide industry-leading throughput rates via Keithley's new, unique embedded Test Script Processor (TSP(TM)). TSP lets users program a sequence of test commands and execute high-speed automated test sequences independently of a PC operating system. Unlike competitive products that lack this test sequencing ability or can only queue and execute commands, TSP features an intuitive intelligence that lets a 2600 Series instrument stand alone as a complete measurement automation solution for component testing. The instrument can control sourcing, measuring, pass/fail decisions, test sequence flow control, component binning, and data storage on 1 to 16 SMU channels. Testing shows a two- to four-times throughput advantage over competitive products in applications including three-terminal device test, parallel component test, L-I-V sweep, and two-terminal device test. Flexible triggering and flow control capability allows TSP to control other instruments, component handlers, or probers via digital I/O and RS-232 ports. With its unparalleled instrument automation capability, TSP achieves up to 10X greater test throughput over legacy products.
Save Time and Resources During Test System Development. The Series 2600 System SourceMeter instruments are equipped with Test Script Builder development software. Its simple graphical user interface (GUI) lets users develop, modify, and debug high-speed TSP programs. Each unit also features a built-in suite of pre-written TSP programs that can be quickly modified for specific applications, cutting software development time by as much as 75 percent. In addition, LabTracer(TM) 2.0 software for Series 2600 System SourceMeter instruments enables easy instrument control, data acquisition, and curve tracing in lab or device characterization applications.
Modular, Flexible, and Scalable Instruments Lower Capital Investment Costs. TSP-Link(TM), another new Keithley technology, functions as a trigger synchronization and inter-unit communication bus to allow a single TSP program to seamlessly control 16 or more SMU channels without hubs or bulky cables. With very little network overhead and a 100Mbit/sec data rate, it is significantly faster than GPIB and 100Base T Ethernet in real applications. TSP-Link affords users the advantage of scalability without the wasted rack space and added cost of mainframe systems.
Series 2600 instruments offer the industry's highest SMU rack density with up to two SourceMeter channels in a single half-rack, 2U chassis. Each channel offers a 40W, 3A precision four-quadrant SMU with accurate voltage and current readback and 1-pA resolution that can be configured as a precision power supply, current source, bipolar bias source, 5.5-digit DMM, low-frequency arbitrary waveform generator with measurement, and electronic load. At about $4,000 to $5,000 per channel, this combination of functions in one unit dramatically reduces the cost of ownership. An easy-to-use front-panel knob simplifies program editing and navigating while set-it and forget-it voltage and current limits work similar to a power supply.
Applications. The high throughput, flexible, and scalable Series 2600 System SourceMeter instruments are suitable for a wide range of applications in functional test and R&D environments. Units can perform I-V functional test and I-V characterization of a wide range of integrated devices and components including discrete and passive devices, and SSI and LSI devices such as ASICs, SOCs, and RFICs. In R&D environments, units can perform device characterization to aid in materials research for device development.
Price and Availability. The Series 2600 System SourceMeter instruments start at $5,495 (US) for the single-channel Model 2601. The dual-channel Model 2602 pricing is $7,995 (US). Availability is two weeks ARO effective May 1, 2005.
For More Information. For more information on Keithley's Series 2600 System SourceMeter instruments and to view a short online product presentation, visit www.keithley.com/pr/010.html.
About Keithley. With more than 50 years of measurement expertise, Keithley Instruments (www.keithley.com) has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency) geared to the specialized needs of electronics manufacturers for high performance production testing, process monitoring, product development, and research. By building upon our strength in electrical measurement solutions for research, Keithley has become a production test technology leader for the semiconductor, wireless, optoelectronics, and other precision electronics segments of the worldwide electronics industry. The value we provide to our customers is a combination of precision measurement technology and a rich understanding of their applications to improve the quality, throughput, and yield of their products.
Contact: Ellen Modock
Keithley Instruments, Inc.
440-498-2746
modock_ellen@keithley.com
