Test Cards expand ranges for multi-channel test system.
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Press Release Summary:
Models 4510-QIVC and 4511-QIVC provide 4 source-measure channels in each of 9 slots of Model 4500-MTS PCI mainframe, allowing up to 36 I-V measurement channels. System can test multiple devices, or multiple channels on single device simultaneously, under different test conditions. Full-scale output ranges are ±30, ±100, and ±500 mA for Model 4510 and ±100 mA, ±300 mA, and ±1.0 A for Model 4511. Both cards include ±10 Vdc full-scale voltage source sub-channels.
Original Press Release:
New Cards Expand Functionality And Lower Testing Costs With Model 4500-MTS Multi-Channel I-V Test System
CLEVELAND-December 18, 2003-Keithley Instruments, Inc. (NYSE: KEI) today announced the availability of two new multi-channel source-measure test cards with expanded operating ranges for its Model 4500-MTS Multi-Channel I-V Test System. Each Model 4510- and Model 4511-QIVC (Quad I-V Card) provides four source-measure channels in each of nine slots of the Model 4500-MTS PCI mainframe, allowing up to 36 I-V measurement channels. The Model 4500-MTS and its Quad I-V cards can make these measurements in a fraction of the time and at a fraction of the cost of a comparable rack-and-stack system.
The Model 4500-MTS is used for automated testing in multi-head (multi-DUT) production test environments, such as those involving stress-measure, life testing, and general device characterization. Typical applications employ its fast source-measure capabilities to generate I-V curves, measure the resistance of DUTs such as MEMSs and circuit protection diodes, and characterize many other passive and active devices. The system is also useful as a multi-channel power supply for sourcing and measuring voltages or currents during functional test of devices such as RFICs and photonic ICs. A variety of instruments, from Keithley and other vendors, can interface with the 4500-MTS to complement its I-V and power supply capabilities.
Application Background. The Model 4500-MTS can solve difficult measurement problems facing manufacturers who must test multiple devices, or multiple channels on a single device simultaneously, under many different test conditions. In a typical application, a dozen or more devices are loaded into a test fixture and electrical data is collected at thousands of source-measure test points on each device. The use of multiple rack-and-stack instruments in these applications is very expensive and slows down data collection due to data communications over the GPIB.
Unlike other modular test systems, the Model 4500-MTS Multi Channel I-V Test System is optimized for low noise, high current sourcing, while maintaining a well-controlled environment for sensitive measurements. It helps reduce manufacturing costs without compromising quality goals or production throughput.
Product Details. Each channel of a Model 4510 or 4511 Quad I-V Card offers a high power current source sub-channel, a low power voltage source sub-channel, and a 5-1/2 digit analog-to-digital converter for reading a DUT's response to the source stimulus. The Model 4510 Card has three full-scale output ranges of ±30mA, ±100mA, and ±500mA. The Model 4511 Card has three full-scale output ranges of ±100mA, ±300mA, and ±1.0A. Otherwise, the cards are identical, including their ±10VDC full-scale voltage source sub-channels. Each card also has a microcontroller running a real-time operating system with on-board measurement memory, so it can act autonomously during a test sequence, or work synchronously with other Series 4500 cards by timing source-measure activities with the trigger bus. Each sub-channel has mechanical relays to isolate its output and measurement circuitry from the DUT, thereby allowing multiplexing between the current source sub-channel and voltage source sub-channel.
These cards expand the functionality of earlier Model 4500 Quad I-V cards. The low-noise voltage source sub-channel maximum output has been increased from 5V to 10V. The current measurement sensitivity on these sub-channels has been extended to include a 10µA range. These range extensions and low noise signals are useful for high resistance measurement and leakage tests (i.e., when calculating R=V/I). The models 4510 and 4511 Quad I-V cards are also designed to work with the system's new Immediate-mode Measurements capability. Immediate Mode measurements are desirable when testing requires constant monitoring of forward voltage and adjustment of the drive current.
When the test application does not require the full complement of nine 4510/4511 cards, the open PCI platform of the Model 4500-MTS allows other slots to be used for PCI cards that provide additional functionality and customization. Furthermore, the system's modular nature allows it to be adapted quickly to emerging test requirements in a very dynamic test and measurement market. The result is a compact, fast, tightly integrated system of customized test capabilities at a cost per channel not available in other test system designs.
The system provides driver support for LabVIEW, Visual Basic, LabWindows(TM)/CVI, and any development environment that can call a Dynamic Link Library (.dll). The driver incorporates features that make it easier to control a large number of channels. Moreover, the user is shielded from the fine details of embedded controller programming and doesn't have to learn a new language or process.
Price and Availability. Model 4510- and Model 4511-Quad I-V cards are available immediately starting at a price of $7995. List prices for a Model 4500-MTS mainframe start at $8,995.
For More Information. For more information on Keithley's Model 4510- and Model 4511-Quad I-V cards, its Model 4500-MTS Multi-Channel I-V Test System, or any of its test solutions, contact the company at:
Telephone: 888-534-8453
440-248-0400
FAX: 440-248-6168
E-mail: product_info@keithley.com
Internet: www.keithley.com
Address:
Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891
About Keithley Instruments. With more than 50 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency) for semiconductor, wireless, optoelectronics, and other segments of the worldwide electronics industry. Engineers and scientists rely on Keithley's instrumentation to make even the most demanding electrical measurements with confidence. Keithley technology can be found on production floors of the most advanced electronics manufacturing facilities, in leading development labs, and in research departments of the world's prominent universities and corporate R&D centers.
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