Service analyzes DC transistor characteristics.
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Press Release Summary:
Designed for submicron transistors such as 90 and 65 nm CMOS technology nodes, DC Transistor Characterization Service provides structural and performance analysis of commercially available ICs. Report can be used to compare available technologies against industry published data or previous generation technologies. Information includes measurements for gate width, physical gate length, linear and saturation threshold voltages, sub-threshold swing, and body effect, among others.
Original Press Release:
Chipworks Launches Transistor Characterization Services
OTTAWA, Nov. 3 /-- Chipworks Inc., (Chipworks) the industry leader in reverse engineering and analysis of semiconductor chips and systems, today announced DC transistor characterization services for submicron transistors such as 90 nm and 65 nm CMOS technology nodes. Device manufacturers and designers now have access to the DC transistor characteristics (CMOS and bipolar) of commercially available, leading-edge integrated circuits.
Customers can use Chipworks structural and performance analyses to compare commercially available technologies against industry published data, or previous generations of technology. Chipworks products and services around this new capability will give customers timely and comprehensive, information that will help them to validate their own technology versus their competitors. Manufacturers in the fabless arena can use this information as part of their verification and qualification processes. Chipworks has seen rising customer demand in the Asia Pacific region for transistor characterization services.
"It is our experience that manufacturers often publish technical reports of their products that diverge markedly from what they are selling," says Dr. Kevin Gibb, Transistor Characterization Business Engineer at Chipworks. "Chipworks takes customers inside technology to help them more fully understand the competitive landscape, achieve faster design-to-market cycles, and aid in making objective business decisions."
Standard reports of CMOS technologies include measurements for two minimum gate length NMOS and PMOS transistors (along with the derived or measured measurement uncertainties).
o Gate width
o Physical gate length
o Linear threshold voltage
o Transfer characteristic shift
o Saturation threshold voltage
o Sub-threshold swing
o Transconductance
o On-state drive current
o Off-state leakage current
o Body Effect
o Punch-through voltage
o Substrate current
Similar data is available for advanced bipolar devices.
About Chipworks
Chipworks is an internationally recognized technical services company that analyzes the circuitry and physical composition of semiconductor chips and electronics systems for applications in patent licensing support and competitive study. Chipworks' technical experts use sophisticated lab facilities and a rich library of in-house semiconductor data and expertise to conduct detailed chip and system analyses. Chipworks develops high value, meticulously researched, on-time reports presented in a format that is easy to understand and tailored to customer needs.
For more than 13 years, Chipworks has specialized in reverse engineering on a literally microscopic scale, providing circuit, process and system intelligence for leading law firms, intellectual property groups, R&D and manufacturing groups within semiconductor companies the world over.
Source: CHIPWORKS INC.
CONTACT:
For additional information contact: Stacey Diffin-Lafleur
Manager, Marketing Communications, Chipworks Inc., (613) 829-0414, ext.3061,
media@chipworks.com;
