RF Test System accelerates aging to check performance.
Press Release Summary:
AACTS Automated Accelerated Characterization Test System performs aging tests on discrete transistors, monolithic microwave integrated circuits, hybrid microwave integrated circuits, and RF/microwave module assemblies. Test system has hardware and software that initiates, supervises, and records temperature, electrical, and RF performance parameters automatically. System is available in 4 and 8 channel versions with frequencies from 600 MHz to 10 GHz.
Original Press Release:
Maxwell Announces New RF Characterization Test System As An Addition To Family Of Automated Wideband Rf And Dc Reliability Test Stations
New RF Automated Accelerated Characterization Test System (AACTS) Starting at $99K Includes:
- Device Characterization with Built-In Semiconductor Parametric
Analyzer (SPA) Capability
- RF Frequencies From 600 MHz-10 GHz
- Accelerated Life Tests on Discrete, MMIC, or Hybrid-MIC
Components
- Temperature-Stress Testing Capability
- Precise Stress and Monitoring of DC and RF Parameters
SAN DIEGO, CA -- Maxwell Technologies, Inc. today announced the release of its new RF single-rack 4- and 8-channel version of their Automated Accelerated Reliability Test Systems (AARTS) product line. This new test system was developed for device design engineers working in a "fabless" environment that are looking to characterize prototype designs and benchmark specifications for their device manufacturers. The new product line, known as the Automated Accelerated Characterization Test System (AACTS), is offered in two frequency bands - 600 MHz to 3GHz, and 900MHz to 10GHz. In addition, the AACTS will contain the same features of the larger AARTS products and will be priced to start at $99K for the single-rack 4-channel version. These systems are capable of performing accelerated-aging performance characterization tests on discrete transistors, monolithic microwave integrated circuits (MMICs), hybrid microwave integrated circuits (HMICs), and RF/microwave module assemblies.
The AACTS product family supports 4- and 8-channel capacity with full RF, DC, and temperature stress capabilities. The test system consists of hardware and software used to initiate, supervise, and record temperature, electrical, and RF performance parameters automatically throughout the test duration. The devices-under-test (DUTs) are mounted in individual test fixtures that allow independent bias, temperature, and RF control. AACTS is operated through proprietary system software installed on a personal computer (PC). A Windows 2000-based graphical user interface provides user-friendly control of the system configuration. Automated program functions include test setup, monitoring, event sequencing, data storage and presentation, supervision, and networking. The PC controls equipment and other subsystem circuitry through a General Purpose Interface Bus (GPIB) that supports future expansion and custom options. The test station can support the testing of various modulation signals (such as CDMA), inter-modulation characterization testing, and multi-tone RF input signals. It can be equipped with a Semiconductor Parametric Analyzer for full I-V characterization.
"This state-of-the-art test equipment is designed to measure and characterize devices under multiple stresses and stimuli, with the parameters being selected by the designer to verify performance-margin before, during, or after accelerated-aging." said Roland Shaw, Director of Maxwell's Instrument Products line, which makes the AACTS testers. "We know our customers desire the highest level of confidence in the stated performance of their RF technology and products, and that's what these systems are all about. Indeed, they are knowledge-accelerators for RF performance characterization," he continued.
The AACTS/AARTS product lines represents the fourth generation architecture in this family of RF and DC automated testers, according to Fred Puglisi, Director of Sales for the Instrument Products line. This fully automated tester evolved from a semi-automatic reliability tester called PAARTS (Power Amplifier Automated Reliability Tester), which was developed by Shason Microwave for NASA's Jet Propulsion Laboratory. Shason Microwave then evolved the PAARTS into the next generation reliability AARTS test system before being purchased by Maxwell Technologies in mid-year 2000.
"We believe that the modularity and dual functionality of this new single rack test system will offer a more cost effective solution. This is especially true when it comes to capital spending for companies having a need to do both life testing and design characterization of today's devices and for future devices using millimeter wave frequencies," said Puglisi.
Maxwell Technologies manufactures and markets high-reliability power and computing components and automated test instruments. The company's instrument products include Automated Accelerated Reliability Test Systems (AARTS) and Automated Accelerated Characterization Test Systems (AACTS) for RF, DC, and optoelectronic components. The company's microelectronic products include power modules, integrated circuits and single board computers that combine commercial-off-the-shelf (COTS) components and Maxwell's proprietary radiation shielding technology to provide optimal performance and reliability in aerospace, military and other applications. Maxwell's PowerCache(TM) ultracapacitors are high-density energy storage cells that deliver bursts of high power on demand in applications such as automotive electrical systems and powertrains, wireless communications and consumer and industrial electronic devices. To learn more about Maxwell Technologies, please visit our website: www.maxwell.com.
Sales Contact:
Fred Puglisi
Maxwell Technologies' Instrument Products
9244 Balboa Avenue
San Diego, CA 92123
Tel: + 1 858-503-3343
Fax: + 1 858-503-3301
E-Mail: fpuglisi@maxwell.com
