Latest Velocity Pro Cameras Use 120 x 120 Pixel EBSD Patterns

Press Release Summary:

  • Powered by CMOS sensor, cameras combine indexing speeds up to 4,500 indexed points per second
  • Offer high-speed EBSD mapping with the highest indexing performance on real-world materials
  • Image resolution combined with Combined with Triplet Indexing routine provides orientation precision values of less than 0.1°

Original Press Release:

EDAX Adds Velocity Pro to Its EBSD Camera Series

MAHWAH, NJ (Jan. 6, 2021) – AMETEK EDAX, a leader in X-ray microanalysis and electron diffraction instrumentation, is adding a new, fast, low-noise CMOS camera to its Velocity™ Electron Backscatter Diffraction (EBSD) Camera Series. The Velocity Pro offers high-speed EBSD mapping with the highest indexing performance on real-world materials.

The Velocity EBSD Camera Series now includes three cameras tailored to specific EBSD analysis applications:

  • Velocity Pro – Collects up to 2,000 indexed points per second
  • Velocity Plus – Collects up to 3,000 indexed points per second
  • Velocity Super – Collects up to 4,500 indexed points per second

Powered by a CMOS sensor optimized for high-speed EBSD, the Velocity EBSD Camera Series combines indexing speeds up to 4,500 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity Cameras use 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with the proven EDAX Triplet Indexing routine, provides orientation precision values of less than 0.1°.

The Velocity EBSD Series can be integrated with compatible EDAX EDS detectors to provide an analytical system for efficient simultaneous EDS-EBSD collection, even at the highest collection speeds. Furthermore, the collection can be combined with ChI-Scan™ analysis for results with useful, integrated data for accurate phase differentiation.

This new addition to the EDAX portfolio of EBSD cameras offers users another option for high-speed mapping and accurate indexing to resolve crystallographic microstructures and help solve materials characterization challenges quickly and easily.

For further information, visit www.edax.com/velocity or email EDAX at info.edax@ametek.com.

About EDAX
EDAX is an acknowledged leader in Energy Dispersive Spectroscopy, Electron Backscatter Diffraction, and X-ray Fluorescence instrumentation. EDAX designs, manufactures, installs, and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.

Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics, and specialized application software that facilitate solutions to research, development, and industrial requirements.

EDAX is a unit of the Materials Analysis Division of AMETEK, Inc., which is a leading global manufacturer of electronic instruments and electromechanical devices with annual sales of approximately $5 billion. For further information about EDAX, please contact:

Jonathan McMenamin
EDAX LLC
91 McKee Drive, Mahwah, NJ 07430
Tel: (201) 529-4880 • Fax: (201) 529-3156
Email: jonathan.mcmenamin@ametek.com
Website: https://www.edax.com

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