Instrument tests serial communications.
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Press Release Summary:
Configurable, VXI-based Digital Stimulus and Response Module (DSRM) is suited for use with multi-wire serial communication busses. With configurable and downloadable FPGA design, device is capable of implementing communications protocols such as CAN, SDDI, and various serial busses.
Original Press Release:
Etec Announces High Performance Serial Communication Test Instrument
Peabody, MA: Etec, Inc. announced today the release of a new configurable VXI based Digital Stimulus and Response Module (DSRM) aimed at multi-wire serial communication busses. "With the increase in serial bus communications in many commercial and industrial products, flexible and configurable test instrumentation was needed to fill these diverse test applications", according to Mark Ford, Etec President and CEO. "The first implementation was done for a MEMS SPI interface. With the configurable and downloadable FPGA design we are implementing a wide variety of communications protocols, including the CAN, SDDI, and a number of the popular serial busses", commented Henry J. Klim, Vice President.
ETEC has been providing instrumentation and equipment for volume production of MEMS devices since 1994. ETEC's unique scalable system architecture supports MEMS testing from development through production. The company is a leading innovator in test technology for inertial, pressure, and optical MEMS.
For further information contact: Henry J. Klim, VP Sales and Marketing 978-535-7683.
83 Pine Street W. Peabody, MA 01960-3635 Tel. 800.992.ETEC (3832) Fax 978.535.7003
Email: Aholzknecht@etec-inc.com Web: www.etec-inc.com
