Press Release Summary:
Software driver allows users to control Model 4200-SCS Semiconductor Characterization System while operating within IC-CAP device modeling software environment. It supports functional control of up to 8 SMUs, preamps, ground unit, and all instrument ranges and resolutions. Remote, low-noise preamplifiers extend measurement resolution to 0.1 femtoamp. Driver also provides for fine adjustment of delay factor, filter factor, and integration time.
Original Press Release:
Keithley Adds IC-CAP Device Modeling Capability to 4200-SCS Semiconductor Characterization System
Cleveland, Ohio -- January 29, 2002 -- Keithley Instruments, Inc. (NYSE: KEI) today introduced a software driver that allows customers to control the Keithley Model 4200-SCS Semiconductor Characterization System while operating within the popular Agilent Technologies' IC-CAP device modeling software environment. Now, semiconductor labs can take advantage of the ease-of-use, high speed, and sub-femtoamp resolution of the 4200-
SCS, while serving the differing needs of users who perform device modeling studies versus device characterization.
The Model 4200-SCS offers the most advanced test capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows(R) NT operating system, mass storage, and a browser-style Project Navigator for test organization and control. The driver supports comprehensive functional control of up to eight SMUs, preamps, ground unit, and all instrument ranges and resolutions. Remote, low-noise preamplifiers extend measurement resolution to 0.1 femtoamp. The driver also provides for fine adjustment of delay factor, filter
factor, and integration time in addition to simple Short, Medium, and Long settings.
IC-CAP is a modeling and analysis package developed and supported by Agilent Technologies and used to automate measurements, simulate device performance, extract data, and optimize model parameters. Its statistical analysis capabilities can be used to create and maintain accurate model libraries for a wide range of semiconductor device types, including MOS, BJT, MESFET/HEMFET, thin-film devices, and many others. IC-CAP runs on a Unix workstation under the Sun Solaris, or HPUX, operating system.
Applications and Markets
Semiconductor product designers and process engineers use the Model 4200-SCS Semiconductor Characterization System to measure critical device characteristics during development, production, reliability testing, failure analysis, and incoming inspection of semiconductor wafers. The addition of the new Instrument Driver expands the utility of the Model 4200-SCS to include device modeling with IC-CAP in addition to other supported modeling applications. Integrating the Model 4200-SCS with IC-CAP increases the usability of the Model 4200-SCS in semiconductor labs where dual-use (characterization/modeling) work stations are highly desirable or required, and IC-CAP is the
About Keithley Instruments.
Keithley Instruments, Inc. provides electrical, RF (radio frequency), and optical measurement solutions to the
telecommunications, semiconductor, optoelectronics, and other electronic components industries. Engineers and scientists around the world use Keithley's advanced hardware and software for process monitoring, production test, and basic research.