I/O Modules enable structural test of PCI express slots.

Press Release Summary:



Able to completely test PCI Express Standard V2.0 compliant slots via dot1/dot6 for correct pin contacting, IEEE Std. 1149.6 compliant CION Module(TM)/PCIe-x(1/4) interface cards are plugged directly into x1 or x4 PCI Express slot and controlled by TAP (Test Access Port). With on-board IEEE 1149.1 and IEEE 1149.6 test channels, all high speed signal pins, low speed signal pins, and voltage supply pin of PCI Express compliant connectors can be tested structurally.




Original Press Release:



New Boundary Scan I/O Modules Enable Structural Test of PCI Express Slots via IEEE Std. 1149.6



GOEPEL electronic, world-class vendor of JTAG/Boundary Scan solutions compliant with IEEE Std. 1149.x, recently introduced CION Module(TM) /PCIe-x(1/4) as additional interface cards within the popular CION Module product range.

The new low-cost modules are plugged directly into a x1 or x4 PCI Express slot and controlled by means of a TAP (Test Access Port). Because of the on-board IEEE 1149.1 and IEEE1149.6 test channels all high speed signal pins, low speed signal pins and voltage supply pin of PCI Express compliant connectors are structurally testable.

"PCI Express has become an important bus systems for the industry. With our new I/O modules we can meet customer demands for test opportunities for such interfaces based on IEEE Std. 1149.6 for the first time", says Karl Miles, GOEPEL electronics' UK Sales Manager. "At the same time we offer the widest product range for the structural interface test per IEEE 1149.1 and IEEE 1149.6 on the market".

The CION Module(TM) /PCIe-x1 and the CION Module(TM) /PCIe-x4 are plugged directly into the connector to be tested. They are able to completely test PCI Express Standard V2.0 compliant slots via dot1/dot6 for correct pin contacting. Because the modules provide transparent TAP, several CION modules of the same or different type can be cascaded due to the daisy chain principle.

Altogether, the CION Module(TM) product family has already ten different models for the flexible test of numerous analogue and digital interfaces.

The new hardware module is completely supported by all JTAG/Boundary Scan controllers of the ScanBooster(TM) and SCANFLEX® families as well the integrated Boundary Scan software platform SYSTEM CASCON(TM). For more than 10 years, SYSTEM CASCON(TM) continues to be the most innovative Integrated JTAG/Boundary Scan Development Environment with 36 fully integrated tools. Users are now able to easily integrate the CION Module(TM) /PCIe-x(1/4) into a respective test project with fully automatically generated dot1/dot6 test vectors. Any faults can be interactively debugged and visualised graphically at pin and net level in the layout and schematic.

GOEPEL electronic, founded in 1991 and headquartered in Jena/Germany, is a worldwide leading vendor of innovative JTAG / Boundary Scan / IEEE 1149.x solutions, offering mature software tools in an integrated development environment, high-performance Boundary Scan controllers and accessories, as well as comprehensive product support and value added services. The company of 140 employees generated a revenue of 18.5 million EURO (about 23 million US Dollars) in 2007, maintaining support and sales offices in Germany, France, the United Kingdom, and the United States. An extended distribution and service network of more than 300 specialists ensures excellent local and on-site customer support for more than 5,600 worldwide system installations.

GOEPEL electronic has continuously been ISO9001 certified since 1996 and has been honoured with TOP-JOB and TOP-100 awards for being one of the best medium-sized companies in Germany. GOEPEL electronic's products won several awards in recent years and are used by the leading companies in telecommunication, automotive, space and avionics, industrial controls, medical technology, and other industries.
Additional information about the Company and its products can be found online at www.goepel.com.

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