Coordinate Measuring Machines utilize scanning probes.
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Press Release Summary:
Available on Brown and Sharpe Global Advantage model CMMs, Model LSP-X5 can carry styli up to 500 mm long and weighing up to 500 g. Probe includes additional anti-collision system for extra protection of head in event of crash. Model LSP-X3 allows use of probe extensions up to 360 mm long and 150 g of weight. Automatic tool changing with Leitz Tool Rack allows styli changes within measurement program without need for recalibration.
Original Press Release:
Hexagon Metrology Features LEITZ X-Series Scanning Probes at IMTS 2006
Hexagon Metrology Inc. will showcase the Leitz X-Series CMM probes at IMTS 2006 on a Brown & Sharpe Global CMM. Developed by Hexagon Metrology GMbH (Germany), the Leitz LSP-X3 and LSP-X5 probes are high accuracy analog scanning probes that are capability of high precision and throughput while scanning complex geometric parts and high accuracy machined surfaces.
LSP probes are available on Brown & Sharpe Global Advantage model CMMs in two different versions: LSP-X5 and LSP-X3. The LSP-X5 can carry styli up to 500mm of length and up to 500g of weight and features an additional anti-collision system for extra protection of the head in the event of a crash. The LSP-X3 allows the use of probe extensions up to 360mm of length and 150g of weight. Automatic tool changing with the Leitz Tool Rack allows styli changes within a measurement program without the need for re-calibration. Pneumatic clamping of the styli permits fast and accurate stylus changes.
The Hexagon Metrology group of Hexagon AB (Sweden) is the world's largest manufacturer of precision dimensional measurement equipment and software, with ten manufacturing facilities on four continents and more than forty sales and support locations worldwide. Hexagon's brands include Brown & Sharpe, CE Johansson, CimCore, DEA, Leitz, Leica Geosystems, PC-DMIS, ROMER, Sheffield and TESA. More information can be found at www.hexagonmetrology.com.
Website: www.brownandsharpe.com