SANTA CRUZ, CA - October 17, 2007 - Ambios Technology, Inc. introduced its new family of surface profilometers at the 54th annual American Vacuum Society conference in Seattle. The XP-Plus Series Profilers feature entirely new control electronics, software, and substantially improved performance specifications. The series consists of three different profilers, each designed to meet the diverse needs of research and manufacturing environments. Visit www.ambiostech.com/XP-Plus for more information.
Patrick O'Hara, President and CEO for the company commented, "These new instruments represent a substantial advancement in the state-of-the-art in surface profilometers. The new XP-Plus series is the culmination of nearly two years of research, product development, and field testing. Our customers' input was the impetus for the XP-Plus Series products, and is reflected in the features and performance of these next-generation products from Ambios. With this next generation product line, Ambios builds upon its industry reputation as the preferred provider of high resolution surface profilers."
Ambios Technology, Inc. manufactures high resolution surface measurement and visualization systems. In addition to surface profilometers, the company also develops and produces scanning white light interferometers and scanning probe microscopes. A privately held company, Ambios Technology, has its headquarters in Santa Cruz, CA and a sales, service, and support office in Rochester, NY.