Tokyo (JCNN) - Fujitsu Laboratories has developed two technologies that predict the rates of software errors and malfunctions on logic circuits, caused partly by neutrons found in cosmic rays. Applicable to 45nm logic circuits, the forecast technologies will help chip engineers design error-resistant chips.
The first technology models noise pulse propagation and error-causing timing and simulates errors on logic circuits. The second technology combines a memory software error simulator with a circuit simulator to evaluate logic circuit software errors.
The company discussed the details of the latest technologies at the International Conference on Solid State Devices and Materials held in Kobe on September 13.
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