Fujitsu Laboratories Develops Technologies that Predict Software Error Rates on Logic Circuits


Tokyo (JCNN) - Fujitsu Laboratories has developed two technologies that predict the rates of software errors and malfunctions on logic circuits, caused partly by neutrons found in cosmic rays. Applicable to 45nm logic circuits, the forecast technologies will help chip engineers design error-resistant chips.

The first technology models noise pulse propagation and error-causing timing and simulates errors on logic circuits. The second technology combines a memory software error simulator with a circuit simulator to evaluate logic circuit software errors.

The company discussed the details of the latest technologies at the International Conference on Solid State Devices and Materials held in Kobe on September 13.

Copyright © 2005 JCN Network. All rights reserved

If you believe you have received this news in error or would like to be removed from our mailing list please respond here (https://www.japancorp.net/unsubscribe.asp) and you will be removed from our mailing list.

If you have difficulty viewing our News Alerts in HTML format you can change your settings here (https://www.japancorp.net/changeregister.asp

More from Fluid & Gas Flow Equipment

All Topics