Tropel Corporation

Metrology System provides sub-micron form measurement.

Tropel ThetaForm(TM) metrology system consists of dual-wavelength interferometer, mounted on programmable, multi-directional stage to measure rotationally symmetric surfaces. System creates high-density surface maps in less than one minute. It provides point-to-point resolution of distances in nanometer range and is capable of measuring ground parts with surface roughness up to 2 microns. System...

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Metrology System provides sub-micron form measurement.

Tropel ThetaForm(TM) metrology system consists of dual-wavelength interferometer, mounted on programmable, multi-directional stage to measure rotationally symmetric surfaces. System creates high-density surface maps in less than one minute. It provides point-to-point resolution of distances in nanometer range and is capable of measuring ground parts with surface roughness up to 2 microns. System...

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