Solar Metrology

101-5 Colin Drive
Holbrook, NY 11714

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Laboratory and Research Supplies and Equipment

XRF Glass Panel Sampling Tool suits CIGS/CdTe PV panel film.

Featuring 600 x 1,200 mm lateral X/Y range of measurement, SMX-FPV is designed for near-line film composition and thickness control of CIGS and CdTe film stacks. It also provides process control of active, contact, and TCO layers. Detailed analysis of full photovoltaic panels is possible, including copper and gallium ratio determination as well as panel gradient analysis. Areas of use include...

XRF Glass Panel Sampling Tool suits CIGS/CdTe PV panel film.

Featuring 600 x 1,200 mm lateral X/Y range of measurement, SMX-FPV is designed for near-line film composition and thickness control of CIGS and CdTe film stacks. It also provides process control of active, contact, and TCO layers. Detailed analysis of full photovoltaic panels is possible, including copper and gallium ratio determination as well as panel gradient analysis. Areas of use include...

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