Goepel Electronics LLC

Cypress EZ-USB FX3 Controllers feature up to 121 pins.

Cypress EZ-USB FX3 Controllers feature up to 121 pins.

Cypress EZ-USB FX3 Controllers feature VarioTAP® model libraries. Unit is offered in BGA or WLCSP package and can be adapted via the JTAG interface. Product’s libraries enable fusion of programming and testing using debug interfaces. Controller can be integrated into the board test.

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Materials

Embedded Test and Validation for 6th Generation Intel® Core(TM) Processors

The recently launched sixth generation Intel® Core™ processors codenamed Skylake are now also supported with special model libraries for testing and validation. The libraries, called VarioTAP® models, allow flexible execution of processor emulation tests using the processor’s native debug interface. Thereby the CPUs can be used as embedded test tools for design validation of...

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Model Libraries aid MCU application testing and programming.
Services

Model Libraries aid MCU application testing and programming.

VarioTAP® model libraries, used for universal processor emulation, are available for Infineon XMC MCUs based on ARM® Cortex™-M cores. As part of IP library, VarioTAP model contains all relevant access information for respective target processor. This lets users selectÂ- processor corresponding to their design and test/validate connected hardware unit as well as program Flash...

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X-Ray Inspection System offers speed upgrade.
Test & Measurement

X-Ray Inspection System offers speed upgrade.

Designed for testing double-sided boards, X40 PLUS captures both top and bottom sides within single pass. With real-time multi-angle image, system can recordÂ- complete 3D inspection of assembly. Integrated reconstruction methods based on digital thomosynthesis enable defined evaluation of individual layers of board. With upgrade, system offers inspection speed increase of 18%. Assembly...

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Highly Precise and Fast Inspection of Solder and Sinter Pastes
Test & Measurement

Highly Precise and Fast Inspection of Solder and Sinter Pastes

At the SMT/Hybrid/Packaging show in Nuremberg GOEPEL electronics will present a new generation solder paste inspection system. The SPI-Line 3D allows solder pastes and sinter pastes with a height of less than 50 Â-µm to be measured precisely and quickly. The newly developed measuring head, with double-sided projection within the device, provides the maximum degree of repeatability and...

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Mixed Signal I/O Module optimizes testability of assemblies.
Controls & Controllers

Mixed Signal I/O Module optimizes testability of assemblies.

With total of 96 single ended channels, Model SFX-5296LX extends Boundary Scan test to non-scannable components such as connectors, clusters, or analog interfaces. Unit uses parallel I/O and is equipped with diverse dynamic test resources for each channel, such as frequency counter, event detector, arbitrary waveform generator, and digitizer. Each channel can be configured as input, output, and...

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Boundary Scan TAP Transceiver provides secure data transfer.
Communication Systems & Equipment

Boundary Scan TAP Transceiver provides secure data transfer.

Using 16 parallel test access ports, SCANFLEX TAP Transceiver enables testing and programming of multiple units under test. Rack-mountable 19 in. Model SFX-TAP16/G-RM-FXT serves as system interface to UUT and is controlled by central SCANFLEX controller. With external test heads, unit offers secure signal transmission at distances up to 4 m. Transceiver supports all Embedded System Access,...

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GOEPEL Electronics Inline AXOI System Communicates with ASYS OIC Software
Test & Measurement

GOEPEL Electronics Inline AXOI System Communicates with ASYS OIC Software

The high-end 3D X-ray inspection system X-Line 3D from GOEPEL electronics now features a link to the OIC System (Overall Inline Communication) by ASYS Automatisierungssysteme. The OIC system visualizes the electronics production line and displays status, product and production process in real time. In parallel, all relevant production relevant data and availabilities are truthfully documented....

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Cleaning Products & Equipment

Demo Board detects integration-specific faults, wiring errors.

With hardware module that contains various Boundary Scan structures as well as non-Boundary Scan components, Integra V1 is intended for demonstrating integration solutions with such test methods as functional test, in-circuit test, manufacturing defects analyzer, and flying probe test. Production faults can be simulated by switch, signal states can be monitored, and additional test points allow...

Read More »
Test & Measurement

Cooperation Between German and Chinese Test Specialists

Asia remains the main focus of GOEPEL electronics global expansion of innovative JTAG/Boundary Scan test solutions. With the high-tech enterprise Watertek Information Technology Co. Ltd, GOEPEL electronics welcomes another Asian member in his GATE partner network. The aim of this cooperation is the special application development and practical implementation of the latest JTAG/Boundary Scan...

Read More »
Cypress EZ-USB FX3 Controllers feature up to 121 pins.

Cypress EZ-USB FX3 Controllers feature up to 121 pins.

Cypress EZ-USB FX3 Controllers feature VarioTAP® model libraries. Unit is offered in BGA or WLCSP package and can be adapted via the JTAG interface. Product’s libraries enable fusion of programming and testing using debug interfaces. Controller can be integrated into the board test.

Read More »
Materials

Embedded Test and Validation for 6th Generation Intel® Core(TM) Processors

The recently launched sixth generation Intel® Core™ processors codenamed Skylake are now also supported with special model libraries for testing and validation. The libraries, called VarioTAP® models, allow flexible execution of processor emulation tests using the processor’s native debug interface. Thereby the CPUs can be used as embedded test tools for design validation of...

Read More »
Model Libraries aid MCU application testing and programming.
Services

Model Libraries aid MCU application testing and programming.

VarioTAP® model libraries, used for universal processor emulation, are available for Infineon XMC MCUs based on ARM® Cortex™-M cores. As part of IP library, VarioTAP model contains all relevant access information for respective target processor. This lets users selectÂ- processor corresponding to their design and test/validate connected hardware unit as well as program Flash...

Read More »
X-Ray Inspection System offers speed upgrade.
Test & Measurement

X-Ray Inspection System offers speed upgrade.

Designed for testing double-sided boards, X40 PLUS captures both top and bottom sides within single pass. With real-time multi-angle image, system can recordÂ- complete 3D inspection of assembly. Integrated reconstruction methods based on digital thomosynthesis enable defined evaluation of individual layers of board. With upgrade, system offers inspection speed increase of 18%. Assembly...

Read More »
Highly Precise and Fast Inspection of Solder and Sinter Pastes
Test & Measurement

Highly Precise and Fast Inspection of Solder and Sinter Pastes

At the SMT/Hybrid/Packaging show in Nuremberg GOEPEL electronics will present a new generation solder paste inspection system. The SPI-Line 3D allows solder pastes and sinter pastes with a height of less than 50 Â-µm to be measured precisely and quickly. The newly developed measuring head, with double-sided projection within the device, provides the maximum degree of repeatability and...

Read More »
Mixed Signal I/O Module optimizes testability of assemblies.
Controls & Controllers

Mixed Signal I/O Module optimizes testability of assemblies.

With total of 96 single ended channels, Model SFX-5296LX extends Boundary Scan test to non-scannable components such as connectors, clusters, or analog interfaces. Unit uses parallel I/O and is equipped with diverse dynamic test resources for each channel, such as frequency counter, event detector, arbitrary waveform generator, and digitizer. Each channel can be configured as input, output, and...

Read More »
Boundary Scan TAP Transceiver provides secure data transfer.
Communication Systems & Equipment

Boundary Scan TAP Transceiver provides secure data transfer.

Using 16 parallel test access ports, SCANFLEX TAP Transceiver enables testing and programming of multiple units under test. Rack-mountable 19 in. Model SFX-TAP16/G-RM-FXT serves as system interface to UUT and is controlled by central SCANFLEX controller. With external test heads, unit offers secure signal transmission at distances up to 4 m. Transceiver supports all Embedded System Access,...

Read More »
GOEPEL Electronics Inline AXOI System Communicates with ASYS OIC Software
Test & Measurement

GOEPEL Electronics Inline AXOI System Communicates with ASYS OIC Software

The high-end 3D X-ray inspection system X-Line 3D from GOEPEL electronics now features a link to the OIC System (Overall Inline Communication) by ASYS Automatisierungssysteme. The OIC system visualizes the electronics production line and displays status, product and production process in real time. In parallel, all relevant production relevant data and availabilities are truthfully documented....

Read More »
Cleaning Products & Equipment

Demo Board detects integration-specific faults, wiring errors.

With hardware module that contains various Boundary Scan structures as well as non-Boundary Scan components, Integra V1 is intended for demonstrating integration solutions with such test methods as functional test, in-circuit test, manufacturing defects analyzer, and flying probe test. Production faults can be simulated by switch, signal states can be monitored, and additional test points allow...

Read More »
Test & Measurement

Cooperation Between German and Chinese Test Specialists

Asia remains the main focus of GOEPEL electronics global expansion of innovative JTAG/Boundary Scan test solutions. With the high-tech enterprise Watertek Information Technology Co. Ltd, GOEPEL electronics welcomes another Asian member in his GATE partner network. The aim of this cooperation is the special application development and practical implementation of the latest JTAG/Boundary Scan...

Read More »

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