Nikon Metrology Inc.
Brighton, MI 48116
Latest CNC Video Measuring System Comes with Enhanced Through-The-Lens Laser Auto Focus
Offers stage control technology and image processing algorithm to achieve faster movements and image capture steps. Detects feature edges at very high speed, capturing accurately and automatically the shape and dimensions. Ideal for inspecting wide variety of mechanical, electrical, electronic, moulded, cast and pressed components.
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New ASTM E2737 Detector Evaluation Package Offers Automated Analysis of Image Data
Available with pre-calibrated artefact and simple-to-install customised bracketry with fast-change adapters. Long-term performance and stability of the detector can be tracked throughout its service life. Suitable for X-ray CT inspection, metrology and large envelope CT systems.
Read More »
White Light Interferometric Microscope can measure graphene.
Comprising industrial, research-grade microscopes based on double beam interferometry objectives, BW seriesÂ- combine white light interferometry (WLI) with standard optical techniques such as bright-field, dark-field, polarised light, DIC (differential interference contrast), and epifluorescence. Focus variation with WLI offers effective height resolution of 15 pm and precise and...
Read More »
High-Voltage Microfocus CT System inspects large, dense parts.
Used for measurementÂ- as well as non-destructive testing and inspection, XT H 450 employs 450 kV microfocus source and is available with flat panel or curved linear diode array (CLDA) detector. Source's open-tube design with user-replaceable filaments offers virtually unlimited lifetime with minimal maintenance, and spot size ranges from 50–320 µm (depending on...
Read More »
CNC Video Measuring Systems utilize precise edge detection.
Utilizing optical measuring technology and image processing, NEXIV VMZ-R3020 and VMZ-R6555 automatically capture dimensions and shapes of components. NEXIV VMZ-R3020 is suitable for inspection of small components used for mechanical/electric applications, while NEXIV VMZ-R6555, featuring 65 x 55 cm measuring platform, targets larger PCBs or mechanical parts. Third ring illumination angle offers...
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Camio8 Multi-Sensor CMM Software Provides Better Insights and More Productivity
CAMIO offers true multi-sensor capability, allowing best-practice selection of sensor technology for each task. By combining touch trigger, analogue scanning and 3D laser scanning sensors within the same inspection program, the right inspection results are obtained in the fastest way. Nikon Metrology multi-sensor solutions provide manufacturers with greater measurement flexibility and a better...
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Metrology CT System offers magnification up to 200x.
Based on actively cooled, 225 kV micro-focus X-ray source, MCT225 HA supportsÂ- range of sample sizes and material densities with 3.8+ L/50 µm MPEl accuracy in accordance with VDI/VDE 2630 guideline. System features manipulator guideways equipped with high-resolution optical encoders. Guideways are error corrected using laser interferometer mapping techniques. To minimize thermal...
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Ceramic Frame Bridge CMMs come in 3 configurations.
Altera Essential Series CMMs support motorized/manual probe heads, while Altera Optimum Series 5-axis CMMs feature PH20 infinite positioning touch-trigger probe head. Accepting touch-trigger/scanning probes, Altera Ultimate Series CMMs include graphic display and CAMIO software for creating inspection programs and reports in CAD format. All have ceramic structural components, maximizing accuracy...
Read More »Nikon Metrology's Laser Radar Integrates with Metrologic Group's Metrolog X4, Advancing the Technology to New Heights
Brighton, MI - Nikon Metrology, Inc. (NMI) announces a new software breakthrough with Metrologic Group, providing a complete set of new functionalities and applications for Laser Radar, and other NMI products. Metrologic has combined Large-Scale capabilities into its popular Metrolog software, now offering large-scale point clouds with fully automated functionalities. These include edge...
Read More »Integrated, Plug-and-Play Sensor uses iGPS receiver technology.
As self-contained 5 Degree of Freedom measurement device, i5 Integrated Sensor (i5is) integrates linear amplifier and 16-bit ADC with DSP. This enables pulse detection of any iGPS sensor, and operation is virtually unaffected by optical and environmental noise caused by lighting conditions and EMI sources. Throughout entire measurement volume, sensor achieves 3D point uncertainty of less than...
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Latest CNC Video Measuring System Comes with Enhanced Through-The-Lens Laser Auto Focus
Offers stage control technology and image processing algorithm to achieve faster movements and image capture steps. Detects feature edges at very high speed, capturing accurately and automatically the shape and dimensions. Ideal for inspecting wide variety of mechanical, electrical, electronic, moulded, cast and pressed components.
Read More »
New ASTM E2737 Detector Evaluation Package Offers Automated Analysis of Image Data
Available with pre-calibrated artefact and simple-to-install customised bracketry with fast-change adapters. Long-term performance and stability of the detector can be tracked throughout its service life. Suitable for X-ray CT inspection, metrology and large envelope CT systems.
Read More »Nikon Metrology & NSI Announce Partnership
Brighton, Michigan -- Nikon Metrology today announces a new partnership with NSI Microscopy Inspection Automation of Wexford, Ireland. This agreement will help customers with Continuous Process Improvement by making use of automated microscopy. NSI is a leader in the field of Continuous Process Improvement by using Automated Microscopy Software. The company specializes in medical device,...
Read More »WENZEL and Nikon Metrology Enter Distribution Partnership
The distribution agreement between Nikon Metrology, Inc. – Americas and WENZEL America sees two of the biggest global players for metrology create a new partnership in North America. This distribution partnership provides customers with the ultimate combination of innovative CMMs, with Nikon Metrology’s unequalled laser scanning technology. Nikon Metrology, Inc and WENZEL America announce...
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White Light Interferometric Microscope can measure graphene.
Comprising industrial, research-grade microscopes based on double beam interferometry objectives, BW seriesÂ- combine white light interferometry (WLI) with standard optical techniques such as bright-field, dark-field, polarised light, DIC (differential interference contrast), and epifluorescence. Focus variation with WLI offers effective height resolution of 15 pm and precise and...
Read More »
High-Voltage Microfocus CT System inspects large, dense parts.
Used for measurementÂ- as well as non-destructive testing and inspection, XT H 450 employs 450 kV microfocus source and is available with flat panel or curved linear diode array (CLDA) detector. Source's open-tube design with user-replaceable filaments offers virtually unlimited lifetime with minimal maintenance, and spot size ranges from 50–320 µm (depending on...
Read More »
CNC Video Measuring Systems utilize precise edge detection.
Utilizing optical measuring technology and image processing, NEXIV VMZ-R3020 and VMZ-R6555 automatically capture dimensions and shapes of components. NEXIV VMZ-R3020 is suitable for inspection of small components used for mechanical/electric applications, while NEXIV VMZ-R6555, featuring 65 x 55 cm measuring platform, targets larger PCBs or mechanical parts. Third ring illumination angle offers...
Read More »
Camio8 Multi-Sensor CMM Software Provides Better Insights and More Productivity
CAMIO offers true multi-sensor capability, allowing best-practice selection of sensor technology for each task. By combining touch trigger, analogue scanning and 3D laser scanning sensors within the same inspection program, the right inspection results are obtained in the fastest way. Nikon Metrology multi-sensor solutions provide manufacturers with greater measurement flexibility and a better...
Read More »
Metrology CT System offers magnification up to 200x.
Based on actively cooled, 225 kV micro-focus X-ray source, MCT225 HA supportsÂ- range of sample sizes and material densities with 3.8+ L/50 µm MPEl accuracy in accordance with VDI/VDE 2630 guideline. System features manipulator guideways equipped with high-resolution optical encoders. Guideways are error corrected using laser interferometer mapping techniques. To minimize thermal...
Read More »
Ceramic Frame Bridge CMMs come in 3 configurations.
Altera Essential Series CMMs support motorized/manual probe heads, while Altera Optimum Series 5-axis CMMs feature PH20 infinite positioning touch-trigger probe head. Accepting touch-trigger/scanning probes, Altera Ultimate Series CMMs include graphic display and CAMIO software for creating inspection programs and reports in CAD format. All have ceramic structural components, maximizing accuracy...
Read More »