X-Tek Group, Inc.

X-Ray System includes hi-res 3D imaging capability.

Revolution X-ray system is offered with Computerized Tomography (CT) capability, which produces high resolution 3D data sets that can be viewed at any angle, sliced in any direction, and measured to enable detailed analysis of internal structure of components and substrates. Proprietary technologies incorporate Microfocus Xi X-ray source, Nanotech(TM) Target assembly, and Inspect-X system control...

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X-Ray Inspection System offers viewing angle of up to 75-

With sub-micron resolution, Revolution offers max magnification of 6000x at all angles over 16 x 16 in. manipulator scan area for analysis of wafer bump inspection, BGA ball wetting, attachment, cracks, and delaminations. Ergonomically designed unit features 160XI cable-free open x-ray tube and offers mouse and joystick control. Along with InspectX software and outsize viewing window, system has...

Read More »

X-Ray System includes hi-res 3D imaging capability.

Revolution X-ray system is offered with Computerized Tomography (CT) capability, which produces high resolution 3D data sets that can be viewed at any angle, sliced in any direction, and measured to enable detailed analysis of internal structure of components and substrates. Proprietary technologies incorporate Microfocus Xi X-ray source, Nanotech(TM) Target assembly, and Inspect-X system control...

Read More »

X-Ray Inspection System offers viewing angle of up to 75-

With sub-micron resolution, Revolution offers max magnification of 6000x at all angles over 16 x 16 in. manipulator scan area for analysis of wafer bump inspection, BGA ball wetting, attachment, cracks, and delaminations. Ergonomically designed unit features 160XI cable-free open x-ray tube and offers mouse and joystick control. Along with InspectX software and outsize viewing window, system has...

Read More »

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