Corelis, Inc.

Software

Boundary Scan Tools expand structural, functional test abilities.

In addition to support for multi-core devices, ScanExpress Boundary-Scan Tool Suite v7.7 offers separate global and local constraint entry within ScanExpress TPG preparation GUI. Inverted transparency model support is provided along with constraint to identify inverted nets as well as ability to associate multiple BSDL files to single JTAG device. Solution further offers FlexNet network licensing...

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Test & Measurement

JTAG Solution is designed for Teradyne in-circuit testers.

Designed for use with Teradyne TestStation(TM) and GR228x series testers, QuadTAP/CFM integrates advanced boundary-scan test capabilities into Teradyne in-circuit testers. This 4-channel platform provides Advanced JTAG control using vacant slots on Teradyne Multi-Function Application Board, allowing up to 2 test access ports (TAPs) with single CFM slot or up to 4 TAPs using expander modules. TAP...

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Software

Corelis Adds JET Support for TI Sitara ARM Microprocessors

Non-intrusive functional test solution for high performance ARM microprocessors. Cerritos, CA, - Corelis, Inc., the leading supplier of high-performance JTAG test and measurement tools, announced today ScanExpress JET(TM) support for Texas Instruments Sitara(TM) ARM® Cortex(TM)-A8 and ARM9(TM) microprocessors, specifically the AM37x, DM37x, and AM18x families. ScanExpress JTAG Embedded Test...

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Software

JTAG Testing Software supports Freescale i.MX51 processors.

Providing at-speed testing of embedded processor-based electronic PCB and systems, ScanExpress JET(TM) detects, isolates, and diagnoses structural and functional defects with minimal development. Program controls i.MX51's ARM Cortex(TM)-A8 core through JTAG debug port, enabling development and execution of binary and script test steps using graphical user interface on host PC. Standardized...

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Test & Measurement

JTAG Test System supports AMD embedded processors.

Supporting Turion(TM) II Neo, Athlon(TM) II Neo, Opteron(TM) 4100, and Opteron(TM) Quad-Core processors, ScanExpress JET provides automated at-speed, non-intrusive functional testing for SDRAM memory, SPI Flash, I2C, and UART. System features HyperTransport(TM) link validation, peripheral detection of PCI and PCIe buses, and fully automatic test development for all supported peripherals. No boot...

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Test & Measurement

JTAG Platform integrates boundary-scan test into in-circuit testers.

Integrating boundary-scan test patterns into Teradyne TestStation and GR228x series in-circuit testers (ICTs), USB-1149.1/CFM offers Teradyne users 100 MHz clock rate boundary-scan test support, JTAG test vector reusability across multiple manufacturing test stations, and testing of IEEE-1149.6 AC-coupled digital networks. Additional capabilities include in-system programming of Flash and CPLD...

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Agricultural & Farming Products

Corelis Offers Integrated JTAG Solution with National Instruments

High Speed Digital I/O Platform Doubles as a JTAG Controller. Cerritos, CA - Corelis, Inc. today announced support for National Instruments High Speed Digital I/O (HSDIO) instruments with Corelis' ScanExpress suite of high-performance JTAG test and measurement tools. The marriage of National Instruments hardware with Corelis software provides a seamless path for deploying boundary-scan test and...

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Software

Boundary Scan Test Software automates test development.

ScanExpress Boundary-Scan Tool Suite v7.5 includes ScanExpress TPG, with automatic identification and classification of resistors and capacitors involved in IEEE-1149.6 high speed, AC-coupled, and differential circuits. Scripting functions such as SPI and I2C functions, GPIO control, 3rd-party program execution, and access to test session information are included. Supporting multiple ID...

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Software

JTAG Test Solution accommodates all risk profiles.

Offered as service-oriented product based on ScanExpress software, TestGenie provides complete boundary-scan test procedure along with production-ready execution station. In addition to board specific perpetual licenses for ScanExpress Runner, ScanExpress ADO, and ScanExpress Viewer modules, platform includes USB JTAG controller, 12 month hardware and software support contract, and test procedure...

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Software

Corelis Launches Runner-Lite: The Free JTAG Test Executive

New Tool Offers Complete Structural and Functional Test Solutions for Reference Designs Cerritos, CA - Corelis, Inc., the leading supplier of high-performance boundary-scan test and measurement tools, announced today the availability of Runner-Lite, a free software test executive for performing boundary-scan testing, JTAG Embedded Testing (JET), and in-system device programming using...

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