Cascade Microtech Inc.

Materials

Probe Cards allow single-pass dc and RF measurements.

Pyramid Plus(TM) 45 and 65 nm capable parametric probe cards provide low leakage, contact resistance, and inductance to deliver accurate measurements of small process monitoring test structures. Membrane manufacturing process enables leakage performance to 1 fA with 5 sec settling time and reliable contact on smaller test pads. Units come in dc only (PDC50) or dc plus RF (PRF50) configurations...

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Test & Measurement

Testing System addresses on-wafer probing challenges.

Tesla Power Semiconductor Device Characterization System offers an on-wafer solution for over temperature, low contact resistance measurements of up to 60 A and 3,000 V. Device features high current probe that supports 10 A of current in continuous mode and up to 60 A of current in pulsed mode, and high voltage probe that makes coaxial measurements up to 3,000 V and triaxial measurements up to...

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Fluid & Gas Flow Equipment

RF Probe is optimized for tuner-based characterization.

Featuring thin-film technology and high-current capability, RF Infinity probe ensures accurate and repeatable wafer-level RF measurements at higher current for characterization of linear power amplifiers and other RF power devices. Designed for power load-pull and noise parameter testing, it allows designers to model transistors under load conditions at up to 2 A, while maintaining low contact...

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Software

Software helps increase RF measurement efficiency.

WinCal 2006 enables accurate, repeatable, metrology-grade measurements of complex, high-speed semiconductors used in mobile communications products. To facilitate high-frequency device characterization using wafer probing station coupled with vector network analyzer (VNA), software automates calibration of VNA with ISS (impedance standard substrate) standards at probe tip. Software also supports...

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Vision Systems

Digital Imaging System suits wafer navigation and testing.

Combining wafer probe navigation tools and video processing with digital microscope, eVue(TM) System allows users to navigate, observe, and measure wafer devices. Field-of-view optics, in conjunction with high-definition video, enables engineers to see extended view of wafer when navigating. Intelligent lens mount stores lens-microscope performance information for each objective lens used. Pro...

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Materials

Probe Cards allow single-pass dc and RF measurements.

Pyramid Plus(TM) 45 and 65 nm capable parametric probe cards provide low leakage, contact resistance, and inductance to deliver accurate measurements of small process monitoring test structures. Membrane manufacturing process enables leakage performance to 1 fA with 5 sec settling time and reliable contact on smaller test pads. Units come in dc only (PDC50) or dc plus RF (PRF50) configurations...

Read More »
Test & Measurement

Testing System addresses on-wafer probing challenges.

Tesla Power Semiconductor Device Characterization System offers an on-wafer solution for over temperature, low contact resistance measurements of up to 60 A and 3,000 V. Device features high current probe that supports 10 A of current in continuous mode and up to 60 A of current in pulsed mode, and high voltage probe that makes coaxial measurements up to 3,000 V and triaxial measurements up to...

Read More »
Company News

SMIC and Cascade Microtech Partner to Establish New Mixed-Signal RFIC Design Service Lab in Shanghai

Cascade Microtech's industry-leading 300mm wafer-level RF test systems chosen by SMIC to enable the next generation of wireless ICs SHANGHAI, China and BEAVERTON, Ore., March 23 -- Semiconductor Manufacturing International Corporation (SMIC) today announced its partnership with Cascade Microtech (NASDAQ:CSCD) to provide Chinese RF design engineers immediate access to state-of-the-art RF...

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Fluid & Gas Flow Equipment

RF Probe is optimized for tuner-based characterization.

Featuring thin-film technology and high-current capability, RF Infinity probe ensures accurate and repeatable wafer-level RF measurements at higher current for characterization of linear power amplifiers and other RF power devices. Designed for power load-pull and noise parameter testing, it allows designers to model transistors under load conditions at up to 2 A, while maintaining low contact...

Read More »
Company News

Cascade Microtech Expands Focus on Failure Analysis Market Announces Business and Technology Partnership with Credence Systems Corporation

Beaverton, Ore.-November 22, 2005-Cascade Microtech (Nasdaq: CSCD), the worldwide leader in precise electrical measurements on small structures, is expanding its capabilities in the semiconductor failure analysis market. In August 2005, the company introduced the eVue digital imaging system, a major new tool for sub-micron probing to ease the problems of failure analysis on rapidly shrinking...

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Software

Software helps increase RF measurement efficiency.

WinCal 2006 enables accurate, repeatable, metrology-grade measurements of complex, high-speed semiconductors used in mobile communications products. To facilitate high-frequency device characterization using wafer probing station coupled with vector network analyzer (VNA), software automates calibration of VNA with ISS (impedance standard substrate) standards at probe tip. Software also supports...

Read More »
Vision Systems

Digital Imaging System suits wafer navigation and testing.

Combining wafer probe navigation tools and video processing with digital microscope, eVue(TM) System allows users to navigate, observe, and measure wafer devices. Field-of-view optics, in conjunction with high-definition video, enables engineers to see extended view of wafer when navigating. Intelligent lens mount stores lens-microscope performance information for each objective lens used. Pro...

Read More »

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