Cascade Microtech Inc.

Fluid & Gas Flow Equipment

Cascade Microtech Secures Production Test Win at Top Producer of LED Devices

Summit 12000 HS probe station chosen for its flexibility and throughput capabilities BEAVERTON, OR - August 18, 2009 - Cascade Microtech, Inc. (NASDAQ: CSCD) today announced that a leading light-emitting diode (LED) manufacturer has selected its high-speed Summit 12000 HS probe system for production test. Cascade Microtech's Summit 12000 HS was chosen for its system flexibility to test a broad...

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Communication Systems & Equipment

Cascade Microtech Expands Capabilities of On-Wafer Power Device Characterization

Collaborative Engineering Efforts Provide Full Compatibility of Agilent B1505A on Tesla System BEAVERTON, OR, June 15, 2009 - Cascade Microtech, Inc. (NASDAQ: CSCD) today announced a set of new probes and accessories for its Tesla on-wafer power device characterization system, making it fully compatible with the recently released Agilent B1505A power device analyzer. The combined solution offers...

Read More »
Fluid & Gas Flow Equipment

Cascade Microtech Announces First Complete Engineering and Production Probing Solutions Enabling High-Volume 60-80 GHz RFIC Manufacturing

Complete probing solution for mmW RFIC test meets the complex requirements of automotive radar and wireless HDTV device test BEAVERTON, OR - June 8, 2009 - Cascade Microtech, Inc. (NASDAQ: CSCD) today announced the release of two products that streamline engineering and production testing of high-bandwidth, short-range RFIC devices for WirelessHD(TM), automotive radar, and other 60 GHz wireless...

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Agricultural & Farming Products

King Abdullah University of Science and Technology Selects Cascade Microtech for Materials Analysis and Semiconductor Research

First probe stations installed in Saudi Arabia to be used to promote global research and science achievement Beaverton, OR, USA, (September 24, 2009) - Cascade Microtech, Inc. (NASDAQ: CSCD) today announced King Abdullah University of Science and Technology's selection of multiple probe stations to support measurements in the area of materials analysis, nano-technologies and semiconductor...

Read More »
Architectural & Civil Engineering Products

Test Socket facilitates evaluation of BGA devices.

Able to be leveraged across multiple platforms, G80 Grypper(TM) accelerates engineering development and failure analysis/QA for 0.8 mm+ pitch BGA devices in ASIC, FPGA, and embedded markets. Contact design minimizes forces required to insert higher-ball-count BGA devices into device-footprint G80 socket. Use allows customers to evaluate, debug, and characterize chipsets in actual system...

Read More »
Test & Measurement

Measurement System indicates flicker noise.

Integrating wafer probe station, instruments, software, and accessories, EDGE Flicker Noise Measurement System is certified to provide accurate measurements from 1 Hz to 30 MHz with background noise typically less than 1.2 nV/rtHz at 100 kHz and above. System can switch between flicker and DC measurements with push-button automation, eliminating risky transfer of wafer from one measurement...

Read More »
Fluid & Gas Flow Equipment

RF Production Probe Card utilizes membrane probe technology.

Designed to aid in high-volume wafer testing of RF filters and switches for mobile handsets, 20 GHz P30 Pyramid Probe card has scalable architecture and is sized to enable multi-site testing. Solution's lithographic probes alleviate uncontrolled impedance and Microscrub(TM) creates small scrub mark that minimizes material displacement. Applications include multi-die testing for RF wireless,...

Read More »
Materials

Probe Cards allow single-pass dc and RF measurements.

Pyramid Plus(TM) 45 and 65 nm capable parametric probe cards provide low leakage, contact resistance, and inductance to deliver accurate measurements of small process monitoring test structures. Membrane manufacturing process enables leakage performance to 1 fA with 5 sec settling time and reliable contact on smaller test pads. Units come in dc only (PDC50) or dc plus RF (PRF50) configurations...

Read More »
Fluid & Gas Flow Equipment

Wafer Probe Station targets process nodes 45 nm and below.

Based on 300 mm large-area microscope system with video and software navigation, Elite 300 includes PureLine II noise-reduction technology, and architectural design that ensures flatness and planarity, preventing probe needle shifting. It offers standard temperature range of -60 to 300°C, with 400°C thermal chuck option. For precise internal-node, sub-micron probing over temperature,...

Read More »
Software

Cascade Microtech's WinCal XE Adds 16-term Calibration to Enhance RF Device Model Accuracy

BEAVERTON, Ore., June 4 / - Cascade Microtech today added an important new capability, a 16-term calibration technique, to its WinCal XE calibration software to help semiconductor labs reduce design cycles and time to market. Using WinCal XE for on-wafer measurement helps semiconductor manufacturers create more accurate high-frequency RF device models. With the explosion of wireless devices,...

Read More »
Fluid & Gas Flow Equipment

Cascade Microtech Secures Production Test Win at Top Producer of LED Devices

Summit 12000 HS probe station chosen for its flexibility and throughput capabilities BEAVERTON, OR - August 18, 2009 - Cascade Microtech, Inc. (NASDAQ: CSCD) today announced that a leading light-emitting diode (LED) manufacturer has selected its high-speed Summit 12000 HS probe system for production test. Cascade Microtech's Summit 12000 HS was chosen for its system flexibility to test a broad...

Read More »
Communication Systems & Equipment

Cascade Microtech Expands Capabilities of On-Wafer Power Device Characterization

Collaborative Engineering Efforts Provide Full Compatibility of Agilent B1505A on Tesla System BEAVERTON, OR, June 15, 2009 - Cascade Microtech, Inc. (NASDAQ: CSCD) today announced a set of new probes and accessories for its Tesla on-wafer power device characterization system, making it fully compatible with the recently released Agilent B1505A power device analyzer. The combined solution offers...

Read More »
Fluid & Gas Flow Equipment

Cascade Microtech Announces First Complete Engineering and Production Probing Solutions Enabling High-Volume 60-80 GHz RFIC Manufacturing

Complete probing solution for mmW RFIC test meets the complex requirements of automotive radar and wireless HDTV device test BEAVERTON, OR - June 8, 2009 - Cascade Microtech, Inc. (NASDAQ: CSCD) today announced the release of two products that streamline engineering and production testing of high-bandwidth, short-range RFIC devices for WirelessHD(TM), automotive radar, and other 60 GHz wireless...

Read More »
Agricultural & Farming Products

King Abdullah University of Science and Technology Selects Cascade Microtech for Materials Analysis and Semiconductor Research

First probe stations installed in Saudi Arabia to be used to promote global research and science achievement Beaverton, OR, USA, (September 24, 2009) - Cascade Microtech, Inc. (NASDAQ: CSCD) today announced King Abdullah University of Science and Technology's selection of multiple probe stations to support measurements in the area of materials analysis, nano-technologies and semiconductor...

Read More »
Architectural & Civil Engineering Products

Test Socket facilitates evaluation of BGA devices.

Able to be leveraged across multiple platforms, G80 Grypper(TM) accelerates engineering development and failure analysis/QA for 0.8 mm+ pitch BGA devices in ASIC, FPGA, and embedded markets. Contact design minimizes forces required to insert higher-ball-count BGA devices into device-footprint G80 socket. Use allows customers to evaluate, debug, and characterize chipsets in actual system...

Read More »
Test & Measurement

Measurement System indicates flicker noise.

Integrating wafer probe station, instruments, software, and accessories, EDGE Flicker Noise Measurement System is certified to provide accurate measurements from 1 Hz to 30 MHz with background noise typically less than 1.2 nV/rtHz at 100 kHz and above. System can switch between flicker and DC measurements with push-button automation, eliminating risky transfer of wafer from one measurement...

Read More »
Fluid & Gas Flow Equipment

RF Production Probe Card utilizes membrane probe technology.

Designed to aid in high-volume wafer testing of RF filters and switches for mobile handsets, 20 GHz P30 Pyramid Probe card has scalable architecture and is sized to enable multi-site testing. Solution's lithographic probes alleviate uncontrolled impedance and Microscrub(TM) creates small scrub mark that minimizes material displacement. Applications include multi-die testing for RF wireless,...

Read More »
Materials

Probe Cards allow single-pass dc and RF measurements.

Pyramid Plus(TM) 45 and 65 nm capable parametric probe cards provide low leakage, contact resistance, and inductance to deliver accurate measurements of small process monitoring test structures. Membrane manufacturing process enables leakage performance to 1 fA with 5 sec settling time and reliable contact on smaller test pads. Units come in dc only (PDC50) or dc plus RF (PRF50) configurations...

Read More »
Fluid & Gas Flow Equipment

Wafer Probe Station targets process nodes 45 nm and below.

Based on 300 mm large-area microscope system with video and software navigation, Elite 300 includes PureLine II noise-reduction technology, and architectural design that ensures flatness and planarity, preventing probe needle shifting. It offers standard temperature range of -60 to 300°C, with 400°C thermal chuck option. For precise internal-node, sub-micron probing over temperature,...

Read More »
Software

Cascade Microtech's WinCal XE Adds 16-term Calibration to Enhance RF Device Model Accuracy

BEAVERTON, Ore., June 4 / - Cascade Microtech today added an important new capability, a 16-term calibration technique, to its WinCal XE calibration software to help semiconductor labs reduce design cycles and time to market. Using WinCal XE for on-wafer measurement helps semiconductor manufacturers create more accurate high-frequency RF device models. With the explosion of wireless devices,...

Read More »

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