Cascade Microtech Inc.
Beaverton, OR 97006
Dec 14, 2006 Featuring thin-film technology and high-current capability, RF Infinity probe ensures accurate and repeatable wafer-level RF measurements at higher current for characterization of linear power amplifiers and other RF power devices. Designed for power load-pull and noise parameter testing, it allows designers to model transistors under load conditions at up to 2 A, while maintaining low contact resistance (typically less than 0.05 W on aluminum pads).

Keithley Instruments, Inc.
Cleveland, OH 44139 1891
Dec 11, 2006 Series S600 Parametric Test System is available with KTE v5.2 wafer test development and execution environment. Users can create individual electrical tests at subsite level by drawing on pre-defined libraries then defining parameters and connections. Software features promote throughput for circuit materials testing, such as those requiring RF level frequencies. Environment also supports parallel test routines as well as acquisition of statistically significant RF data sets.

GE Inspection Technologies, GmbH
Huerth 50354  Germany
Nov 10, 2006 Compatible with phased array flaw detection equipment, Phased Array Ultrasonic Immersion Transducers can be supplied in flat and curved configurations and can have 32, 64, or 128 computer-controlled elements. Single probe can perform inspection tasks that normally require large numbers of conventional probes or multiple scanning passes. Real-time, sector scan imaging of phased array provides integrated, cross-sectional visualization of any area or component under inspection.

Renishaw, Inc.
Hoffman Estates, IL 60192
Sep 12, 2006 With future-proof design, 2-axis GYRO(TM) offers 3 levels of functionality: touch-trigger, 3-axis scanning, and 5-axis scanning. Adaptability makes this infinitely positioning dynamic measuring head suitable for small and large DCC coordinate measuring machines (CMMs). It allows use of laser-tip sense technology, where laser light system is used to measure exact position of probe tip, and has hollow stylus designed to bend. Product is available with UCC2 universal CMM controller.

Optotherm, Inc.
Sewickley, PA 15143
Jul 20, 2006 Designed to provide new or additional test points on printed circuit boards (PCBs), PCB Probe Kit offers functionality for probing and viewing signals on logic analyzer, oscilloscope, meter, or other instrument. Hands-free system includes arm probe with heavy base, spring loaded tip, rotatable head, and fine vertical adjustment knob. Kit also includes lead clips, SMD clips, SMD clip support with guide wire, and integrated magnifying glass with tweezers.

Varian, Inc.
Palo Alto, CA 94304
May 26, 2006 FastMAS(TM) and UltraFastMAS(TM) NMR Probes are used to analyze solid materials meeting different application requirements in life science and pharmaceutical industries. They are designed to improve resolution, which increases value and quality of spectral data information provided by NMR. Probes also reduce amount of sample required for analysis.

NEC Corporation
Tokyo 108-8001  Japan
Mar 23, 2006 Fiber-optic electric field probe consists of optical fiber and lead zirconate titanate (PZT) electro-optical film on edge of fiber that acts as field sensor. With lateral size of ~125 µm, product can be inserted into narrow spaces for evaluation of electrical characteristics of high-density packaged electronic circuits on PCBs. This microscale electric field probe does not disturb electromagnetic field surrounding device being tested.

Techno, Inc. - CNC Router Systems
New Hyde Park, NY 11040
Feb 07, 2006 As CNC accessory, TechProbe Digitizer mounts to Techno Servo CNC systems via ¼ in. collet and uses TechProbe software to digitize 2D objects with complex curves or 3D objects with geometric parts. Scanned 2D objects are generated onto screen in field of automatic toolpath points, while 3D objects generate point cloud. Software lets users view scan through active-preview window, and scanned point images can be saved in ASCII file format and imported into CAD/CAM programs.

Control Company
Friendswood, TX 77546
Jan 10, 2006 Featuring stainless steel probe with 10 ft cable, Traceable® Snap-In Module records minimum and maximum readings over any time period. Resolution is 0.1° from -20 to 200° and 1° outside this range, while accuracy is ±1°C between -20 and 100°C. Module measures 1½ x 2 7/16 x ½ in. and probe is 0.14 in. diameter by 2¾ in. long with handle. Individually serial-numbered Traceable® Certificate is provided from ISO 17025 calibration laboratory accredited by A2LA.

Dresser Instruments, Dresser Measurement & Control, Dresser Inc.
Stratford, CT 06614-5145
Oct 17, 2005 Engineered to measure static or differential pressure, Ashcroft® CXLdp is available in ranges from 0/0.1-0/25.0 in. H₂O and in accuracies of ±0.8 and 0.4% FS. It includes high over-pressure capability, LED status light, and CE EMI/RFI immunity rating. Multiple mounting options allow unit to be mounted on DIN rail, conduit, or wall. With detachable terminal block electrical connector, transducer can be installed into panel without power interruption.

Synergetix
Kansas City, KS 66106
Sep 23, 2005 Designed for use with test sockets, miniature 0.4 mm Probe is available with 4-point crown, concave, or 120 single point tip. Geometry of tip is optimized to meet most application requirements. Higher force spring is available for lead-free and highly contaminated environments.

Onset Computer Corp.
Bourne, MA 02532
Mar 25, 2005 Featuring 5 in. piercing probe, HOBO® U12 monitors temperatures of stored, frozen, and prepared foods for HACCP compliance. It offers -40 to 125°C temperature range, 20 sec response time, and food-grade 316L stainless steel housing. Direct USB interface enables offload of collected data onto PC. HOBOware™ 2.0 for Windows provides intuitive graphing and analysis, and enables 1-click conversion of data for upload into spreadsheets and other programs.

Agilent Technologies, Inc.
Palo Alto, CA 94303
Mar 25, 2005 FPGA dynamic probe application features probe setup automation capability, which reduces set-up time required for logic analyzer measurements when validating designs that incorporate Xilinx FPGA technology. Plug-and-run capability eliminates need to manually track signal path and enter associated probe setup information in logic analyzer. In seconds, users can plug probe into target and press logic analysis run button to make measurements.

Ophir Optronics, Inc.
Danvers, MA 01923
Sep 09, 2004 Comet 1K Power Probe measures laser power from 20 W to 1 KW. Users set laser to 10 sec timed exposure, press ready button, and place probe in path of laser beam, where product senses temperature rise and measures it automatically. Specifications include 0.2–20 µm spectral range, ±5% absolute calibration accuracy, and ±1% repeatability for same initial temperature. Unit comes with 2x8 character LCD and swivel mount that rotates ±90°.

Agilent Technologies, Inc.
Palo Alto, CA 94303
Sep 01, 2004 Agilent E8045B provides visibility into Pentium 4 system bus, accelerating design of products based on Intel® Pentium® 4 processor in 775-land package. Probe enables connection of logic analyzers to LGA775 processor with minimal mechanical and electrical intrusion. Equipped with electrically passive probe interface adapter, product aligns source-synchronous, quad-pumped data lines and double-pumped address lines with b-clk frequency control signals.

Heidenhain Corp.
Schaumburg, IL 60173-5337
Jul 30, 2004 Offered in sizes as small as 0.49 x 63 mm, TS 440 features 360° transmission and can be used on iTNC 530 control and higher. It is suited for machines with limited working space that carry out repeated setup and inspection procedures. Transceiver for IR touch probes, SE 540, is designed for installation in headstock in order to move along with touch probe. This ensures reliable transmission of IR signals at any position of machine's working space.

Agilent Technologies, Inc.
Palo Alto, CA 94303
Jun 24, 2004 Pro Series soft touch, logic analyzer probes enable direct connection from probe to targets on PCB without use of connector. They use micro spring-pin technology with 4-point crown tip that can pierce any contamination on board and provide redundant contact. Top-mount retention module accommodates varying PCB thicknesses. Probes are compatible with lead-free finishes such as organic-coated copper, as well as gold, silver, and hot-air surface level.

Brown & Sharpe Mfg. Co.
North Kingstown, RI 02852
Apr 28, 2004 Available in 2 versions, TESASTAR® Touch Trigger Probes feature adjustable measuring force to prevent inadvertent triggering when long stylus is used. TESASTAR-I® Indexable Touch Trigger Probe is adjustable to 168 positions in 15º increments. TESASTAR probes can be rotated through infinite number of positions for flexibility in measuring complex components. Clockwise rotation increases trigger force by 0.1 N to ~0.3 N, and probe force is pre-set at factory to 0.11 N.

Agilent Technologies, Inc.
Palo Alto, CA 94304
Mar 08, 2004 Model E5396A is 17-channel, single-ended connectorless soft-touch probe compatible with company's logic analyzers that use 40-pin connector interface. Model E5398A soft-touch probe is compatible with logic analyzers that use 90-pin connector interface. Spring-pin technology ensures reliable connection without need for special cleaning or surface finishes of probe pads. Probes suited for validation of high-speed digital designs.

Agilent Technologies, Inc.
Palo Alto, CA 94304
Mar 08, 2004 Model B4655A interacts with on-chip virtual probing technology, enabling logic analyzers to measure up to 64 internal FPGA signals for each debug pin. Engineers can select groups of internal signals to probe without requiring design recompiles. State and timing analysis modes allow designers to look at single circuits or correlate multiple circuits. Probe provides mapping of internal signal names from FPGA design tools to logic analyzer setup.