PCB Piezotronics Inc.
Depew, NY 14043 2495
Apr 10, 2008 Designed for broad range of explosion, blast, and shock wave testing, Series 137A Quartz, free-field, ICP® Blast Pressure Pencil Probe has 500 kHz resonant frequencies. High-level 5 V output signal is capable of driving cable runs hundreds of feet in length, to safe zone for data acquisition. Featuring integral microelectronics that provide high signal-to-noise ratio, sensor can be used to capture both peak pressure and total impulse calculations.

Cascade Microtech Inc.
Beaverton, OR 97006
Apr 09, 2008 Designed to aid in high-volume wafer testing of RF filters and switches for mobile handsets, 20 GHz P30 Pyramid Probe card has scalable architecture and is sized to enable multi-site testing. Solution's lithographic probes alleviate uncontrolled impedance and Microscrub(TM) creates small scrub mark that minimizes material displacement. Applications include multi-die testing for RF wireless, high-speed digital in SiPs, SOCs, and leading edge parametrics.

Renishaw, Inc.
Hoffman Estates, IL 60192
Apr 08, 2008 Model RMP600 combines strain-gage sensing technology with with frequency-hopping spread-spectrum radio transmission, which enables multiple machining centers with probe system to coexist in noisy industrial environments. RENGAGE(TM) technology allows sub-micron 3D probe performance on contoured surfaces, even with long styli. Compatible with machine controllers, probe delivers uni-directional repeatability of 0.000010 in. with 50 mm long stylus.

SEICA Inc.
Salem, NH 03079
Apr 02, 2008 Compact, ergonomic Pilot V8 features vertical architecture enabling high speed, high-precision probing on both sides of UUT simultaneously. It is equipped with 8 electrical flying test probes, 2 Openfix capacitive and 2 power flying probes, plus 2 CCD cameras. Featuring full range of in-circuit and functional test capabilities, system can also implement net-oriented measurement techniques and can execute parallel tests on 2 UUTs at same time.

m&h UK
Nottingham NG9 6NG  United Kingdom
Mar 03, 2008 Based on type 41.00 probe, hard-wired, real-time Touch Probing System allows sliding-head CNC lathe users to measure turned and milled features on every component after machining, while it is still in counter spindle and before ejection. Gauging arrangement, which employs fixed probe mounted on headstock, is also suitable for use on fixed-head, bar-fed, twin-spindle turning machines. Tolerances down to plus or minus a few microns can be maintained.

L.S. Starrett Company
Athol,, MA 01331
Feb 19, 2008 Providing vision, touch probe, and laser scanning, Galileo AV1824 Video Measurement System delivers zoom magnification of 12:1 with programmable magnification range from 15-550x using auxiliary lenses. Dual output LED illuminator, ring light, and co-axial illumination provide optimal lighting. Offering measurement volume of 24 x 18 x 6 in., AV1824 includes Metronics Quadra-Chek® QC-5000 3-D Metrology Software with video edge detection and full CNC control.

Agilent Technologies, Inc
Santa Clara, CA 95051
Feb 06, 2008 Offering direct access to balls of DRAM with minimal loading or impact to signal integrity, DDR2 and DDR3 BGA probes provide signal access points to clock, strobe, data, address, and command signals of DDR3 DRAM for true compliance testing with oscilloscope. Logic analyzer provides timing and protocol view of DRAM activities. DDR2 BGA probe enables simultaneous access to oscilloscope and logic analyzer's full compliance and protocol validation.

Cascade Microtech Inc.
Beaverton, OR 97006
Jan 17, 2008 Based on 300 mm large-area microscope system with video and software navigation, Elite 300 includes PureLine II noise-reduction technology, and architectural design that ensures flatness and planarity, preventing probe needle shifting. It offers standard temperature range of -60 to 300°C, with 400°C thermal chuck option. For precise internal-node, sub-micron probing over temperature, Elite 300 has thermally matched components for mechanical stability.

Heidenhain Corp.
Schaumburg, IL 60173-5337
Jan 14, 2008 Offering probing accuracy of less than ±1 µm and repeatability factor of 2 s less than 0.25 µm, Model TS 740 infrared 3D touch probe enables machine tool users to perform measuring tasks that require high probing accuracy and repeatability. It features sensor technology that involves use of 3 sensor elements. Charges are detected by electronics and converted into trigger signals, and rapid acceleration/deceleration does not cause uncontrolled trigger signals.

Dwyer Instruments, Inc.
Michigan City, IN 46361 0373
Aug 30, 2007 Featuring airtight, dust-tight, waterproof design, Series LTS is designed for use where bulk material to be sensed is exposed or open. Units contain SPST, normally closed switch and feature probe activation angle of 25° from vertical. Typical applications include high or low level detection in large hoppers, silos, crushers, or trippers, as well as high level control under stackers, and detection of plugged conditions at conveyor transfer points.

Rense Instruments
Danbury, CT 06810
Jun 26, 2007 Intended for applications up to 300°F where 5/16 in. diameter stainless steel probe is required, Model HT-748 offers 0-1 Vdc output corresponding to 0-100% RH, as well as separate 0-1 Vdc temperature signal. Unit is available with straight probe, or with 1/8 in. NPT thread or flange for mounting. Remotely mounted in DB25 Sub-D connector at end of cable, electronics are accessible, allowing for recalibration of sensor when required.

Tektronix, Inc.
Beaverton, OR 97077
Feb 12, 2007 Models P7513 (13 GHz) and P7516 (16 GHz) connect to and acquire multiple complex signals simultaneously. With these speeds, users can debug and validate 3rd harmonic of 10 Gbps signals and perform compliance testing to 5th harmonic on signals up to 6.4 Gbps. TriMode(TM) probing enables engineers to switch between differential, single-ended, and common mode measurements without moving probe connections, and Z-Active(TM) probing architecture offers interchangeable probe tip modules.

Conax Buffalo Technologies LLC
Buffalo, NY 14225 4740
Feb 05, 2007 Process Analyzer Sample Probe Assembly (SPA) is hot-tapped into process via isolation valve and sealed off with Conax Buffalo Packing Gland. Available in .250, .375, and .500 in. ODs, SPA is supplied with welded safety-stop collar and angled end for on-line extraction of process liquids or gases. Angled probe tip and tapered end reduce particulate entry. While supplied standard in 304 and 316 SST, SPA is also offered in Monel, Hastelloy C276, and Inconel 600.

Transgenomic Inc.
Omaha, NE 68164
Jan 22, 2007 Designed for universal primer fluorescent capillary electrophoresis, SURVEYOR® Kits detect mismatch mutations in DNA that has been PCR amplified using 2 fluorescent primers and digested with SURVEYOR Nuclease. SURVEYOR Nuclease identifies all base substitutions, insertions, and deletions and can detect multiple mutations in single fragment. Kits help scientists analyze genetic variation, even those present at very low levels such as somatic mutations linked to cancer.

SUSS MicroTec Inc.
Yokohama   Japan
Dec 20, 2006 Designed for high-temperature, multi-site testing, Model PM300WLR features large programmable microscope movement and cable handling solutions that facilitate use. Contact stability is guaranteed at temperatures up to 400°C and test times are minimized using multi-site probe cards. Design of probe system minimizes gas consumption, which is important for devices that must be tested in inert gas environments.

Cascade Microtech Inc.
Beaverton, OR 97006
Dec 14, 2006 Featuring thin-film technology and high-current capability, RF Infinity probe ensures accurate and repeatable wafer-level RF measurements at higher current for characterization of linear power amplifiers and other RF power devices. Designed for power load-pull and noise parameter testing, it allows designers to model transistors under load conditions at up to 2 A, while maintaining low contact resistance (typically less than 0.05 W on aluminum pads).

Keithley Instruments, Inc.
Cleveland, OH 44139 1891
Dec 11, 2006 Series S600 Parametric Test System is available with KTE v5.2 wafer test development and execution environment. Users can create individual electrical tests at subsite level by drawing on pre-defined libraries then defining parameters and connections. Software features promote throughput for circuit materials testing, such as those requiring RF level frequencies. Environment also supports parallel test routines as well as acquisition of statistically significant RF data sets.

GE Inspection Technologies, GmbH
Huerth 50354  Germany
Nov 10, 2006 Compatible with phased array flaw detection equipment, Phased Array Ultrasonic Immersion Transducers can be supplied in flat and curved configurations and can have 32, 64, or 128 computer-controlled elements. Single probe can perform inspection tasks that normally require large numbers of conventional probes or multiple scanning passes. Real-time, sector scan imaging of phased array provides integrated, cross-sectional visualization of any area or component under inspection.

Renishaw, Inc.
Hoffman Estates, IL 60192
Sep 12, 2006 With future-proof design, 2-axis GYRO(TM) offers 3 levels of functionality: touch-trigger, 3-axis scanning, and 5-axis scanning. Adaptability makes this infinitely positioning dynamic measuring head suitable for small and large DCC coordinate measuring machines (CMMs). It allows use of laser-tip sense technology, where laser light system is used to measure exact position of probe tip, and has hollow stylus designed to bend. Product is available with UCC2 universal CMM controller.

Optotherm, Inc.
Sewickley, PA 15143
Jul 20, 2006 Designed to provide new or additional test points on printed circuit boards (PCBs), PCB Probe Kit offers functionality for probing and viewing signals on logic analyzer, oscilloscope, meter, or other instrument. Hands-free system includes arm probe with heavy base, spring loaded tip, rotatable head, and fine vertical adjustment knob. Kit also includes lead clips, SMD clips, SMD clip support with guide wire, and integrated magnifying glass with tweezers.